Wayne D. Ryan

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Pembroke, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Inspection method using penetrant and dielectrometer
- Patent number 6,781,387
- Issue date Aug 24, 2004
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Segmented field dielectrometer
- Patent number 6,486,673
- Issue date Nov 26, 2002
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Magnetometer with waveform shaping
- Patent number 6,144,206
- Issue date Nov 7, 2000
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Segmented field dielectrometer
- Publication number 20030080744
- Publication date May 1, 2003
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING