Viera Stopjakova

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02962 Oravske Vesele, SK

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing electronic devices
- Patent number 6,496,028
- Issue date Dec 17, 2002
- Interuniversitair Micro-Elektronica Centrum
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Grant
High resolution (quiescent) supply current system (IDD monitor)
- Patent number 6,441,633
- Issue date Aug 27, 2002
- Interuniversitair Micro-Elektronica Centrum
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Grant
High resolution (quiescent) supply current system (IDD monitor)
- Patent number 6,118,293
- Issue date Sep 12, 2000
- Hans Manhaeve
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for testing electronic devices
- Publication number 20030062916
- Publication date Apr 3, 2003
- Interuniversitair Micro-Elektronica Centrum, vzw
- Hans Manhaeve
- G01 - MEASURING TESTING