Wataru Karasawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus productivity improving system and its method
- Patent number 7,454,317
- Issue date Nov 18, 2008
- Tokyo Electron Limited
- Wataru Karasawa
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus productivity improving system and its method
- Patent number 7,133,807
- Issue date Nov 7, 2006
- Tokyo Electron Limited
- Wataru Karasawa
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device inspection system
- Patent number 6,969,620
- Issue date Nov 29, 2005
- Tokyo Electron Limited
- Wataru Karasawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor manufacturing system and control method thereof
- Patent number 6,839,603
- Issue date Jan 4, 2005
- Tokyo Electron Limited
- Wataru Karasawa
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Probing test method of contacting a plurality of probes of a probe...
- Patent number 5,436,571
- Issue date Jul 25, 1995
- Tokyo Electron Limited
- Wataru Karasawa
- G01 - MEASURING TESTING
Information Patent Grant
Electrical characteristics measurement method and measurement appar...
- Patent number 5,374,888
- Issue date Dec 20, 1994
- Tokyo Electron Kabushiki Kaisha
- Wataru Karasawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus for probing an object held above the probe card
- Patent number 5,321,453
- Issue date Jun 14, 1994
- Tokyo Electron Limited
- Shigeoki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting electric characteristics of wafers and apparat...
- Patent number 5,124,931
- Issue date Jun 23, 1992
- Tokyo Electron Limited
- Masaaki Iwamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 5,086,270
- Issue date Feb 4, 1992
- Tokyo Electron Limited
- Wataru Karasawa
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe plate holder
- Patent number D320361
- Issue date Oct 1, 1991
- Tokyo Electron Limited
- Wataru Karasawa
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Method and apparatus of performing probing test for electrically an...
- Patent number 4,985,676
- Issue date Jan 15, 1991
- Tokyo Electron Limited
- Wataru Karasawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of testing a semiconductor wafer
- Patent number 4,965,515
- Issue date Oct 23, 1990
- Tokyo Electron Limited
- Wataru Karasawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 4,812,901
- Issue date Mar 14, 1989
- Tokyo Electron Limited
- Wataru Karasawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Relay Station And Substrate Processing System Using Relay Station
- Publication number 20080124192
- Publication date May 29, 2008
- Wataru Karasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus productivity improving system and its method
- Publication number 20070179751
- Publication date Aug 2, 2007
- TOKYO ELECTRON LIMITED
- Wataru Karasawa
- G05 - CONTROLLING REGULATING
Information Patent Application
Processing method and device
- Publication number 20070004051
- Publication date Jan 4, 2007
- Yasuhiro Okumoto
- G05 - CONTROLLING REGULATING
Information Patent Application
Sharging method and charging system
- Publication number 20060010087
- Publication date Jan 12, 2006
- Wataru Karasawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System for enhanging apparatus productivity and method thereof
- Publication number 20040073405
- Publication date Apr 15, 2004
- Wataru Karasawa
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor device inspection system
- Publication number 20030155280
- Publication date Aug 21, 2003
- Wataru Karasawa
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor manufacturing system and control method thereof
- Publication number 20030153995
- Publication date Aug 14, 2003
- Wataru Karasawa
- G05 - CONTROLLING REGULATING

Wataru Karasawa

Person

Patents Grantslast 30 patents

Apparatus productivity improving system and its method

Apparatus productivity improving system and its method

Semiconductor device inspection system

Semiconductor manufacturing system and control method thereof

Probing test method of contacting a plurality of probes of a probe...

Electrical characteristics measurement method and measurement appar...

Probe apparatus for probing an object held above the probe card

Method of inspecting electric characteristics of wafers and apparat...

Probe apparatus

Wafer probe plate holder

Method and apparatus of performing probing test for electrically an...

Apparatus and method of testing a semiconductor wafer

Probe apparatus

Patents Applicationslast 30 patents

Relay Station And Substrate Processing System Using Relay Station

Apparatus productivity improving system and its method

Processing method and device

Sharging method and charging system

System for enhanging apparatus productivity and method thereof

Semiconductor device inspection system

Semiconductor manufacturing system and control method thereof