Uki Kabasawa

Follow

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for sample preparation and observation, charged particle ap...
- Patent number 7,915,581
- Issue date Mar 29, 2011
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Methods for sample preparation and observation, charged particle ap...
- Patent number 7,482,586
- Issue date Jan 27, 2009
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods for Sample Preparation and Observation, Charged Particle Ap...
- Publication number 20090127458
- Publication date May 21, 2009
- Hitachi High-Technologies
- Tohru ISHITANI
- G01 - MEASURING TESTING
Information Patent Application
Methods for sample preparation and observation, charged particle ap...
- Publication number 20070023651
- Publication date Feb 1, 2007
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING