Tsuneoka Masatoshi

Person

Ohme, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus, method of adjusting astigmatism us...
- Patent number 8,013,315
- Issue date Sep 6, 2011
- Ebara Corporation
- Kenji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 7,983,471
- Issue date Jul 19, 2011
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 6,894,334
- Issue date May 17, 2005
- Hitachi, Ltd.
- Jun Sugiura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING A FIRST WIRING STRIP...
- Patent number 6,548,847
- Issue date Apr 15, 2003
- Hitachi, Ltd.
- Jun Sugiura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 6,342,412
- Issue date Jan 29, 2002
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 6,169,324
- Issue date Jan 2, 2001
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 6,127,255
- Issue date Oct 3, 2000
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of forming teos oxide and silicon nitride passivation layer...
- Patent number 5,811,316
- Issue date Sep 22, 1998
- Hitachi Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 5,780,882
- Issue date Jul 14, 1998
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device process for fabricating the...
- Patent number 5,739,589
- Issue date Apr 14, 1998
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 5,557,147
- Issue date Sep 17, 1996
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 5,331,191
- Issue date Jul 19, 1994
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 5,202,275
- Issue date Apr 13, 1993
- Hitachi Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device with multilayer base contact
- Patent number 5,068,710
- Issue date Nov 26, 1991
- Hitachi, Ltd.
- Nobuo Owada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 5,060,050
- Issue date Oct 22, 1991
- Hitachi, Ltd.
- Masatoshi Tsuneoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming metal layer interconnects using stepped via walls
- Patent number 4,999,318
- Issue date Mar 12, 1991
- Hitachi, Ltd.
- Tokunaga Takahumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for producing semiconductor integrated circuit device havin...
- Patent number 4,931,410
- Issue date Jun 5, 1990
- Hitachi, Ltd.
- Takafumi Tokunaga
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20120328181
- Publication date Dec 27, 2012
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICES AND METHOD OF TESTING SAME
- Publication number 20090152595
- Publication date Jun 18, 2009
- EBARA CORPORATION
- Toru Kaga
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection apparatus and method
- Publication number 20080130982
- Publication date Jun 5, 2008
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged particle beam apparatus, method of adjusting astigmatism us...
- Publication number 20080099697
- Publication date May 1, 2008
- EBARA CORPORATION
- Kenji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device, process for fabricating th...
- Publication number 20030189255
- Publication date Oct 9, 2003
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor integrated circuit device, process for fabricating th...
- Publication number 20020017669
- Publication date Feb 14, 2002
- Jun Sugiura
- H01 - BASIC ELECTRIC ELEMENTS

Tsuneoka Masatoshi

Person

Patents Grantslast 30 patents

Charged particle beam apparatus, method of adjusting astigmatism us...

Pattern inspection apparatus and method

Semiconductor integrated circuit device, process for fabricating th...

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING A FIRST WIRING STRIP...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device, process for fabricating th...

Method of forming teos oxide and silicon nitride passivation layer...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device process for fabricating the...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor device with multilayer base contact

Semiconductor integrated circuit device

Method for forming metal layer interconnects using stepped via walls

Process for producing semiconductor integrated circuit device havin...

Patents Applicationslast 30 patents

PATTERN INSPECTION APPARATUS AND METHOD

SEMICONDUCTOR DEVICES AND METHOD OF TESTING SAME

Pattern inspection apparatus and method

Charged particle beam apparatus, method of adjusting astigmatism us...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device, process for fabricating th...