Tsunenori Nomaguchi

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for producing lamella, analysis system and method for analyz...
- Patent number 12,176,180
- Issue date Dec 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Atsushi Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mechanism for adjusting angle of incidence on charged particle beam...
- Patent number 12,119,202
- Issue date Oct 15, 2024
- HITACHI HIGH-TECH CORPORATION
- Shunichi Motomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,817,289
- Issue date Nov 14, 2023
- HITACHI HIGH-TECH CORPORATION
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,798,776
- Issue date Oct 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Shunichi Motomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 11,784,022
- Issue date Oct 10, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,640,897
- Issue date May 2, 2023
- Hitachi High-Technologies Corporation
- Ryo Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,430,630
- Issue date Aug 30, 2022
- Hitachi High-Technologies Corporation
- Ryo Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,335,532
- Issue date May 17, 2022
- HITACHI HIGH-TECH CORPORATION
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, method for processing sample, and obs...
- Patent number 11,268,915
- Issue date Mar 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Tsunenori Nomaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 11,264,201
- Issue date Mar 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Kazuo Ootsuga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,183,359
- Issue date Nov 23, 2021
- HITACHI HIGH-TECH CORPORATION
- Kenichi Nishinaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,164,716
- Issue date Nov 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Shunichi Motomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle measuring device and particle measuring method
- Patent number 11,143,606
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 11,107,656
- Issue date Aug 31, 2021
- HITACHI HIGH-TECH CORPORATION
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample thickness measurement method
- Patent number 11,067,391
- Issue date Jul 20, 2021
- HITACHI HIGH-TECH CORPORATION
- Takahiro Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,886,101
- Issue date Jan 5, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryo Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam detector, charged particle beam dev...
- Patent number 10,128,081
- Issue date Nov 13, 2018
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 9,966,218
- Issue date May 8, 2018
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle detector, charged particle beam device,...
- Patent number 9,761,409
- Issue date Sep 12, 2017
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,478,389
- Issue date Oct 25, 2016
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,355,814
- Issue date May 31, 2016
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged-particle-beam apparatus
- Patent number 8,581,219
- Issue date Nov 12, 2013
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beams apparatus
- Patent number 8,455,820
- Issue date Jun 4, 2013
- Hitachi High-Technologies Corporation
- Toshihide Agemura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Mechanism for Adjusting Angle of Incidence on Charged Particle Beam...
- Publication number 20240029992
- Publication date Jan 25, 2024
- Hitachi High-Tech Corporation
- Shunichi MOTOMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tweezers, Conveyance Device, and Method for Conveying Sample Piece
- Publication number 20230268156
- Publication date Aug 24, 2023
- Hitachi High-Tech Corporation
- Naoki SAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transfer Device and Analysis System
- Publication number 20230126577
- Publication date Apr 27, 2023
- Hitachi High-Tech Corporation
- Naofumi KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Analysis System
- Publication number 20230063192
- Publication date Mar 2, 2023
- Hitachi High-Tech Corporation
- Yudai KUBO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Analysis System
- Publication number 20230055155
- Publication date Feb 23, 2023
- Hitachi High-Tech Corporation
- Tsunenori NOMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing Lamella, Analysis System and Method for Analyz...
- Publication number 20220367144
- Publication date Nov 17, 2022
- Hitachi High-Tech Corporation
- Atsushi SAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20220246385
- Publication date Aug 4, 2022
- HITACHI HIGH-TECH CORPORATION
- Tsunenori NOMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20220238296
- Publication date Jul 28, 2022
- Hitachi High-Tech Corporation
- Shunichi MOTOMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS
- Publication number 20220165536
- Publication date May 26, 2022
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20210217580
- Publication date Jul 15, 2021
- HITACHI HIGH-TECH CORPORATION
- Kazuo OOTSUGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, Method for Processing Sample, and Obs...
- Publication number 20210190703
- Publication date Jun 24, 2021
- Hitachi High-Tech Corporation
- Tsunenori NOMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20210118641
- Publication date Apr 22, 2021
- Hitachi High-Tech Corporation
- Tsunenori NOMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20210035770
- Publication date Feb 4, 2021
- Hitachi High-Tech Corporation
- Kenichi NISHINAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20210027977
- Publication date Jan 28, 2021
- Hitachi High-Tech Corporation
- Shunichi MOTOMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD
- Publication number 20200371050
- Publication date Nov 26, 2020
- Hitachi High-Tech Corporation
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20200251304
- Publication date Aug 6, 2020
- Hitachi High-Technologies Corporation
- Ryo HIRANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20200219697
- Publication date Jul 9, 2020
- Hitachi High-Technologies Corporation
- Ryo HIRANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20200211815
- Publication date Jul 2, 2020
- Hitachi High-Technologies Corporation
- Tsunenori NOMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Thickness Measurement Method
- Publication number 20200132448
- Publication date Apr 30, 2020
- Hitachi High-Technologies Corporation
- Takahiro SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20200090903
- Publication date Mar 19, 2020
- Hitachi High-Technologies Corporation
- Ryo HIRANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20190385810
- Publication date Dec 19, 2019
- Hitachi High-Technologies Corporation
- Ryuju SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Composite Charged Particle Beam Detector, Charged Particle Beam Dev...
- Publication number 20170358421
- Publication date Dec 14, 2017
- Hitachi High-Technologies Corporation
- Tsunenori NOMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam Device
- Publication number 20170040139
- Publication date Feb 9, 2017
- Tsunenori NOMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20160379797
- Publication date Dec 29, 2016
- HITACHI HIGH-TECNOLOGIES CORPORATION
- Tsunenori NOMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Composite Charged Particle Beam Detector, Charged Particle Beam Dev...
- Publication number 20150364296
- Publication date Dec 17, 2015
- Hitachi High-Technologies Corporation
- Tsunenori NOMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Composite Charged Particle Beam Device
- Publication number 20150221468
- Publication date Aug 6, 2015
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150083910
- Publication date Mar 26, 2015
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20140123898
- Publication date May 8, 2014
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD OF IRRADIATING CHARGED P...
- Publication number 20130248733
- Publication date Sep 26, 2013
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Composite Charged-Particle-Beam Apparatus
- Publication number 20130001420
- Publication date Jan 3, 2013
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS

Tsunenori Nomaguchi

Person

Patents Grantslast 30 patents

Method for producing lamella, analysis system and method for analyz...

Mechanism for adjusting angle of incidence on charged particle beam...

Charged particle beam device

Charged particle beam apparatus

Electron beam apparatus

Charged particle beam device

Charged particle beam apparatus

Charged particle beam device

Charged particle beam device, method for processing sample, and obs...

Charged particle beam device

Charged particle beam apparatus

Charged particle beam device

Particle measuring device and particle measuring method

Charged particle beam device

Charged particle beam device and sample thickness measurement method

Charged particle beam device

Composite charged particle beam detector, charged particle beam dev...

Electron beam device

Composite charged particle detector, charged particle beam device,...

Scanning electron microscope

Charged particle beam apparatus

Composite charged-particle-beam apparatus

Composite charged particle beams apparatus

Patents Applicationslast 30 patents

Mechanism for Adjusting Angle of Incidence on Charged Particle Beam...

Tweezers, Conveyance Device, and Method for Conveying Sample Piece

Transfer Device and Analysis System

Semiconductor Analysis System

Semiconductor Analysis System

Method for Producing Lamella, Analysis System and Method for Analyz...

Charged Particle Beam Device

Charged Particle Beam Apparatus

ELECTRON BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device, Method for Processing Sample, and Obs...

Charged Particle Beam Device

Charged Particle Beam Apparatus

Charged Particle Beam Device

PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD

Charged Particle Beam Device

Charged Particle Beam Apparatus

Charged Particle Beam Device

Charged Particle Beam Device and Sample Thickness Measurement Method

Charged Particle Beam Device

Charged Particle Beam Device

Composite Charged Particle Beam Detector, Charged Particle Beam Dev...

Electron Beam Device

Charged Particle Beam Apparatus

Composite Charged Particle Beam Detector, Charged Particle Beam Dev...

Composite Charged Particle Beam Device

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS AND METHOD OF IRRADIATING CHARGED P...

Composite Charged-Particle-Beam Apparatus