Tsutomu Okabe

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Kodaira, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection data analyzing system
- Patent number 6,628,817
- Issue date Sep 30, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,529,619
- Issue date Mar 4, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,339,653
- Issue date Jan 15, 2002
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,330,352
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method using separate processors for processi...
- Patent number 6,185,322
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 5,841,893
- Issue date Nov 24, 1998
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device fabrication method and its...
- Patent number 5,497,331
- Issue date Mar 5, 1996
- Hitachi, Ltd.
- Nobuyuki Iriki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Inspection data analyzing system
- Publication number 20020034326
- Publication date Mar 21, 2002
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010038708
- Publication date Nov 8, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010001015
- Publication date May 10, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING