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Tushar Gheewala
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Cupertino, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Various methods and apparatuses to route multiple power rails to a...
Patent number
8,132,142
Issue date
Mar 6, 2012
Synopsys, Inc.
Deepak D. Sherlekar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Various methods and apparatuses to preserve a logic state for a vol...
Patent number
7,603,634
Issue date
Oct 13, 2009
Virage Logic Corporation
Gene T. Sluss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Various methods and apparatuses to route multiple power rails to a...
Patent number
7,219,324
Issue date
May 15, 2007
Virage Logic Corporation
Deepak D. Sherlekar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dual-height cell with variable width power rail architecture
Patent number
7,129,562
Issue date
Oct 31, 2006
Virage Logic Corporation
Tushar R. Gheewala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Various methods and apparatuses to preserve a logic state for a vol...
Patent number
7,069,522
Issue date
Jun 27, 2006
Virage Logic Corporation
Gene T. Sluss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hybrid semiconductor circuit with programmable intraconnectivity
Patent number
6,991,947
Issue date
Jan 31, 2006
Tushar Gheewala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dual-height cell with variable width power rail architecture
Patent number
6,838,713
Issue date
Jan 4, 2005
Virage Logic Corporation
Tushar R. Gheewala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gate array architecture using elevated metal levels for customization
Patent number
6,617,621
Issue date
Sep 9, 2003
Virage Logic Corporation
Tushar R. Gheewala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Routing driven, metal programmable integrated circuit architecture...
Patent number
6,445,065
Issue date
Sep 3, 2002
In-Chip Systems, Inc.
Tushar R. Gheewala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Power and signal routing technique for gate array design
Patent number
6,091,090
Issue date
Jul 18, 2000
In-Chip Systems, Inc.
Tushar R. Gheewala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit cell architecture and routing scheme
Patent number
5,923,059
Issue date
Jul 13, 1999
In-Chip Systems, Inc.
Tushar R. Gheewala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reduced area gate array cell design based on shifted placement of a...
Patent number
5,923,060
Issue date
Jul 13, 1999
In-Chip Systems, Inc.
Tushar R. Gheewala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit cell architecture and routing scheme
Patent number
5,898,194
Issue date
Apr 27, 1999
InChip Systems, Inc.
Tushar R. Gheewala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for direct access test of embedded cells and customization l...
Patent number
5,799,021
Issue date
Aug 25, 1998
Duet Technologies, Inc.
Tushar R. Gheewala
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for testing integrated circuits
Patent number
5,495,486
Issue date
Feb 27, 1996
CrossCheck Technology, Inc.
Tushar Gheewala
G01 - MEASURING TESTING
Information
Patent Grant
Storage element for delay testing
Patent number
5,471,152
Issue date
Nov 28, 1995
CrossCheck Technology, Inc.
Tushar Gheewala
G01 - MEASURING TESTING
Information
Patent Grant
Method and structure for routing power for optimum cell utilization...
Patent number
5,436,801
Issue date
Jul 25, 1995
CrossCheck Technology, Inc.
Tushar Gheewala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for testing a sequential circuit by splicing test vectors in...
Patent number
5,230,001
Issue date
Jul 20, 1993
CrossCheck Technology, Inc.
Susheel J. Chandra
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for locally deriving test signals from previou...
Patent number
5,206,862
Issue date
Apr 27, 1993
CrossCheck Technology, Inc.
Susheel J. Chandra
G01 - MEASURING TESTING
Information
Patent Grant
Interface between IC operational circuitry for coupling test signal...
Patent number
5,202,624
Issue date
Apr 13, 1993
Cross-Check Technology, Inc.
Tushar R. Gheewala
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for setting desired signal level on storage el...
Patent number
5,157,627
Issue date
Oct 20, 1992
CrossCheck Technology, Inc.
Tushar R. Gheewala
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for testing integrated circuits having a grid-based, "cross-...
Patent number
5,065,090
Issue date
Nov 12, 1991
Cross-Check Technology, Inc.
Tushar R. Gheewala
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for sensing defects in integrated circuit elem...
Patent number
4,937,826
Issue date
Jun 26, 1990
CrossCheck Technology, Inc.
Tushar R. Gheewala
G01 - MEASURING TESTING