Placitas, NM, US
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Patent Grant
The United States of America as represented by the United States Department o...
Susan Leslie Hietala
G01 - MEASURING TESTING
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Patent Grant
Sandia Corporation
Vincent M. Hietala
B82 - NANO-TECHNOLOGY
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Patent Grant
Sandia Corporation
G. Allen Vawter
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
Sandia Corporation
Jon S. Martens
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the United States Department o...
Vincent M. Hietala
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
The United States of America as represented by the United States Department o...
Jon S. Martens
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Sandia Corporation
David S. Ginley
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America as repesented by the United States Department of...
Jon S. Martens
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
The United States of America as represented by the United States Department o...
Vincent M. Hietala
G02 - OPTICS
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Patent Grant
The United States of America as represented by the United States Department o...
Vincent M. Hietala
G02 - OPTICS
Information
Patent Grant
The United States of America as represented by the United States Department o...
David S. Ginley
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
The United States of America as represented by the United States Department o...
Jon S. Martens
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by the United States Department o...
Vincent M. Hietala
G02 - OPTICS
Information
Patent Application
SHAWN-YU LIN
B82 - NANO-TECHNOLOGY
