Vineet Dharmadhikari

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect detection using time delay lock-in thermography (LIT) and da...
- Patent number 7,709,794
- Issue date May 4, 2010
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DETECTION USING TIME DELAY LOCK-IN THERMOGRAPHY (LIT) AND DA...
- Publication number 20100073665
- Publication date Mar 25, 2010
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
Defect Detection and Response
- Publication number 20100074515
- Publication date Mar 25, 2010
- KLA-Tencor Corporation
- Guoheng Zhao
- G06 - COMPUTING CALCULATING COUNTING