Vishwani Agrawal

Person

Murray Hill, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for identifying tested path delay faults
- Patent number 6,131,181
- Issue date Oct 10, 2000
- Rutgers University
- Michael Bushnell
- G01 - MEASURING TESTING
Information Patent Grant
Low power circuits through hazard pulse suppression
- Patent number 5,983,007
- Issue date Nov 9, 1999
- Lucent Technologies Inc.
- Vishwani Deo Agrawal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing and removal of redundancies in VLSI circuits with non-boole...
- Patent number 5,657,240
- Issue date Aug 12, 1997
- NEC USA, Inc.
- Srimat T. Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
Delay testing of high-performance digital components by a slow-spee...
- Patent number 5,606,567
- Issue date Feb 25, 1997
- Lucent Technologies Inc.
- Vishwani D. Agrawal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing a sequential circuit
- Patent number 5,590,135
- Issue date Dec 31, 1996
- Lucent Technologies Inc.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for test generation and fault simulation for s...
- Patent number 5,499,249
- Issue date Mar 12, 1996
- AT&T Corp.
- Vishwani D. Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
VLSI circuits designed for testability and methods for producing them
- Patent number 5,461,573
- Issue date Oct 24, 1995
- NEC USA, Inc.
- Srimat T. Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing delay faults in non-scan sequential circuits
- Patent number 5,365,528
- Issue date Nov 15, 1994
- AT&T Bell Laboratories
- Vishwani D. Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Cost-function directed search method for generating tests for seque...
- Patent number 5,257,268
- Issue date Oct 26, 1993
- AT&T Bell Laboratories
- Prathima Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Testable implementations of finite state machines and methods for p...
- Patent number 5,228,040
- Issue date Jul 13, 1993
- AT&T Bell Laboratories
- Vishwani D. Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Method and integrated circuit adapted for partial scan testability
- Patent number 5,043,986
- Issue date Aug 27, 1991
- AT&T Bell Laboratories
- Vishwani D. Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Scan testable integrated circuit
- Patent number 4,493,077
- Issue date Jan 8, 1985
- AT&T Laboratories
- Vishwani D. Agrawal
- G01 - MEASURING TESTING

Vishwani Agrawal

Person

Patents Grantslast 30 patents

Method and system for identifying tested path delay faults

Low power circuits through hazard pulse suppression

Testing and removal of redundancies in VLSI circuits with non-boole...

Delay testing of high-performance digital components by a slow-spee...

Testing a sequential circuit

Method and apparatus for test generation and fault simulation for s...

VLSI circuits designed for testability and methods for producing them

Method for testing delay faults in non-scan sequential circuits

Cost-function directed search method for generating tests for seque...

Testable implementations of finite state machines and methods for p...

Method and integrated circuit adapted for partial scan testability

Scan testable integrated circuit