Vilmos KERTESZ

Person

Knoxville, TN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Capture probe
- Patent number 11,892,383
- Issue date Feb 6, 2024
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Porous membrane enabled mass spectrometry characterization of micro...
- Patent number 11,862,449
- Issue date Jan 2, 2024
- UT-Battelle, LLC
- John F. Cahill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser ablation sampling system and method
- Patent number 11,841,297
- Issue date Dec 12, 2023
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rapid droplet introduction interface (RDII) for mass spectrometry
- Patent number 11,651,945
- Issue date May 16, 2023
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Porous membrane enabled mass spectrometry characterization of micro...
- Patent number 11,417,508
- Issue date Aug 16, 2022
- UT-Battelle, LLC
- John F. Cahill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capture probe
- Patent number 11,391,651
- Issue date Jul 19, 2022
- UT-Battelle, LLC
- Vilmos Kertesz
- G01 - MEASURING TESTING
Information Patent Grant
Laser ablation sampling system and method
- Patent number 11,181,446
- Issue date Nov 23, 2021
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capture probe
- Patent number 10,704,995
- Issue date Jul 7, 2020
- UT-Battelle, LLC
- Vilmos Kertesz
- G01 - MEASURING TESTING
Information Patent Grant
Capture probe
- Patent number 10,060,838
- Issue date Aug 28, 2018
- UT-Battelle, LLC
- Vilmos Kertesz
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for formation and withdrawal of a sample from a s...
- Patent number 9,779,926
- Issue date Oct 3, 2017
- UT-Battelle, LLC
- Gary J. Van Berkel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for liquid extraction electrospray-assisted sampl...
- Patent number 9,390,901
- Issue date Jul 12, 2016
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for laser assisted sample transfer to solution...
- Patent number 9,146,180
- Issue date Sep 29, 2015
- UT-Battelle, LLC
- Gary J. Van Berkel
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for laser assisted sample transfer to solution...
- Patent number 8,742,338
- Issue date Jun 3, 2014
- UT-Battelle, LLC
- Gary J. Van Berkel
- G01 - MEASURING TESTING
Information Patent Grant
System and method for laser assisted sample transfer to solution fo...
- Patent number 8,637,813
- Issue date Jan 28, 2014
- UT-Battelle, LLC
- Gary J. Van Berkel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrospray ion source with reduced analyte electrochemistry
- Patent number 8,497,473
- Issue date Jul 30, 2013
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control of the positional relationship between a sample collection...
- Patent number 8,117,929
- Issue date Feb 21, 2012
- UT-Battelle, LLC
- Gary J. Van Berkel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed voltage electrospray ion source and method for preventing an...
- Patent number 8,084,735
- Issue date Dec 27, 2011
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrospray ion source with reduced analyte electrochemistry
- Patent number 8,003,937
- Issue date Aug 23, 2011
- U. T. Battelle
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control of the positional relationship between a sample collection...
- Patent number 7,995,216
- Issue date Aug 9, 2011
- UT-Battelle, LLC
- Gary J. Van Berkel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated position control of a surface array relative to a liquid...
- Patent number 7,295,026
- Issue date Nov 13, 2007
- UT-Battelle, LLC
- Gary J. Van Berkel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Capture Probe
- Publication number 20240344938
- Publication date Oct 17, 2024
- UT-Battelle, LLC
- Vilmos KERTESZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POROUS MEMBRANE ENABLED MASS SPECTROMETRY CHARACTERIZATION OF MICRO...
- Publication number 20230049075
- Publication date Feb 16, 2023
- John F. Cahill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPTURE PROBE
- Publication number 20230040409
- Publication date Feb 9, 2023
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAPID DROPLET INTRODUCTION INTERFACE (RDII) FOR MASS SPECTROMETRY
- Publication number 20220102127
- Publication date Mar 31, 2022
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER ABLATION SAMPLING SYSTEM AND METHOD
- Publication number 20220099536
- Publication date Mar 31, 2022
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER ABLATION SAMPLING SYSTEM AND METHOD
- Publication number 20210262902
- Publication date Aug 26, 2021
- UT-Battelle, LLC
- Vilmos Kertesz
- G01 - MEASURING TESTING
Information Patent Application
POROUS MEMBRANE ENABLED MASS SPECTROMETRY CHARACTERIZATION OF MICRO...
- Publication number 20210225628
- Publication date Jul 22, 2021
- UT-Battelle, LLC
- John F. Cahill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capture Probe
- Publication number 20200340891
- Publication date Oct 29, 2020
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capture Probe
- Publication number 20190339173
- Publication date Nov 7, 2019
- UT-Battelle, LLC
- Vilmos Kertesz
- G01 - MEASURING TESTING
Information Patent Application
Capture Probe
- Publication number 20180356317
- Publication date Dec 13, 2018
- UT-Battelle, LLC
- Vilmos Kertesz
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR LIQUID EXTRACTION ELECTROSPRAY-ASSISTED SAMPL...
- Publication number 20160126080
- Publication date May 5, 2016
- UT-Battelle, LLC
- Vilmos KERTESZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION...
- Publication number 20140238155
- Publication date Aug 28, 2014
- UT-Battelle, LLC
- Gary J. VAN BERKEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR FORMATION AND WITHDRAWAL OF A SAMPLE FROM A S...
- Publication number 20140216177
- Publication date Aug 7, 2014
- UT-Battelle, LLC
- Gary J. VAN BERKEL
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION...
- Publication number 20130298701
- Publication date Nov 14, 2013
- University of Tennessee Research Foundation
- Gary J. VAN BERKEL
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FO...
- Publication number 20120080589
- Publication date Apr 5, 2012
- UT-Battelle, LLC
- Gary J. Van Berkel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSPRAY ION SOURCE WITH REDUCED ANALYTE ELECTROCHEMISTRY
- Publication number 20120043473
- Publication date Feb 23, 2012
- UT-Battelle, LLC
- Vilmos KERTESZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEALING SURFACE SAMPLING PROBE APPLIED TO BLOOD SPOTS AND TISSUES
- Publication number 20110269166
- Publication date Nov 3, 2011
- UT-Battelle, LLC
- Gary J. Van Berkel
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Method and system for formation and withdrawal of a sample from a s...
- Publication number 20100224013
- Publication date Sep 9, 2010
- Gary J. Van Berkel
- G01 - MEASURING TESTING
Information Patent Application
PULSED VOLTAGE ELECTROSPRAY ION SOURCE AND METHOD FOR PREVENTING AN...
- Publication number 20100072394
- Publication date Mar 25, 2010
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSPRAY ION SOURCE WITH REDUCED ANALYTE ELECTROCHEMISTRY
- Publication number 20100072357
- Publication date Mar 25, 2010
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Control of the positional relationship between a sample collection...
- Publication number 20100000338
- Publication date Jan 7, 2010
- Gary J. Van Berkel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Control of the positional relationship between a sample collection...
- Publication number 20100002905
- Publication date Jan 7, 2010
- Gary J. Van Berkel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated position control of a surface array relative to a liquid...
- Publication number 20060273808
- Publication date Dec 7, 2006
- Gary J. Van Berkel
- H01 - BASIC ELECTRIC ELEMENTS

Vilmos KERTESZ

Person

Patents Grantslast 30 patents

Capture probe

Porous membrane enabled mass spectrometry characterization of micro...

Laser ablation sampling system and method

Rapid droplet introduction interface (RDII) for mass spectrometry

Porous membrane enabled mass spectrometry characterization of micro...

Capture probe

Laser ablation sampling system and method

Capture probe

Capture probe

Method and system for formation and withdrawal of a sample from a s...

System and method for liquid extraction electrospray-assisted sampl...

Systems and methods for laser assisted sample transfer to solution...

Systems and methods for laser assisted sample transfer to solution...

System and method for laser assisted sample transfer to solution fo...

Electrospray ion source with reduced analyte electrochemistry

Control of the positional relationship between a sample collection...

Pulsed voltage electrospray ion source and method for preventing an...

Electrospray ion source with reduced analyte electrochemistry

Control of the positional relationship between a sample collection...

Automated position control of a surface array relative to a liquid...

Patents Applicationslast 30 patents

Capture Probe

POROUS MEMBRANE ENABLED MASS SPECTROMETRY CHARACTERIZATION OF MICRO...

CAPTURE PROBE

RAPID DROPLET INTRODUCTION INTERFACE (RDII) FOR MASS SPECTROMETRY

LASER ABLATION SAMPLING SYSTEM AND METHOD

LASER ABLATION SAMPLING SYSTEM AND METHOD

POROUS MEMBRANE ENABLED MASS SPECTROMETRY CHARACTERIZATION OF MICRO...

Capture Probe

Capture Probe

Capture Probe

SYSTEM AND METHOD FOR LIQUID EXTRACTION ELECTROSPRAY-ASSISTED SAMPL...

SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION...

METHOD AND SYSTEM FOR FORMATION AND WITHDRAWAL OF A SAMPLE FROM A S...

SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION...

SYSTEM AND METHOD FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FO...

ELECTROSPRAY ION SOURCE WITH REDUCED ANALYTE ELECTROCHEMISTRY

SEALING SURFACE SAMPLING PROBE APPLIED TO BLOOD SPOTS AND TISSUES

Method and system for formation and withdrawal of a sample from a s...

PULSED VOLTAGE ELECTROSPRAY ION SOURCE AND METHOD FOR PREVENTING AN...

ELECTROSPRAY ION SOURCE WITH REDUCED ANALYTE ELECTROCHEMISTRY

Control of the positional relationship between a sample collection...

Control of the positional relationship between a sample collection...

Automated position control of a surface array relative to a liquid...