Vishal Verma

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St. Joseph, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Automatic wafer edge inspection and review system
- Patent number 7,508,504
- Issue date Mar 24, 2009
- Accretech USA, Inc.
- Ju Jin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for Wafer Edge Exclusion Measurement
- Publication number 20090122304
- Publication date May 14, 2009
- Accretech USA, Inc.
- Ju Jin
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Wafer Edge Defects Detection
- Publication number 20090116727
- Publication date May 7, 2009
- Accretech USA, Inc.
- Ju Jin
- G01 - MEASURING TESTING
Information Patent Application
Automatic wafer edge inspection and review system
- Publication number 20080030731
- Publication date Feb 7, 2008
- Accretech USA, Inc.
- Ju Jin
- G01 - MEASURING TESTING