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Venkatakaushik VOLETI
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Cupertino, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Metrology system for packaging applications
Patent number
12,222,659
Issue date
Feb 11, 2025
Applied Materials, Inc.
Venkatakaushik Voleti
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Spatial pattern loading measurement with imaging metrology
Patent number
12,211,717
Issue date
Jan 28, 2025
Applied Materials, Inc.
Eric Chin Hong Ng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image-based in-situ process monitoring
Patent number
11,908,716
Issue date
Feb 20, 2024
Applied Materials, Inc.
Guoheng Zhao
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Three-dimensional imaging using swept, confocally aligned planar ex...
Patent number
11,333,874
Issue date
May 17, 2022
The Trustees of Columbia University In the City of New York
Elizabeth M. C. Hillman
G02 - OPTICS
Information
Patent Grant
Three-dimensional imaging using swept, confocally aligned planar ex...
Patent number
10,955,652
Issue date
Mar 23, 2021
The Trustees of Columbia University In the City of New York
Elizabeth M. C. Hillman
G02 - OPTICS
Information
Patent Grant
SCAPE microscopy with phase modulating element and image reconstruc...
Patent number
10,908,088
Issue date
Feb 2, 2021
The Trustees of Columbia University In the City of New York
Venkatakaushik Voleti
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
USE OF ALTERNATING LAYER PATTERNS APPROACH FOR EFFECTIVE OVERLAY ME...
Publication number
20250123569
Publication date
Apr 17, 2025
Applied Materials, Inc.
Yau Loong CHONG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPATIAL PATTERN LOADING MEASUREMENT WITH IMAGING METROLOGY
Publication number
20250125171
Publication date
Apr 17, 2025
Applied Materials, Inc.
Eric Chin Hong Ng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS IN A PACKAGE
Publication number
20250076216
Publication date
Mar 6, 2025
Applied Materials, Inc.
Venkatakaushik VOLETI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIDIRECTIONAL ILLUMINATION FOR HYBRID BONDING DEFECT DETECTION
Publication number
20250076212
Publication date
Mar 6, 2025
Applied Materials, Inc.
Venkatakaushik VOLETI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Large Format Continuous Imaging System
Publication number
20250062145
Publication date
Feb 20, 2025
Applied Materials, Inc.
Venkatakaushik VOLETI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SAMPLE THICKNESS METROLOGY USING FOCUSED BEAM INTERFERENCE
Publication number
20250012560
Publication date
Jan 9, 2025
Applied Materials, Inc.
Venkatakaushik Voleti
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Integrated Inspection for Enhanced Hybrid Bonding Yield in Advanced...
Publication number
20240363446
Publication date
Oct 31, 2024
Venkatakaushik VOLETI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Metrology system for packaging applications
Publication number
20240241456
Publication date
Jul 18, 2024
Venkatakaushik VOLETI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Subsurface alignment metrology system for packaging applications
Publication number
20240170317
Publication date
May 23, 2024
Venkatakaushik VOLETI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMAGE-BASED IN-SITU PROCESS MONITORING
Publication number
20220367217
Publication date
Nov 17, 2022
Applied Materials, Inc.
Guoheng Zhao
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
SPATIAL PATTERN LOADING MEASUREMENT WITH IMAGING METROLOGY
Publication number
20220310425
Publication date
Sep 29, 2022
Applied Materials, Inc.
Eric Chin Hong Ng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Three-Dimensional Imaging Using Swept, Confocally Aligned Planar Ex...
Publication number
20210223532
Publication date
Jul 22, 2021
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
Elizabeth M.C. HILLMAN
G02 - OPTICS
Information
Patent Application
SCAPE Microscopy with Phase Modulating Element and Image Reconstruc...
Publication number
20200249168
Publication date
Aug 6, 2020
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
Venkatakaushik VOLETI
G01 - MEASURING TESTING
Information
Patent Application
Three-Dimensional Imaging Using Swept, Confocally Aligned Planar Ex...
Publication number
20190278073
Publication date
Sep 12, 2019
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
Elizabeth M.C. HILLMAN
G02 - OPTICS