Victor Zia

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for monitoring and predicting reliability of a...
- Patent number 10,634,714
- Issue date Apr 28, 2020
- Intel Corporation
- Huy Le
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
On-die system electrostatic discharge protection
- Patent number 10,373,948
- Issue date Aug 6, 2019
- Intel Corporation
- Christopher P. Mozak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sequential burn-in test mechanism
- Patent number 9,024,647
- Issue date May 5, 2015
- Intel Corporation
- Arman Vassighi
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and system for protecting supply nodes from elec...
- Patent number 8,514,533
- Issue date Aug 20, 2013
- Intel Corporation
- Christopher P. Mozak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to self-test single and multi-core CPU systems
- Patent number 7,463,992
- Issue date Dec 9, 2008
- Intel Corporation
- Samie B. Samaan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bidirectional body bias regulation
- Patent number 7,400,186
- Issue date Jul 15, 2008
- Intel Corporation
- James W. Tschanz
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and scanout circuits with error resilience circuit
- Patent number 7,278,076
- Issue date Oct 2, 2007
- Intel Corporation
- Ming Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Bias generator for body bias
- Patent number 7,236,045
- Issue date Jun 26, 2007
- Intel Corporation
- James W. Tschanz
- G05 - CONTROLLING REGULATING
Information Patent Grant
Bias generator for body bias
- Patent number 7,164,307
- Issue date Jan 16, 2007
- Intel Corporation
- James W. Tschanz
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for applying body bias to integrated circuit die
- Patent number 7,075,180
- Issue date Jul 11, 2006
- Intel Corporation
- Siva G. Narendra
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ON-DIE SYSTEM ELECTROSTATIC DISCHARGE PROTECTION
- Publication number 20180012886
- Publication date Jan 11, 2018
- Christopher P. Mozak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MONITORING AND PREDICTING RELIABILITY OF A...
- Publication number 20170242068
- Publication date Aug 24, 2017
- Intel Corporation
- Huy Le
- G01 - MEASURING TESTING
Information Patent Application
Sequential Burn-In Test Mechanism
- Publication number 20140062515
- Publication date Mar 6, 2014
- Arman Vassighi
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR PROTECTING SUPPLY NODES FROM ELEC...
- Publication number 20110317316
- Publication date Dec 29, 2011
- Christopher P. Mozak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system to self-test single and multi-core CPU systems
- Publication number 20080082285
- Publication date Apr 3, 2008
- Samie B. Samaan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Bidirectional body bias regulation
- Publication number 20070164808
- Publication date Jul 19, 2007
- James W. Tschanz
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and apparatus to adjust die frequency
- Publication number 20060226863
- Publication date Oct 12, 2006
- Siva G. Narendra
- G01 - MEASURING TESTING
Information Patent Application
Bias generator for body bias
- Publication number 20060164152
- Publication date Jul 27, 2006
- Intel Corporation
- James W. Tschanz
- G05 - CONTROLLING REGULATING
Information Patent Application
Bias generator for body bias
- Publication number 20060164157
- Publication date Jul 27, 2006
- Intel Corporation
- James W. Tschanz
- G05 - CONTROLLING REGULATING
Information Patent Application
System and scanout circuits with error resilience circuit
- Publication number 20060005103
- Publication date Jan 5, 2006
- Intel Corporation
- Ming Zhang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for applying body bias to integrated circuit die
- Publication number 20050139999
- Publication date Jun 30, 2005
- Siva G. Narendra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Local bias generator for adaptive forward body bias
- Publication number 20050068077
- Publication date Mar 31, 2005
- Intel Corporation
- James W. Tschanz
- G05 - CONTROLLING REGULATING

Person

Patents Grantslast 30 patents

Apparatus and method for monitoring and predicting reliability of a...

On-die system electrostatic discharge protection

Sequential burn-in test mechanism

Method, apparatus, and system for protecting supply nodes from elec...

Method and system to self-test single and multi-core CPU systems

Bidirectional body bias regulation

System and scanout circuits with error resilience circuit

Bias generator for body bias

Bias generator for body bias

Method and apparatus for applying body bias to integrated circuit die

Patents Applicationslast 30 patents

ON-DIE SYSTEM ELECTROSTATIC DISCHARGE PROTECTION

APPARATUS AND METHOD FOR MONITORING AND PREDICTING RELIABILITY OF A...

Sequential Burn-In Test Mechanism

METHOD, APPARATUS, AND SYSTEM FOR PROTECTING SUPPLY NODES FROM ELEC...

Method and system to self-test single and multi-core CPU systems

Bidirectional body bias regulation

Method and apparatus to adjust die frequency

Bias generator for body bias

Bias generator for body bias

System and scanout circuits with error resilience circuit

Method and apparatus for applying body bias to integrated circuit die

Local bias generator for adaptive forward body bias