Victor C. Y. Chang

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Tucheng, TW

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for de-embedding through substrate vias
- Patent number 9,121,891
- Issue date Sep 1, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for de-embedding through substrate vias
- Patent number 8,809,073
- Issue date Aug 19, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- G01 - MEASURING TESTING
Information Patent Grant
Process related deviation corrected parasitic capacitance modeling...
- Patent number 7,028,277
- Issue date Apr 11, 2006
- Taiwan Semiconductor Manufacturing Co., Ltd
- Victor C. Y. Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methodology to characterize metal sheet resistance of copper damasc...
- Patent number 6,854,100
- Issue date Feb 8, 2005
- Taiwan Semiconductor Manufacturing Company
- Harry Chuang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Methods for De-Embedding Through Substrate Vias
- Publication number 20140327005
- Publication date Nov 6, 2014
- Hsiao-Tsung Yen
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods for De-Embedding Through Substrate Vias
- Publication number 20130032799
- Publication date Feb 7, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsiao-Tsung Yen
- G01 - MEASURING TESTING
Information Patent Application
Metal Thickness Simulation for Improving RC Extraction Accuracy
- Publication number 20070266360
- Publication date Nov 15, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Kan Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHIELD STRUCTURES
- Publication number 20070257339
- Publication date Nov 8, 2007
- Taiwan Semiconductor Manufacturing Co., LTD
- Hsien-Wei Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Process related deviation corrected parasitic capacitance modeling...
- Publication number 20040123257
- Publication date Jun 24, 2004
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Victor C. Y. Chang
- G06 - COMPUTING CALCULATING COUNTING