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Vladimir A. Zilberstein
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Chestnut Hill, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Internal material condition monitoring for control
Patent number
8,981,018
Issue date
Mar 17, 2015
Jentek Sensors, Inc.
Neil J. Goldfine
G05 - CONTROLLING REGULATING
Information
Patent Grant
Remaining life prediction for individual components from sparse data
Patent number
8,768,657
Issue date
Jul 1, 2014
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Component adaptive life management
Patent number
8,494,810
Issue date
Jul 23, 2013
Jentek Sensors, Inc.
Neil J. Goldfine
G07 - CHECKING-DEVICES
Information
Patent Grant
Magnetic field characterization of stresses and properties in mater...
Patent number
8,237,433
Issue date
Aug 7, 2012
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field characterization of stresses and properties in mater...
Patent number
7,876,094
Issue date
Jan 25, 2011
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Absolute property measurements using electromagnetic sensors
Patent number
7,696,748
Issue date
Apr 13, 2010
Jentek Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Grant
Quasistatic magnetic and electric field stress/strain gages
Patent number
7,533,575
Issue date
May 19, 2009
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Applied and residual stress measurements using magnetic field sensors
Patent number
7,526,964
Issue date
May 5, 2009
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid wound/etched winding constructs for scanning and monitoring
Patent number
7,518,360
Issue date
Apr 14, 2009
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Material condition monitoring with multiple sensing modes
Patent number
7,451,657
Issue date
Nov 18, 2008
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Method for verifying sensor condition
Patent number
7,348,771
Issue date
Mar 25, 2008
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Segmented field dielectric sensor array for material characterization
Patent number
7,280,940
Issue date
Oct 9, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Damage standard fabrication with attached sensor
Patent number
7,230,421
Issue date
Jun 12, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Self-monitoring metals, alloys and materials
Patent number
7,188,532
Issue date
Mar 13, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Method for material property monitoring with perforated, surface mo...
Patent number
7,161,350
Issue date
Jan 9, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Hidden feature characterization using a database of sensor responses
Patent number
7,161,351
Issue date
Jan 9, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication of samples having predetermined material conditions
Patent number
7,106,055
Issue date
Sep 12, 2006
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Process control and damage monitoring
Patent number
7,095,224
Issue date
Aug 22, 2006
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
High resolution inductive sensor arrays for material and defect cha...
Patent number
6,995,557
Issue date
Feb 7, 2006
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Surface mounted and scanning spatially periodic eddy-current sensor...
Patent number
6,952,095
Issue date
Oct 4, 2005
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Fluid supports for sensors
Patent number
6,798,198
Issue date
Sep 28, 2004
Jentek Sensors, Inc.
Vladimir Tsukernik
G01 - MEASURING TESTING
Information
Patent Grant
High resolution inductive sensor arrays for material and defect cha...
Patent number
6,727,691
Issue date
Apr 27, 2004
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Material condition assessment with spatially periodic field sensors
Patent number
6,657,429
Issue date
Dec 2, 2003
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INTERNAL MATERIAL CONDITION MONITORING FOR CONTROL
Publication number
20150160144
Publication date
Jun 11, 2015
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Characterization of Stresses and Properties in Mater...
Publication number
20110163742
Publication date
Jul 7, 2011
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Component Adaptive Life Management
Publication number
20110060568
Publication date
Mar 10, 2011
JENTEK Sensors, Inc.
Neil J. Goldfine
G07 - CHECKING-DEVICES
Information
Patent Application
Magnetic field characterization of stresses and properties in mater...
Publication number
20100045277
Publication date
Feb 25, 2010
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Hybrid wound/etched winding constructs for scanning and monitoring
Publication number
20080258720
Publication date
Oct 23, 2008
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Quasistatic magnetic and electric field stress/strain gages
Publication number
20070245834
Publication date
Oct 25, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Remaining life prediction for individual components from sparse data
Publication number
20070239407
Publication date
Oct 11, 2007
Neil J. Goldfine
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Self-monitoring metals, alloys and materials
Publication number
20070227255
Publication date
Oct 4, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Method for material property monitoring with perforated, surface mo...
Publication number
20070120561
Publication date
May 31, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field characterization of stresses and properties in mater...
Publication number
20070114993
Publication date
May 24, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Segmented field dielectric sensor array for material characterization
Publication number
20060247896
Publication date
Nov 2, 2006
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Surface mounted and scanning spatially periodic eddy-current sensor...
Publication number
20060082366
Publication date
Apr 20, 2006
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Internal material condition monitoring for control
Publication number
20060009865
Publication date
Jan 12, 2006
JENTEK Sensors, Inc.
Neil J. Goldfine
G05 - CONTROLLING REGULATING
Information
Patent Application
Material condition monitoring with multiple sensing modes
Publication number
20050171703
Publication date
Aug 4, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Fabrication of samples having predetermined material conditions
Publication number
20050146324
Publication date
Jul 7, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Absolute property measurements using electromagnetic sensors
Publication number
20050127908
Publication date
Jun 16, 2005
JENTEK Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
Hidden feature characterization using eddy current sensors and arrays
Publication number
20050088172
Publication date
Apr 28, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Self-monitoring metals, alloys and materials
Publication number
20050083032
Publication date
Apr 21, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Fluid supports for sensors
Publication number
20050083050
Publication date
Apr 21, 2005
JENTEK Sensors, Inc.
Vladimir Tsukernik
G01 - MEASURING TESTING
Information
Patent Application
Weld characterization using eddy current sensors and arrays
Publication number
20050017713
Publication date
Jan 27, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Hybrid wound/etched winding constructs for scanning and monitoring
Publication number
20050007106
Publication date
Jan 13, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
High resolution inductive sensor arrays for material and defect cha...
Publication number
20040239317
Publication date
Dec 2, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Damage tolerance using adaptive model-based methods
Publication number
20040225474
Publication date
Nov 11, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G05 - CONTROLLING REGULATING
Information
Patent Application
Process control and damage monitoring
Publication number
20040174157
Publication date
Sep 9, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Material condition assessment with spatially periodic field sensors
Publication number
20040066188
Publication date
Apr 8, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field characterization of stresses and properties in mater...
Publication number
20040056654
Publication date
Mar 25, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
High throughput absolute flaw imaging
Publication number
20040004475
Publication date
Jan 8, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Applied and residual stress measurements using magnetic field sensors
Publication number
20030173958
Publication date
Sep 18, 2003
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Fluid supports for sensors
Publication number
20030155914
Publication date
Aug 21, 2003
JENTEK Sensors, Inc.
Vladimir Tsukernik
G01 - MEASURING TESTING
Information
Patent Application
High resolution inductive sensor arrays for material and defect cha...
Publication number
20020105325
Publication date
Aug 8, 2002
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING