Vimal Kamineni

Person

Mechanicville, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Isolation of waveguide-integrated detectors using a back end of lin...
- Patent number 12,176,672
- Issue date Dec 24, 2024
- PSIQUANTUM, CORP.
- Eric Dudley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Engineered electro-optic devices
- Patent number 11,892,715
- Issue date Feb 6, 2024
- PSIQUANTUM, CORP.
- Yong Liang
- G02 - OPTICS
Information Patent Grant
Barium titanate films having reduced interfacial strain
- Patent number 11,817,400
- Issue date Nov 14, 2023
- PSIQUANTUM, CORP.
- Yong Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Germanium mediated de-oxidation of silicon
- Patent number 11,651,956
- Issue date May 16, 2023
- PSIQUANTUM, CORP.
- Yong Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Superconducting nanowire single photon detector and method of fabri...
- Patent number 11,441,941
- Issue date Sep 13, 2022
- PSIQUANTUM CORP.
- Chia-Jung Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Germanium mediated de-oxidation of silicon
- Patent number 11,302,528
- Issue date Apr 12, 2022
- PSIQUANTUM, CORP.
- Yong Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for formation of stabilized tetragonal barium tit...
- Patent number 11,226,507
- Issue date Jan 18, 2022
- PSIQUANTUM, CORP.
- Yong Liang
- G02 - OPTICS
Information Patent Grant
Contact interlayer dielectric replacement with improved SAC cap ret...
- Patent number 11,024,536
- Issue date Jun 1, 2021
- International Business Machines Corporation
- Adra Carr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Superconducting nanowire single photon detector and method of fabri...
- Patent number 11,009,387
- Issue date May 18, 2021
- PSIQUANTUM CORP.
- Chia-Jung Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming air gaps between source/drain contacts and the r...
- Patent number 10,950,692
- Issue date Mar 16, 2021
- GLOBALFOUNDRIES U.S. INC.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robust gate cap for protecting a gate from downstream metallization...
- Patent number 10,916,431
- Issue date Feb 9, 2021
- International Business Machines Corporation
- Raghuveer Reddy Patlolla
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modified dielectric fill between the contacts of field-effect trans...
- Patent number 10,916,470
- Issue date Feb 9, 2021
- GLOBALFOUNDRIES Inc.
- Vimal K. Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, apparatus, and system for protecting cobalt formations fro...
- Patent number 10,854,515
- Issue date Dec 1, 2020
- GLOBALFOUNDRIES, INC.
- Vimal Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interlayer dielectric replacement techniques with protection for so...
- Patent number 10,770,562
- Issue date Sep 8, 2020
- International Business Machines Corporation
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Short channel and long channel devices
- Patent number 10,741,668
- Issue date Aug 11, 2020
- GLOBALFOUNDRIES Inc.
- Bala Haran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnect structures with airgaps and dielectric-capped intercon...
- Patent number 10,707,119
- Issue date Jul 7, 2020
- GLOBALFOUNDRIES Inc.
- Nicholas V. LiCausi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to recess cobalt for gate metal application
- Patent number 10,707,132
- Issue date Jul 7, 2020
- International Business Machines Corporation
- Georges Jacobi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to recess cobalt for gate metal application
- Patent number 10,615,078
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Georges Jacobi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, apparatus, and system for protecting cobalt formations fro...
- Patent number 10,593,593
- Issue date Mar 17, 2020
- GLOBALFOUNDRIES Inc.
- Vimal Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to recess cobalt for gate metal application
- Patent number 10,546,785
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Georges Jacobi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contacting source and drain of a transistor device
- Patent number 10,468,300
- Issue date Nov 5, 2019
- GLOBALFOUNDRIES Inc.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit product having a through-substrate-via (TSV) and...
- Patent number 10,446,443
- Issue date Oct 15, 2019
- GLOBALFOUNDRIES Inc.
- Himani Suhag Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Local interconnect structure including non-eroded contact via trenches
- Patent number 10,388,602
- Issue date Aug 20, 2019
- International Business Machines Corporation
- Su Chen Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate pickup method using metal selectivity
- Patent number 10,242,867
- Issue date Mar 26, 2019
- GLOBALFOUNDARIES INC.
- Guillaume Bouche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned contact with CMP stop layer
- Patent number 10,134,633
- Issue date Nov 20, 2018
- GLOBALFOUNDRIES Inc.
- Vimal Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods of cobalt fill metallization
- Patent number 10,128,151
- Issue date Nov 13, 2018
- GLOBALFOUNDRIES Inc.
- Vimal Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for capping cobalt contacts
- Patent number 10,043,708
- Issue date Aug 7, 2018
- GLOBALFOUNDRIES Inc.
- Viraj Sardesai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, apparatus, and system for MOL interconnects without titaniu...
- Patent number 10,026,693
- Issue date Jul 17, 2018
- GLOBALFOUNDRIES Inc.
- Vimal Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrosion and/or etch protection layer for contacts and interconnec...
- Patent number 10,020,260
- Issue date Jul 10, 2018
- GLOBALFOUNDRIES Inc.
- Shafaat Ahmed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tungsten gate and method for forming
- Patent number 10,014,180
- Issue date Jul 3, 2018
- GLOBALFOUNDRIES Inc.
- Neal A. Makela
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Superconducting Nanowire Single Photon Detector and Method of Fabri...
- Publication number 20240402004
- Publication date Dec 5, 2024
- PsiQuantum Corp,
- Chia-Jung Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENGINEERED ELECTRO-OPTIC DEVICES
- Publication number 20240201525
- Publication date Jun 20, 2024
- Psiquantum, Corp.
- Yong Liang
- G02 - OPTICS
Information Patent Application
BARIUM TITANATE FILMS HAVING REDUCED INTERFACIAL STRAIN
- Publication number 20240063146
- Publication date Feb 22, 2024
- Psiquantum, Corp.
- Yong Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD TO REMOVE SEMICONDUCTOR CHIP MATERIAL FOR OPTI...
- Publication number 20230418011
- Publication date Dec 28, 2023
- Psiquantum, Corp.
- George A. KOVALL
- G02 - OPTICS
Information Patent Application
METHOD AND STRUCTURE TO INCORPORATE MULTIPLE LOW LOSS PHOTONIC CIRC...
- Publication number 20230366913
- Publication date Nov 16, 2023
- Psiquantum, Corp.
- Vimal KAMINENI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT
- Publication number 20230123000
- Publication date Apr 20, 2023
- Psiquantum, Corp.
- Vimal Kumar Kamineni
- G02 - OPTICS
Information Patent Application
BARIUM TITANATE FILMS HAVING REDUCED INTERFACIAL STRAIN
- Publication number 20230018940
- Publication date Jan 19, 2023
- Psiquantum, Corp.
- Yong Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GERMANIUM MEDIATED DE-OXIDATION OF SILICON
- Publication number 20220270874
- Publication date Aug 25, 2022
- Psiquantum, Corp.
- Yong Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR FORMATION OF STABILIZED TETRAGONAL BARIUM TIT...
- Publication number 20220107518
- Publication date Apr 7, 2022
- Psiquantum, Corp.
- Yong Liang
- G02 - OPTICS
Information Patent Application
ISOLATION OF WAVEGUIDE-INTEGRATED DETECTORS USING A BACK END OF LIN...
- Publication number 20210242651
- Publication date Aug 5, 2021
- Psiquantum, Corp.
- Eric Dudley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Superconducting Nanowire Single Photon Detector and Method of Fabri...
- Publication number 20210239518
- Publication date Aug 5, 2021
- PsiQuantum Corp,
- Chia-Jung Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR FORMATION OF STABILIZED TETRAGONAL BARIUM TIT...
- Publication number 20210124233
- Publication date Apr 29, 2021
- Psiquantum, Corp.
- Yong Liang
- G02 - OPTICS
Information Patent Application
GERMANIUM MEDIATED DE-OXIDATION OF SILICON
- Publication number 20210028015
- Publication date Jan 28, 2021
- PsiQuantum Corp.
- Yong Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Superconducting Nanowire Single Photon Detector and Method of Fabri...
- Publication number 20200333179
- Publication date Oct 22, 2020
- PsiQuantum Corp,
- Chia-Jung Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROBUST GATE CAP FOR PROTECTING A GATE FROM DOWNSTREAM METALLIZATION...
- Publication number 20200335345
- Publication date Oct 22, 2020
- International Business Machines Corporation
- Raghuveer Reddy Patlolla
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT INTERLAYER DIELECTRIC REPLACEMENT WITH IMPROVED SAC CAP RET...
- Publication number 20200335392
- Publication date Oct 22, 2020
- International Business Machines Corporation
- Adra Carr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODIFIED DIELECTRIC FILL BETWEEN THE CONTACTS OF FIELD-EFFECT TRANS...
- Publication number 20200279768
- Publication date Sep 3, 2020
- GLOBALFOUNDRIES INC.
- Vimal K. Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERLAYER DIELECTRIC REPLACEMENT TECHNIQUES WITH PROTECTION FOR SO...
- Publication number 20200279933
- Publication date Sep 3, 2020
- International Buisness Machines Corporation
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERCONNECT STRUCTURES WITH AIRGAPS AND DIELECTRIC-CAPPED INTERCON...
- Publication number 20200227308
- Publication date Jul 16, 2020
- GLOBALFOUNDRIES INC.
- Nicholas V. LiCausi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS, APPARATUS, AND SYSTEM FOR PROTECTING COBALT FORMATIONS FRO...
- Publication number 20200168504
- Publication date May 28, 2020
- GLOBALFOUNDRIES INC.
- Vimal Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING AIR GAPS BETWEEN SOURCE/DRAIN CONTACTS AND THE R...
- Publication number 20200075715
- Publication date Mar 5, 2020
- GLOBALFOUNDRIES INC.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS, APPARATUS, AND SYSTEM FOR PROTECTING COBALT FORMATIONS FRO...
- Publication number 20200035556
- Publication date Jan 30, 2020
- GLOBALFOUNDRIES INC.
- Vimal Kamineni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO RECESS COBALT FOR GATE METAL APPLICATION
- Publication number 20190385913
- Publication date Dec 19, 2019
- International Business Machines Corporation
- Georges Jacobi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO RECESS COBALT FOR GATE METAL APPLICATION
- Publication number 20190385912
- Publication date Dec 19, 2019
- International Business Machines Corporation
- Georges Jacobi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE STACK PROCESSES AND STRUCTURES
- Publication number 20190096679
- Publication date Mar 28, 2019
- GLOBALFOUNDRIES INC.
- Balaji Kannan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPLACEMENT METAL GATE MODULE
- Publication number 20190027578
- Publication date Jan 24, 2019
- GLOBALFOUNDRIES Inc.
- Bala HARAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACTING SOURCE AND DRAIN OF A TRANSISTOR DEVICE
- Publication number 20190013241
- Publication date Jan 10, 2019
- GLOBALFOUNDRIES INC.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE PICKUP METHOD USING METAL SELECTIVITY
- Publication number 20180337037
- Publication date Nov 22, 2018
- GLOBALFOUNDRIES INC.
- Guillaume BOUCHE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR CAPPING COBALT CONTACTS
- Publication number 20180277427
- Publication date Sep 27, 2018
- GLOBALFOUNDRIES INC.
- Viraj SARDESAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO RECESS COBALT FOR GATE METAL APPLICATION
- Publication number 20180261507
- Publication date Sep 13, 2018
- International Business Machines Corporation
- Georges Jacobi
- H01 - BASIC ELECTRIC ELEMENTS

Vimal Kamineni

Person

Patents Grantslast 30 patents

Isolation of waveguide-integrated detectors using a back end of lin...

Engineered electro-optic devices

Barium titanate films having reduced interfacial strain

Germanium mediated de-oxidation of silicon

Superconducting nanowire single photon detector and method of fabri...

Germanium mediated de-oxidation of silicon

Method and system for formation of stabilized tetragonal barium tit...

Contact interlayer dielectric replacement with improved SAC cap ret...

Superconducting nanowire single photon detector and method of fabri...

Methods of forming air gaps between source/drain contacts and the r...

Robust gate cap for protecting a gate from downstream metallization...

Modified dielectric fill between the contacts of field-effect trans...

Methods, apparatus, and system for protecting cobalt formations fro...

Interlayer dielectric replacement techniques with protection for so...

Short channel and long channel devices

Interconnect structures with airgaps and dielectric-capped intercon...

Method to recess cobalt for gate metal application

Method to recess cobalt for gate metal application

Methods, apparatus, and system for protecting cobalt formations fro...

Method to recess cobalt for gate metal application

Contacting source and drain of a transistor device

Integrated circuit product having a through-substrate-via (TSV) and...

Local interconnect structure including non-eroded contact via trenches

Gate pickup method using metal selectivity

Self-aligned contact with CMP stop layer

Devices and methods of cobalt fill metallization

Structure and method for capping cobalt contacts

Method, apparatus, and system for MOL interconnects without titaniu...

Corrosion and/or etch protection layer for contacts and interconnec...

Tungsten gate and method for forming

Patents Applicationslast 30 patents

Superconducting Nanowire Single Photon Detector and Method of Fabri...

ENGINEERED ELECTRO-OPTIC DEVICES

BARIUM TITANATE FILMS HAVING REDUCED INTERFACIAL STRAIN

STRUCTURE AND METHOD TO REMOVE SEMICONDUCTOR CHIP MATERIAL FOR OPTI...

METHOD AND STRUCTURE TO INCORPORATE MULTIPLE LOW LOSS PHOTONIC CIRC...

PHOTONIC INTEGRATED CIRCUIT

BARIUM TITANATE FILMS HAVING REDUCED INTERFACIAL STRAIN

GERMANIUM MEDIATED DE-OXIDATION OF SILICON

METHOD AND SYSTEM FOR FORMATION OF STABILIZED TETRAGONAL BARIUM TIT...

ISOLATION OF WAVEGUIDE-INTEGRATED DETECTORS USING A BACK END OF LIN...

Superconducting Nanowire Single Photon Detector and Method of Fabri...

METHOD AND SYSTEM FOR FORMATION OF STABILIZED TETRAGONAL BARIUM TIT...

GERMANIUM MEDIATED DE-OXIDATION OF SILICON

Superconducting Nanowire Single Photon Detector and Method of Fabri...

ROBUST GATE CAP FOR PROTECTING A GATE FROM DOWNSTREAM METALLIZATION...

CONTACT INTERLAYER DIELECTRIC REPLACEMENT WITH IMPROVED SAC CAP RET...

MODIFIED DIELECTRIC FILL BETWEEN THE CONTACTS OF FIELD-EFFECT TRANS...

INTERLAYER DIELECTRIC REPLACEMENT TECHNIQUES WITH PROTECTION FOR SO...

INTERCONNECT STRUCTURES WITH AIRGAPS AND DIELECTRIC-CAPPED INTERCON...

METHODS, APPARATUS, AND SYSTEM FOR PROTECTING COBALT FORMATIONS FRO...

METHODS OF FORMING AIR GAPS BETWEEN SOURCE/DRAIN CONTACTS AND THE R...

METHODS, APPARATUS, AND SYSTEM FOR PROTECTING COBALT FORMATIONS FRO...

METHOD TO RECESS COBALT FOR GATE METAL APPLICATION

METHOD TO RECESS COBALT FOR GATE METAL APPLICATION

GATE STACK PROCESSES AND STRUCTURES

REPLACEMENT METAL GATE MODULE

CONTACTING SOURCE AND DRAIN OF A TRANSISTOR DEVICE

GATE PICKUP METHOD USING METAL SELECTIVITY

STRUCTURE AND METHOD FOR CAPPING COBALT CONTACTS

METHOD TO RECESS COBALT FOR GATE METAL APPLICATION