Wataru MORI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 11,152,186
- Issue date Oct 19, 2021
- HITACHI HIGH-TECH CORPORATION
- Wataru Yamane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,991,542
- Issue date Apr 27, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryota Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device having inspection scan direction based...
- Patent number 10,984,981
- Issue date Apr 20, 2021
- HITACHI HIGH-TECH CORPORATION
- Hideki Itai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,818,470
- Issue date Oct 27, 2020
- HITACHI HIGH-TECH CORPORATION
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and charged particle beam device noise...
- Patent number 10,796,880
- Issue date Oct 6, 2020
- HITACHI HICH-TECH CORPORATION
- Takuma Nishimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring device and measuring method
- Patent number 10,707,047
- Issue date Jul 7, 2020
- HITACHI HIGH-TECH CORPORATION
- Noritsugu Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle-beam device
- Patent number 9,960,006
- Issue date May 1, 2018
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,305,745
- Issue date Apr 5, 2016
- Hitachi High-Technologies Corporation
- Wataru Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope having a monochromator
- Patent number 8,067,733
- Issue date Nov 29, 2011
- Hitachi High-Technologies Corporation
- Wataru Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope having a monochromator
- Patent number 7,612,336
- Issue date Nov 3, 2009
- Hitachi High-Technologies Corporation
- Wataru Mori
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM SCANNING MODULE, CHARGED PARTICLE BEAM DEVICE...
- Publication number 20230036590
- Publication date Feb 2, 2023
- Hitachi High-Tech Corporation
- Wen LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20200043695
- Publication date Feb 6, 2020
- Hitachi High-Technologies Corporation
- Kazuki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20190362931
- Publication date Nov 28, 2019
- Hitachi High-Technologies Corporation
- Ryota WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE NOISE...
- Publication number 20190341225
- Publication date Nov 7, 2019
- Hitachi High-Technologies Corporation
- Takuma NISHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20190311875
- Publication date Oct 10, 2019
- Hitachi High-Technologies Corporation
- Wataru YAMANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING DEVICE AND MEASURING METHOD
- Publication number 20190206654
- Publication date Jul 4, 2019
- Hitachi High-Technologies Corporation
- Noritsugu TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device Having Inspection Scan Direction Based...
- Publication number 20180374674
- Publication date Dec 27, 2018
- Hitachi High-Technologies Corporation
- Hideki ITAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20170323763
- Publication date Nov 9, 2017
- Hideki ITAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE-BEAM DEVICE
- Publication number 20170092459
- Publication date Mar 30, 2017
- Hitachi High-Technologies Corporation
- Noritsugu TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20150034824
- Publication date Feb 5, 2015
- Hitachi High-Technologies Corporation
- Wataru Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE HAVING A MONOCHROMATOR
- Publication number 20100044565
- Publication date Feb 25, 2010
- Hitachi High-Technologies Corporation
- Wataru MORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope having a monochromator
- Publication number 20070181805
- Publication date Aug 9, 2007
- Wataru Mori
- H01 - BASIC ELECTRIC ELEMENTS

Wataru MORI

Person

Patents Grantslast 30 patents

Charged particle beam device

Charged particle beam device

Charged particle beam device having inspection scan direction based...

Charged particle beam device

Charged particle beam device and charged particle beam device noise...

Measuring device and measuring method

Charged-particle-beam device

Scanning electron microscope

Scanning electron microscope having a monochromator

Scanning electron microscope having a monochromator

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM SCANNING MODULE, CHARGED PARTICLE BEAM DEVICE...

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device

CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE NOISE...

Charged Particle Beam Device

MEASURING DEVICE AND MEASURING METHOD

Charged Particle Beam Device Having Inspection Scan Direction Based...

Charged Particle Beam Device

CHARGED-PARTICLE-BEAM DEVICE

SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE HAVING A MONOCHROMATOR

Scanning electron microscope having a monochromator