Tsuneo Nakagomi

Person

Nakai, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Thermally assisted magnetic recording head inspection method and ap...
- Patent number 8,787,134
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Cantilever of scanning probe microscope and method for manufacturin...
- Patent number 8,713,710
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for magnetic force microscope and method of manufacturin...
- Patent number 8,621,659
- Issue date Dec 31, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Thermally assisted magnetic recording head inspection method and ap...
- Patent number 8,483,035
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic device inspection apparatus and magnetic device inspection...
- Patent number 8,359,661
- Issue date Jan 22, 2013
- Hitachi High-Technologies Corporation
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device for transporting magnetic head, device for inspecting magnet...
- Patent number 8,299,784
- Issue date Oct 30, 2012
- Hitachi High-Technologies Corporation
- Teruaki Tokutomi
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic head inspection method and magnetic head inspection device
- Patent number 8,278,917
- Issue date Oct 2, 2012
- Hitachi High-Technologies Corporation
- Tsuneo Nakagomi
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic head inspection method and magnetic head manufacturing method
- Patent number 8,185,968
- Issue date May 22, 2012
- Hitachi High-Technologies Corporation
- Tsuneo Nakagomi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC HEAD INSPECTION SYSTEM AND MAGNETIC HEAD INSPECTION METHOD
- Publication number 20140090117
- Publication date Mar 27, 2014
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- G11 - INFORMATION STORAGE
Information Patent Application
THERMALLY ASSISTED MAGNETIC RECORDING HEAD INSPECTION METHOD AND AP...
- Publication number 20130265863
- Publication date Oct 10, 2013
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
Cantilever of Scanning Probe Microscope and Method for Manufacturin...
- Publication number 20130097739
- Publication date Apr 18, 2013
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNETIC HEAD MANUFACTURING METHOD
- Publication number 20120324720
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Tsuneo NAKAGOMI
- G11 - INFORMATION STORAGE
Information Patent Application
Thermally Assisted Magnetic Recording Head Inspection Method and Ap...
- Publication number 20120307605
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...
- Publication number 20120291161
- Publication date Nov 15, 2012
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SPM Probe and Inspection Device for Light Emission Unit
- Publication number 20120054924
- Publication date Mar 1, 2012
- Hitachi High-Technologies Corporation
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC HEAD INSPECTION METHOD AND MAGNETIC HEAD MANUFACTURING METHOD
- Publication number 20110225684
- Publication date Sep 15, 2011
- Hitachi High-Technologies Corporation
- TSUNEO NAKAGOMI
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE FOR TRANSPORTING MAGNETIC HEAD, DEVICE FOR INSPECTING MAGNET...
- Publication number 20100327863
- Publication date Dec 30, 2010
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...
- Publication number 20100205699
- Publication date Aug 12, 2010
- Takehiro TACHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC HEAD INSPECTION METHOD, MAGNETIC HEAD INSPECTION DEVICE, A...
- Publication number 20100061002
- Publication date Mar 11, 2010
- Hitachi High-Technologies Corporation
- TSUNEO NAKAGOMI
- G11 - INFORMATION STORAGE

Tsuneo Nakagomi

Person

Patents Grantslast 30 patents

Thermally assisted magnetic recording head inspection method and ap...

Cantilever of scanning probe microscope and method for manufacturin...

Cantilever for magnetic force microscope and method of manufacturin...

Thermally assisted magnetic recording head inspection method and ap...

Magnetic device inspection apparatus and magnetic device inspection...

Device for transporting magnetic head, device for inspecting magnet...

Magnetic head inspection method and magnetic head inspection device

Magnetic head inspection method and magnetic head manufacturing method

Patents Applicationslast 30 patents

MAGNETIC HEAD INSPECTION SYSTEM AND MAGNETIC HEAD INSPECTION METHOD

THERMALLY ASSISTED MAGNETIC RECORDING HEAD INSPECTION METHOD AND AP...

Cantilever of Scanning Probe Microscope and Method for Manufacturin...

MAGNETIC HEAD MANUFACTURING METHOD

Thermally Assisted Magnetic Recording Head Inspection Method and Ap...

CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...

SPM Probe and Inspection Device for Light Emission Unit

MAGNETIC HEAD INSPECTION METHOD AND MAGNETIC HEAD MANUFACTURING METHOD

DEVICE FOR TRANSPORTING MAGNETIC HEAD, DEVICE FOR INSPECTING MAGNET...

MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...

MAGNETIC HEAD INSPECTION METHOD, MAGNETIC HEAD INSPECTION DEVICE, A...