TREA

Tsuyoshi SHIOBARA

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  • Saitama, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sensing device
    • Patent number 11,287,399
    • Issue date Mar 29, 2022
    • Nihon Dempa Kogyo Co., Ltd.
    • Hiroyuki Kukita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing sensor
    • Patent number 11,181,509
    • Issue date Nov 23, 2021
    • Nihon Dempa Kogyo Co., Ltd.
    • Hiroyuki Kukita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Substance detection system and substance detection method
    • Patent number 11,156,571
    • Issue date Oct 26, 2021
    • Nihon Dempa Kogyo Co., Ltd.
    • Hiroyuki Kukita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Voltage controlled oscillator
    • Patent number 9,762,180
    • Issue date Sep 12, 2017
    • Nihon Dempa Kogyo Co., Ltd.
    • Tsuyoshi Shiobara
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Radiation detector
    • Patent number D755653
    • Issue date May 10, 2016
    • Nihon Dempa Kogyo Co., Ltd.
    • Kiyoto Shinmei
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    PLL oscillator circuit
    • Patent number 8,115,526
    • Issue date Feb 14, 2012
    • Nihon Dempa Kogyo Co., Ltd.
    • Tsuyoshi Shiobara
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Frequency synthesizer
    • Patent number 7,888,974
    • Issue date Feb 15, 2011
    • Nihon Dempa Kogyo Co. Ltd.
    • Tsukasa Kobata
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Frequency synthesizer
    • Patent number 7,825,701
    • Issue date Nov 2, 2010
    • Nihon Dempa Kogyo Co., Ltd.
    • Tsukasa Kobata
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Synthesizer module
    • Patent number 7,825,702
    • Issue date Nov 2, 2010
    • Nihon Dempa Kogyo Co., Ltd.
    • Tsuyoshi Shiobara
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    PLL apparatus
    • Patent number 7,812,651
    • Issue date Oct 12, 2010
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Digital processor
    • Patent number 7,764,207
    • Issue date Jul 27, 2010
    • Nihon Dempa Kogyo Co., Ltd.
    • Tsukasa Kobata
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    PLL apparatus
    • Patent number 7,755,436
    • Issue date Jul 13, 2010
    • Nihon Dempa Kogyo Co., Ltd.
    • Naoki Onishi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Quartz sensor and sensing device
    • Patent number 7,677,087
    • Issue date Mar 16, 2010
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing device
    • Patent number 7,555,952
    • Issue date Jul 7, 2009
    • Nihon Dempa Kogyo Co., Ltd.
    • Naoki Onishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Component measuring device
    • Patent number 7,554,247
    • Issue date Jun 30, 2009
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Frequency measuring device for a crystal resonator
    • Patent number D526584
    • Issue date Aug 15, 2006
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

  • Information Patent Application

    SENSING SENSOR
    • Publication number 20200408724
    • Publication date Dec 31, 2020
    • NIHON DEMPA KOGYO CO., LTD.
    • Hiroyuki KUKITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING DEVICE
    • Publication number 20200378924
    • Publication date Dec 3, 2020
    • NIHON DEMPA KOGYO CO., LTD.
    • Hiroyuki KUKITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEMPERATURE DETECTOR
    • Publication number 20200264054
    • Publication date Aug 20, 2020
    • NIHON DEMPA KOGYO CO., LTD.
    • Hiroyuki KUKITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SUBSTANCE DETECTION SYSTEM AND SUBSTANCE DETECTION METHOD
    • Publication number 20190265177
    • Publication date Aug 29, 2019
    • NIHON DEMPA KOGYO CO., LTD.
    • Hiroyuki KUKITA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    VOLTAGE CONTROLLED OSCILLATOR
    • Publication number 20170019064
    • Publication date Jan 19, 2017
    • NIHON DEMPA KOGYO CO., LTD.
    • Tsuyoshi SHIOBARA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Frequency Synthesizer
    • Publication number 20100321068
    • Publication date Dec 23, 2010
    • NIHON DEMPA KOGYO CO., LTD.
    • Tsukasa Kobata
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    PLL Apparatus
    • Publication number 20090167382
    • Publication date Jul 2, 2009
    • NIHON DEMPA KOGYO CO., LTD.
    • Shunichi Wakamatsu
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Frequency Synthesizer
    • Publication number 20090167367
    • Publication date Jul 2, 2009
    • NIHON DEMPA KOGYO CO., LTD.
    • Tsukasa Kobata
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    PLL Apparatus
    • Publication number 20090146742
    • Publication date Jun 11, 2009
    • Naoki Onishi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Sensing Device
    • Publication number 20080156097
    • Publication date Jul 3, 2008
    • NIHON DEMPA KOGYO CO., LTD.
    • Naoki Onishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Quartz Sensor and Sensing Device
    • Publication number 20080134767
    • Publication date Jun 12, 2008
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Component Measuring Device
    • Publication number 20080129148
    • Publication date Jun 5, 2008
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING