Ulrich Kaczynski

Person

Bad Nauheim, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Substrate holder, and use of the substrate holder in a highly accur...
- Patent number 7,081,963
- Issue date Jul 25, 2006
- Leica Microsystems Semiconductor GmbH
- Carola Blaesing-Bangert
- G01 - MEASURING TESTING
Information Patent Grant
Contact sensor, and apparatus for protecting a protruding component
- Patent number 6,960,755
- Issue date Nov 1, 2005
- Leica Microsystems Semiconductor GmbH
- Ulrich Kaczynski
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Coordinate measuring stage
- Patent number 6,919,658
- Issue date Jul 19, 2005
- Leica Microsystems Semiconductor GmbH
- Ulrich Kaczynski
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Interferometric measurement apparatus for wavelength calibration
- Patent number 6,816,263
- Issue date Nov 9, 2004
- Leica Microsystems Semiconductor GmbH
- Ulrich Kaczynski
- G01 - MEASURING TESTING
Information Patent Grant
Substrate holder, and use of the substrate holder in a highly accur...
- Patent number 6,816,253
- Issue date Nov 9, 2004
- Leica Microsystems Semiconductor GmbH
- Carola Blaesing-Bangert
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measuring stage and coordinate measuring instrument
- Patent number 6,778,260
- Issue date Aug 17, 2004
- Leica Microsystems Semiconductor GmbH
- Carola Blaesing-Bangert
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measuring instrument and method for measuring patterns on substrate...
- Patent number 6,441,911
- Issue date Aug 27, 2002
- Leica Microsystems Wetzlar GmbH
- Ulrich Kaczynski
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for loading substrates of various sizes into s...
- Patent number 6,441,899
- Issue date Aug 27, 2002
- Leica Microsystems Wetzlar GmbH
- Carola Blaesing-Bangert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for fine positioning of a component, and coordinate measu...
- Patent number 6,438,856
- Issue date Aug 27, 2002
- Leica Microsystems Wetzlar GmbH
- Ulrich Kaczynski
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for delivering various transparent substrates int...
- Patent number 6,377,870
- Issue date Apr 23, 2002
- Leica Microsystems Wetzlar GmbH
- Carola Blaesing-Bangert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Displaceable X/Y coordinate measurement table
- Patent number 6,347,458
- Issue date Feb 19, 2002
- Leica Microsystems Wetzlar GmbH
- Ulrich Kaczynski
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring structures on a transparent substrate
- Patent number 6,323,953
- Issue date Nov 27, 2001
- Leica Microsystems Wetzlar GmbH
- Carola Blaesing-Bangert
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Microscope stand for a wafer inspection microscope
- Patent number 6,236,503
- Issue date May 22, 2001
- Leica Microsystems Wetzlar GmbH
- Ulrich Kaczynski
- G02 - OPTICS
Information Patent Grant
Limit switching apparatus with defined overtravel for specimen prot...
- Patent number 5,315,080
- Issue date May 24, 1994
- Leica Mikroskopie und Systems GmbH
- Ulrich Kaczynski
- G02 - OPTICS
Information Patent Grant
Automatic handling apparatus for plate-shaped objects
- Patent number 4,871,290
- Issue date Oct 3, 1989
- Ernst Leitz Wetzlar GmbH
- Ulrich Kaczynski
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Substrate holder, and use of the substrate holder in a highly accur...
- Publication number 20040179210
- Publication date Sep 16, 2004
- Leica Microsystems Wetzlar GmbH.
- Carola Blaesing-Bangert
- G01 - MEASURING TESTING
Information Patent Application
Coordinate measuring stage
- Publication number 20040027008
- Publication date Feb 12, 2004
- Leica Microsystems Semiconductor GmbH
- Ulrich Kaczynski
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Coordinate measuring stage and coordinate measuring instrument
- Publication number 20030053037
- Publication date Mar 20, 2003
- Leica Microsystems Semiconductor GmbH
- Carola Blaesing-Bangert
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Interferometric measurement apparatus for wavelength calibration
- Publication number 20030025910
- Publication date Feb 6, 2003
- Ulrich Kaczynski
- G01 - MEASURING TESTING
Information Patent Application
Contact sensor, and apparatus for protecting a protruding component
- Publication number 20020109077
- Publication date Aug 15, 2002
- Leica Microsystems Wetzlar GmbH.
- Ulrich Kaczynski
- H03 - BASIC ELECTRONIC CIRCUITRY

Ulrich Kaczynski

Person

Patents Grantslast 30 patents

Substrate holder, and use of the substrate holder in a highly accur...

Contact sensor, and apparatus for protecting a protruding component

Coordinate measuring stage

Interferometric measurement apparatus for wavelength calibration

Substrate holder, and use of the substrate holder in a highly accur...

Coordinate measuring stage and coordinate measuring instrument

Measuring instrument and method for measuring patterns on substrate...

Apparatus and method for loading substrates of various sizes into s...

Apparatus for fine positioning of a component, and coordinate measu...

Device and method for delivering various transparent substrates int...

Displaceable X/Y coordinate measurement table

Method and device for measuring structures on a transparent substrate

Microscope stand for a wafer inspection microscope

Limit switching apparatus with defined overtravel for specimen prot...

Automatic handling apparatus for plate-shaped objects

Patents Applicationslast 30 patents

Substrate holder, and use of the substrate holder in a highly accur...

Coordinate measuring stage

Coordinate measuring stage and coordinate measuring instrument

Interferometric measurement apparatus for wavelength calibration

Contact sensor, and apparatus for protecting a protruding component