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Wayne A. Bather
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Plano, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Damage implantation of a cap layer
Patent number
8,859,377
Issue date
Oct 14, 2014
Texas Instruments Incorporated
Mahalingam Nandakumar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Highly selective liners for semiconductor fabrication
Patent number
7,838,370
Issue date
Nov 23, 2010
Texas Instruments Incorporated
Narendra Singh Mehta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Implant damage of layer for easy removal and reduced silicon recess
Patent number
7,772,094
Issue date
Aug 10, 2010
Texas Instuments Incorporated
Mahalingam Nandakumar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Strain modulation employing process techniques for CMOS technologies
Patent number
7,384,861
Issue date
Jun 10, 2008
Texas Instruments Incorporated
Narendra Singh Mehta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Source drain and extension dopant concentration
Patent number
6,812,073
Issue date
Nov 2, 2004
Texas Instrument Incorporated
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Shallow trench isolation planarization using self aligned isotropic...
Patent number
6,686,283
Issue date
Feb 3, 2004
Texas Instruments Incorporated
Shawn T. Walsh
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
DAMAGE IMPLANTATION OF CAP LAYER
Publication number
20220102553
Publication date
Mar 31, 2022
TEXAS INSTRUMENTS INCORPORATED
Mahalingam Nandakumar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Damage Implantation of a Cap Layer
Publication number
20170365715
Publication date
Dec 21, 2017
TEXAS INSTRUMENTS INCORPORATED
Mahalingam Nandakumar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Device Having a Strain Inducing Sidewall Spacer and a...
Publication number
20100270622
Publication date
Oct 28, 2010
TEXAS INSTRUMENTS INCORPORATED
Mahalingam NANDAKUMAR
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Damage Implantation of a Cap Layer
Publication number
20100252887
Publication date
Oct 7, 2010
TEXAS INSTRUMENTS INCORPORATED
Mahalingam Nandakumar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMPLANT DAMAGE OF LAYER FOR EASY REMOVAL AND REDUCED SILICON RECESS
Publication number
20090170277
Publication date
Jul 2, 2009
TEXAS INSTRUMENTS INCORPORATED
Mahalingam Nandakumar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Damage Implantation of a Cap Layer
Publication number
20090004805
Publication date
Jan 1, 2009
TEXAS INSTRUMENTS INCORPORATED
Mahalingam Nandakumar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGHLY SELECTIVE LINERS FOR SEMICONDUCTOR FABRICATION
Publication number
20080217703
Publication date
Sep 11, 2008
Narendra Singh Mehta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING A STRAIN INDUCING SIDEWALL SPACER AND A...
Publication number
20070196991
Publication date
Aug 23, 2007
TEXAS INSTRUMENTS INCORPORATED
Mahalingam Nandakumar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Strain modulation employing process techniques for CMOS technologies
Publication number
20070015347
Publication date
Jan 18, 2007
TEXAS INSTRUMENTS INCORPORATED
Narendra Singh Mehta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having a high carbon content strain inducing f...
Publication number
20060172556
Publication date
Aug 3, 2006
TEXAS INSTRUMENTS INCORPORATED
Wayne A. Bather
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Source drain and extension dopant concentration
Publication number
20050189660
Publication date
Sep 1, 2005
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOURCE DRAIN AND EXTENSION DOPANT CONCENTRATION
Publication number
20040110352
Publication date
Jun 10, 2004
TEXAS INSTRUMENTS INCORPORATED
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process for reducing dopant loss for semiconductor devices
Publication number
20030129804
Publication date
Jul 10, 2003
Manoj Mehrotra
H01 - BASIC ELECTRIC ELEMENTS