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Wallace H. Coulter
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Miami, FL, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method of selection of a population or subpopulation of a sample ut...
Patent number
6,900,029
Issue date
May 31, 2005
Miltenyi Biotec GmbH
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for screening microscopic cells utilizing ligh...
Patent number
6,579,685
Issue date
Jun 17, 2003
Coulter International Corp.
Thomas Russell
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for screening obscured or partially obscured c...
Patent number
6,159,740
Issue date
Dec 12, 2000
Coulter Corporation
James Carey Hudson
G01 - MEASURING TESTING
Information
Patent Grant
Closed vial transfer method and system
Patent number
5,653,686
Issue date
Aug 5, 1997
Coulter Corporation
Wallace H. Coulter
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method of positive or negative selection of a population or subpopu...
Patent number
5,576,185
Issue date
Nov 19, 1996
Coulter Corporation
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for rapid mixing of small volumes for enhancin...
Patent number
5,468,616
Issue date
Nov 21, 1995
Coulter Corporation
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Automated analyzer for screening cells or formed bodies for enumera...
Patent number
5,464,752
Issue date
Nov 7, 1995
Coulter Corporation
Kenneth H. Kortright
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for obtaining an absolute white blood cell sub...
Patent number
5,348,859
Issue date
Sep 20, 1994
Coulter Corporation
Robert F. Brunhouse
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for screening cells or formed bodies with popu...
Patent number
5,260,192
Issue date
Nov 9, 1993
Coulter Corporation
Thomas Russell
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for rapid mixing of small volumes for enhancin...
Patent number
5,238,812
Issue date
Aug 24, 1993
Coulter Corporation
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for screening cells or formed bodies with popu...
Patent number
5,231,005
Issue date
Jul 27, 1993
Coulter Corporation
Thomas Russell
G01 - MEASURING TESTING
Information
Patent Grant
Method for screening cells or formed bodies for enumeration of popu...
Patent number
5,223,398
Issue date
Jun 29, 1993
Coulter Corporation
Kenneth H. Kortright
G01 - MEASURING TESTING
Information
Patent Grant
Multi-part differential analyzing apparatus utilizing light scatter...
Patent number
5,125,737
Issue date
Jun 30, 1992
Coulter Electronics, Inc.
Carlos M. Rodriguez
G01 - MEASURING TESTING
Information
Patent Grant
Particle analyzer for measuring the resistance and reactance of a p...
Patent number
4,791,355
Issue date
Dec 13, 1988
Coulter Electronics Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Lodged debris detector for a particle analyzer
Patent number
4,775,833
Issue date
Oct 4, 1988
Coulter Electronics, Inc.
Ermi Roos
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for transporting carriers of sealed sample tub...
Patent number
4,609,017
Issue date
Sep 2, 1986
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Cassette for supporting test tubes of different diameters and/or le...
Patent number
4,534,465
Issue date
Aug 13, 1985
Coulter Electronics, Inc.
William F. Rothermel
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Electrical slit scanning apparatus
Patent number
4,527,114
Issue date
Jul 2, 1985
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Level sensor apparatus and method
Patent number
4,326,851
Issue date
Apr 27, 1982
Coulter Electronics, Inc.
Ernesto Bello
G01 - MEASURING TESTING
Information
Patent Grant
Fluid transfer apparatus
Patent number
4,325,909
Issue date
Apr 20, 1982
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Particle shape determination
Patent number
4,298,836
Issue date
Nov 3, 1981
Coulter Electronics, Inc.
Michael R. Groves
G01 - MEASURING TESTING
Information
Patent Grant
Reflector for the laser beam of a particle analyzer
Patent number
4,281,924
Issue date
Aug 4, 1981
Coulter Electronics, Inc.
Robert E. Auer
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for providing primary coincidence correction d...
Patent number
4,009,443
Issue date
Feb 22, 1977
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Particle analyzer of the Coulter type including coincidence error c...
Patent number
3,968,429
Issue date
Jul 6, 1976
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for cleaning an aperture in a particle study device
Patent number
3,963,984
Issue date
Jun 15, 1976
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Particle size distribution analyzation employing trailing edge diff...
Patent number
3,961,249
Issue date
Jun 1, 1976
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatuses for correcting coincidence count inaccuraci...
Patent number
3,949,198
Issue date
Apr 6, 1976
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Electrical sensing circuitry for particle analyzing device
Patent number
3,944,917
Issue date
Mar 16, 1976
Coulter Electronics, Inc.
Walter R. Hogg
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining the correct percentiles of the...
Patent number
3,944,797
Issue date
Mar 16, 1976
Coulter Electronics, Inc.
Wallace H. Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automatically sampling pulses a predetermi...
Patent number
3,936,740
Issue date
Feb 3, 1976
Coulter Electronics, Inc.
Walter R. Hogg
H03 - BASIC ELECTRONIC CIRCUITRY