Weiwei Zhang

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Hubei, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for diagnosing open circuit (OC) fault of T-type...
- Patent number 12,092,682
- Issue date Sep 17, 2024
- Wuhan University
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for online correction of junction temperatures of...
- Patent number 11,579,644
- Issue date Feb 14, 2023
- WUHAN UNIVERSITY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR DIAGNOSING OPEN CIRCUIT (OC) FAULT OF T-TYPE...
- Publication number 20230152364
- Publication date May 18, 2023
- Wuhan University
- Yigang HE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ONLINE CORRECTION OF JUNCTION TEMPERATURES OF...
- Publication number 20220236756
- Publication date Jul 28, 2022
- WUHAN UNIVERSITY
- Yigang HE
- G05 - CONTROLLING REGULATING