Vinay Burjinroppa Jayaram

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Allen, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Built in self test for input/output characterization
- Patent number 7,814,386
- Issue date Oct 12, 2010
- Texas Instruments Incorporated
- John Joseph Seibold
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BUILT IN SELF TEST FOR INPUT/OUTPUT CHARACTERIZATION
- Publication number 20090113264
- Publication date Apr 30, 2009
- JOHN Joseph SEIBOLD
- G01 - MEASURING TESTING
Information Patent Application
Re-using production test scan paths for system test of an integrate...
- Publication number 20080235545
- Publication date Sep 25, 2008
- Vinay Burjinroppa Jayaram
- G01 - MEASURING TESTING
Information Patent Application
Memory testing system and method
- Publication number 20080163013
- Publication date Jul 3, 2008
- Robert James Landers
- G11 - INFORMATION STORAGE