Tsutomu Iikawa

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Crack growth evaluation apparatus, crack growth evaluation method,...
- Patent number 8,190,378
- Issue date May 29, 2012
- Fujitsu Limited
- Hidehisa Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Simplified environmental atmosphere measuring method
- Patent number 5,994,144
- Issue date Nov 30, 1999
- Fujitsu Limited
- Eiichi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Simplified environmental atmosphere measuring apparatus
- Patent number 5,985,213
- Issue date Nov 16, 1999
- Fujitsu Limited
- Eiichi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Environment monitoring test piece and test method
- Patent number 5,750,406
- Issue date May 12, 1998
- Fujitsu Limited
- Eiichi Nakajima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Crack growth evaluation apparatus, crack growth evaluation method,...
- Publication number 20090187353
- Publication date Jul 23, 2009
- FUJITSU LIMITED
- Hidehisa Sakai
- G01 - MEASURING TESTING