Wei Jin

Person

Saratoga, CA, US

People

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUSES FOR IMPLEMENTING VARIED OPTICAL GRATING GEO...
- Publication number 20240231100
- Publication date Jul 11, 2024
- Google LLC
- Wei Jin
- G02 - OPTICS
Information Patent Application
FABRICATION OF NANOIMPRINT WORKING STAMPS WITH COMBINED PATTERNS FR...
- Publication number 20240231221
- Publication date Jul 11, 2024
- Google LLC
- Lu Tian
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TWO-DIMENSIONAL (2D) PATTERNS USING MULTIPLE EXPOSURES OF ONE-DIMEN...
- Publication number 20240192606
- Publication date Jun 13, 2024
- Google LLC
- Lu Tian
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FABRICATION OF SLANTED GRATING MASTER AND WORKING STAMP USING GRAYS...
- Publication number 20240168207
- Publication date May 23, 2024
- Google LLC
- Lu Tian
- G02 - OPTICS
Information Patent Application
METHODS AND APPARATUSES FOR IMPLEMENTING VARIED OPTICAL GRATING GEO...
- Publication number 20240134198
- Publication date Apr 25, 2024
- Google LLC
- Wei Jin
- G02 - OPTICS
Information Patent Application
FABRICATION OF NANOIMPRINT WORKING STAMPS WITH COMBINED PATTERNS FR...
- Publication number 20240134271
- Publication date Apr 25, 2024
- Google LLC
- Lu Tian
- G02 - OPTICS
Information Patent Application
RESIDUAL LAYER THICKNESS MODULATION IN NANOIMPRINT LITHOGRAPHY
- Publication number 20240085782
- Publication date Mar 14, 2024
- Google LLC
- Wei Jin
- G02 - OPTICS

Person

Patents Applicationslast 30 patents

METHODS AND APPARATUSES FOR IMPLEMENTING VARIED OPTICAL GRATING GEO...

FABRICATION OF NANOIMPRINT WORKING STAMPS WITH COMBINED PATTERNS FR...

TWO-DIMENSIONAL (2D) PATTERNS USING MULTIPLE EXPOSURES OF ONE-DIMEN...

FABRICATION OF SLANTED GRATING MASTER AND WORKING STAMP USING GRAYS...

METHODS AND APPARATUSES FOR IMPLEMENTING VARIED OPTICAL GRATING GEO...

FABRICATION OF NANOIMPRINT WORKING STAMPS WITH COMBINED PATTERNS FR...

RESIDUAL LAYER THICKNESS MODULATION IN NANOIMPRINT LITHOGRAPHY