METHOD AND SYSTEM FOR DIAGNOSING OPEN CIRCUIT (OC) FAULT OF T-TYPE THREE-LEVEL (T23L) INVERTER UNDER MULTIPLE POWER FACTORS

Abstract

A method and a system for diagnosing an open circuit (OC) fault of an insulated gate bipolar transistor (IGBT) of a T-type three-level (T23L) inverter under multiple power factors based on instantaneous current distortion are provided. Similar characteristics of current distortion may be caused by an OC fault of a T23L inverter, making it is difficult to locate the fault. The method for diagnosing an OC fault of a grid-connected T23L inverter, can diagnose the OC fault hierarchically; four switch transistors in a phase can be divided into two groups according to the similarity analysis of current distortion under different power factors; group-based fault diagnosis is realized by half cycles in which a zero domain occurs; and then, a specific switching signal is injected to realize equipment-based OC fault diagnosis. The OC fault diagnosis of a T23L inverter is realized without additional hardware circuits.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims priority to Chinese Patent Application No. 2021111346483.7 with a filing date of Nov. 15, 2021. The content of the aforementioned application, including any intervening amendments thereto, is incorporated herein by reference.

TECHNICAL FIELD

The present disclosure relates to the technical field of fault diagnosis of power electronic equipment, and more specifically, to a method and a system for diagnosing an open circuit (OC) fault of an insulated gate bipolar transistor (IGBT) of a T-type three-level (T²3L) inverter under multiple power factors based on instantaneous current distortion.

BACKGROUND

A multi-level inverter has been widely used in photovoltaic grid connection, uninterruptible power supply, electric vehicles, and other occasions with high requirements for efficiency and quality of electric energy. In addition, a multi-level topology increases the risk of equipment fault. Considering structural complexity, quality of output electric energy, and economical efficiency, a neutral-point-clamped (NPC) three-level inverter and a T²3L inverter have become two popular topologies due to their low dv/dt and low harmonic distortion. Compared with an NPC three-level topology, a T²3L topology reduces two diodes in each electric bridge. In addition, rated voltages of two inner transistors (S_X3 and S_X4) are less than those of two outer transistors (Sxi and S_x2), thereby reducing switching loss. What’s more, the T²3L topology has a competitive advantage over the NPC three-level topology in fault tolerant control.

Power switches (such as an IGBT and a SiC) are key and vulnerable devices of the inverter. Switch faults include a short circuit (SC) fault and an OC fault. The SC fault can be converted into the OC fault by using a built-in hardware detection and protection means (such as a desaturation detection circuit). However, the OC fault is often ignored by a hardware protection device, and may deviate the system from a normal operation state without immediately stopping the system. A distorted current, a distorted voltage or abnormal voltage stress of a remaining semiconductor device are common problems caused by the OC fault. Therefore, there is an urgent demand for detecting and locating the OC fault.

At present, OC fault diagnosis of the T²3L inverter still needs to be improved, and existing OC fault diagnosis cannot be applied to a working condition with multiple power factors.

SUMMARY

In order to overcome the above defects or meet the above improvement requirements in the prior art, the present disclosure provides a method and a system for diagnosing an OC fault of an IGBT of a T²3L inverter under multiple power factors based on instantaneous current distortion, to diagnose OC faults under different power factors, and achieve simple calculation and logical judgment.

To achieve the above objective, according to an aspect of the present disclosure, a method for diagnosing an OC fault of an IGBT of a T²3L inverter under multiple power factors based on instantaneous current distortion is provided, including:

• collecting target parameters of a T²3L inverter in real time, where the target parameters include an output current ix, a grid-connected current command i_{d_ref} of axis d, a grid-connected current command i_{q_ref} of axis q, a grid voltage e_x, and a switching cycle T_s, and X represents a fault phase;
• calculating a theoretical zero crossing point based on the target parameters to obtain positive and negative half-cycle regions, determining positive and negative half cycles in which a zero domain occurs, performing group-based OC fault diagnosis, and outputting a group-based fault diagnosis signal;
• injecting a specific switching signal to a space vector pulse width modulation (SVPWM) or sinusoidal pulse width modulation (SPWM) module based on the group-based fault diagnosis signal; and
• determining, based on a current value ix under the specific switching signal, whether a current is in the zero domain, performing equipment-based OC fault diagnosis, and outputting an equipment-based fault diagnosis signal.

In some optional implementation solutions, when a power factor pf is greater than or equal to 0, theoretical zero crossing points t_p2z and t_n2z are obtained according to:

$\left\{\begin{array}{c}{t}_{n2z}=T_s-t_{pf}\\ r_{p2z}=\raisebox{1ex}{$T_s$}\!\left/ \!\raisebox{-1ex}{$2$}\right.-t_{pf}\end{array}\right);$

and when the power factor pf is less than 0, the theoretical zero crossing points t_p2Z and t_n2Z are obtained according to

$\left\{\begin{array}{c}{t}_{n2z}=t_{pf}\\ t_{p2z}=\raisebox{1ex}{$T_s$}\!\left/ \!\raisebox{-1ex}{$2$}\right.+t_{pf}\end{array}\right),$

wherein t_P2Z represents time when the current changes from a positive current to a zero current, t_n2z represents time when the current changes from a negative current to the zero current, T_s represents the switching cycle, and t_pf represents leading or lagging time under different power factors.

In some optional implementation solutions, the leading or lagging time t_pf under different power factors is obtained according to

$t_{pf}=\frac{\theta }{2\pi \text{}{f}_s},$

wherein θ represents a power factor angle, and f_s represents a switching frequency.

In some optional implementation solutions, the power factor angle θ is obtained according to:

$\cos \left(\theta \right)=\frac{i_{d\_ref}}{\sqrt{i_{d\_ref}^2+i_{q\_ref}^2}},$

wherein i_{d_ref} and i_{q_ref} represent the grid-connected current commands of axis d and axis q respectively.

In some optional implementation solutions, rules for group-based OC fault diagnosis are as follows:

Group-based fault	Range in which the zero domain occurs	zsn2z + zsp2z	pf
FX1/4	(tn2z+ Dth, Ts- Dth) U (Dth, tp2z- Dth)	1	pf≥ 0
(tn2z+ Dth, tp2z- Dth)	1	pf< 0
FX2/3	(tp2z+ Dth, tn2z- Dth)	1	pf≥ 0
(tp2z+ Dth, Ts- Dth) U (Dth, tn2z- Dth)	1	pf< 0

As described above, F_X1/4and F_X2/3 represent group-based fault diagnosis signals, t_n2z and t_p2z represent the theoretical zero crossing points, D_th represents a first preset time threshold, zs_n2z represents a zero-domain mark from the negative current to the zero current, zs_p2z represents a zero-domain mark from the positive current to the zero current, pfrepresents the power factor, pf>0 indicates that the current leads a voltage, and pf<0 indicates the current lags behind the voltage.

In some optional implementation solutions, in the step of injecting a specific switching signal to an SVPWM or SPWM module based on the group-based fault diagnosis signal:

when F_X1/4 is 1, specific switching signals [S_A1, S_A3, S_A2, S_A4] are [1,0,0,0]; and when F_X2/3 is 1, the specific switching signals [S_A1, S_A3, S_A2, S_A4] are [0,0,1,0].

In some optional implementation solutions, rules for equipment-based OC fault diagnosis are as follows:

Equipment-based fault	Group-based fault	[SX1, SX3, SX2, SX4]	lixl	N
FX1	FX1/4	[1, 0, 0, 0]	≤ Ith2	≥ Nth
FX4	>Ith2	<Nth
FX2	FX2/3	[0, 0, 1, 0]	< Ith2	≥ Nth
FX3	>Ith2	<Nth

As described above, I_th2 represents a preset current threshold, N represents duration in which the current is in the zero domain, N_th represents a second preset time threshold, and F_XY(Y = 1, 2, 3, 4) represents the equipment-based fault diagnosis signal.

According to another aspect of the present disclosure, a system for diagnosing an OC fault of an IGBT of a T²3L inverter under multiple power factors based on instantaneous current distortion is provided, including:

• a parameter obtaining module configured to collect target parameters of a T²3L inverter in real time, where the target parameters include an output current ix, a grid-connected current command i_{d_ref} of axis d, a grid-connected current command i_{q_ref} of axis q, a grid voltage ex, and a switching cycle T_s, and X represents a fault phase;
• a group-based fault diagnosis module configured to calculate a theoretical zero crossing point based on the target parameters to obtain positive and negative half-cycle regions, determine positive and negative half cycles in which a zero domain occurs, perform group-based OC fault diagnosis, and output a group-based fault diagnosis signal;
• a specific-switching signal injection module configured to inject a specific switching signal to an SVPWM or SPWM module based on the group-based fault diagnosis signal; and
• an equipment-based fault diagnosis module configured to determine, based on a current value ix under the specific switching signal, whether a current is in the zero domain, perform equipment-based OC fault diagnosis, and output an equipment-based fault diagnosis signal.

According to still another aspect of the present application, a computer-readable storage medium is provided. The computer-readable storage medium stores a computer program, and the computer program is executed by a processor to implement the steps of the method according to any one of the above-mentioned aspects.

Compared with the prior art, the above technical solutions conceived by the present disclosure can achieve the following beneficial effects:

• (1) The present disclosure implements a method for diagnosing an OC fault of an IGBT under multiple power factors based on instantaneous current distortion, to diagnose OC faults under different power factors.
• (2) The present disclosure uses the instantaneous current distortion as a diagnostic variable, which can realize fast fault diagnosis with average diagnosis time of about 6 ms.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic flowchart of a method for diagnosing an OC fault of an IGBT under multiple power factors based on instantaneous current distortion according to an embodiment of the present disclosure;

FIG. 2 is a schematic diagram showing a result of an OC fault diagnosis experiment under a unit power factor according to an embodiment of the present disclosure;

FIG. 3 is a schematic diagram showing a result of an OC fault diagnosis experiment under a leading power factor according to an embodiment of the present disclosure; and

FIG. 4 is a schematic diagram showing a result of an OC fault diagnosis experiment under a lagging power factor according to an embodiment of the present disclosure.

DETAILED DESCRIPTION OF THE EMBODIMENTS

To make the objectives, technical solutions, and advantages of the present disclosure clearer, the present disclosure is further described below in detail with reference to the drawings and embodiments. Understandably, the specific embodiments described herein are merely intended to explain the present disclosure but not to limit the present disclosure. Further, the technical features involved in the various implementations of the present disclosure described below may be combined with each other as long as they do not constitute a conflict with each other.

In the embodiments of the present disclosure, the terms such as “first” and “second” are intended to distinguish between different objects, rather than describe a specific order or sequence.

Embodiment 1

The present disclosure summarizes characteristics of current distortion in the case of an OC fault, and realizes OC fault diagnosis based on the characteristics of the current distortion. As shown in FIG. 1, a method for diagnosing an OC fault of an IGBT under multiple power factors based on instantaneous current distortion according to the present disclosure includes the following steps:

• S1: Collect an output current i_X(X = A, B, C), grid-connected current commands i_{d_ref} andi_{q_ref,} and a grid voltagee_x of a T²3L inverter in real time, obtain a system parameter, namely, a switching cycle T_s, calculate a theoretical zero crossing point to obtain positive and negative half-cycle regions, determine positive and negative half cycles in which a zero domain occurs, perform group-based OC fault diagnosis, and output a group-based fault diagnosis signal F_X1/4 or F_X2/3.
• S2: Inject a specific switching signal to an SVPWM or SPWM module based on the group-based fault diagnosis signal.
• S3: Determine, based on a current value _iX under the specific switching signal, whether a current is in the zero domain, perform equipment-based OC fault diagnosis, and output an equipment-based fault diagnosis signal F_XY(Y= 1, 2, 3, 4).

When a power factor pf is greater than or equal to 0, theoretical zero crossing points t_p2Z and t_n2z are obtained according to:

$\left\{\begin{array}{c}{t}_{n2z}=T_s-t_{pf}\\ t_{p2z}=\raisebox{1ex}{$T_s$}\!\left/ \!\raisebox{-1ex}{$2$}\right.-t_{pf}\end{array}\right);$

and when the power factor pf is less than 0, the theoretical zero crossing points t_p2,, and t_n2z are obtained according to:

$\left\{\begin{array}{c}{t}_{n2z}=t_{pf}\\ t_{p2z}=\raisebox{1ex}{$T_s$}\!\left/ \!\raisebox{-1ex}{$2$}\right.+t_{pf}\end{array}\right),$

wherein t_p2z represents time when the current changes from a positive current to a zero current, t_n2z represents time when the current changes from a negative current to the zero current, T_s represents the switching cycle, and t_pf represents leading or lagging time under different power factors.

Specifically, t_pf is obtained according to:

$t_{pf}=\frac{\theta }{2\pi \text{}{f}_s},$

wherein θ represents a power factor angle, and f_s represents a switching frequency.

The power factor angle θ is calculated according to:

$\cos \left(\theta \right)=\frac{i_{d\_ref}}{\sqrt{i_{d\_ref}^2+i_{q\_ref}^2}},$

wherein i_{d_ref} and i_{q_ref} represent the grid-connected current commands of axis d and axis q respectively.

In step S1, rules for group-based OC fault diagnosis are as follows:

Rules for group-based OC fault diagnosis
Group-based fault	Range in which the zero domain occurs	zsn2z + zsp2z	pf
FX1/4	(tn2z+ Dth, Ts- Dth) ∪ (Dth, tp2z- Dth)	1	pf≥ 0
(tn2z+ Dth, tp2z- Dth)	1	pf< 0
FX2/3	(tp2z+ Dth, tn2z- Dth)	1	pf≥ 0
(tp2z+ Dth, Ts- Dth) ∪ (Dth, tn2z- Dth)	1	pf< 0

As described above, F_X1/4 and F_X2/3 represent group-based fault diagnosis signals, where the value 1 indicates that a faulty transistor is located in the group, and the value 0 indicates that the faulty transistor is not located in the group; t_n2z and t_p2z represent the theoretical zero crossing points; D_th represents a first preset time threshold; zs_n2z represents a zero-domain mark from the negative current to the zero current, where a value 1 indicates that the current is from a negative value to zero; zs_p2z represents a zero-domain mark from the positive current to the zero current, where the value 1 indicates that the current is changed from the positive current to the zero current; pfrepresents the power factor; pf>0 indicates that the current leads a voltage; pf<0 indicates the current lags behind the voltage; and the zero domain indicates that the current is 0, namely, ix = 0.

In step S2, the specific switching signal is injected based on the group-based fault diagnosis signal. When F_X1/4 is 1, specific switching signals [S_A1, S_A3, S_A2, S_A4] are [1,0,0,0]; and when F_X2/3 is 1, the specific switching signals [S_A1, S_A3, S_A2, S_A4] are [0,0,1,0].

In step S3, rules for equipment-based OC fault diagnosis are as follows:

Rules for equipment-based OC fault diagnosis
Equipment-based fault	Group-based fault	[SX1, SX3, SX2, Sx4]	|ix|	N
FX1	FX1/4	[1, 0, 0, 0]	≤ Ith2	≥ Nth
FX4	>Ith2	<Nth
FX2	FX2/3	[0, 0, 1, 0]	≤ Ith2	≥ Nth
FX3	>Ith2	<Nth

As described above, I_th2 represents a current threshold, N represents duration in which the current is in the zero domain, and N_th represents a second preset time threshold. When F_X1 is 1, it indicates that switch transistor X1 is faulty. Similarly, when F_X2 is 1, it indicates that switch transistor X2 is faulty; when F_X3 is 1, it indicates that switch transistor X3 is faulty; when Fx4 is 1, it indicates that switch transistor X4 is faulty, where X = A, B, C.

The method summarizes characteristics of an OC fault of an IGBT under different power factors. Characteristics of OC fault diagnosis of S_X1 under different power factors are as follows:

• a) Under a leading power factor: t₁ = t₂ = t_n2z, t4 = t_p2z, zs_p2z = 1.
• b) Under a unit power factor: t₁ = t_n2z, t₄ = t_p2z, zs_n2z = 1.
• c) Under a lagging power factor: t₁= t_n2z, t₃ = t₄ = t_p2z, zs_n2z = 1.

As described above, t₁ represents actual time from the negative current to the zero current, t₂ represents actual time from the zero current to the positive current, t₃ represents actual time from the positive current to the zero current, and t₄ represents actual time from the zero current to the negative current.

Characteristics of OC fault diagnosis of S_X4 under different power factors are as follows:

$t_1=t_{n2z},t_4=t_{p2z},Z{S}_{n2z}=1,Z{S}_{p2z}=1$

Characteristics of OC fault diagnosis of S_X2 under different power factors are as follows:

• a) Under the leading power factor: t₂ = t_n2z, t₃ = t₄ = t_p2z, zs_n2z = 1.
• b) Under the unit power factor: t₂ = t_n2z, t₃ = t_p2z, zs_p2z = 1.
• c) Under the lagging power factor: t₁ = t₂ = t_n2z, t₃ = t_p2z, zs_p2z = 1.

Characteristics of OC fault diagnosis of S_X3 under different power factors are as follows:

$t_2=t_{n2z},t_3=t_{p2z},z{s}_{n2z}=1,z{s}_{p2z}=1$

This embodiment provides a simple method for diagnosing an OC fault of a grid-connected T²3L inverter based on instantaneous current distortion. Firstly, characteristics of an OC fault of an output current under various power factors are analyzed and summarized in detail to provide a theoretical basis for the proposed diagnosis method. Secondly, a hierarchical diagnosis scheme is proposed to identify group-based and equipment-based faults. Finally, effectiveness and superiority of this method are verified by a large number of experiments. Compared with existing fault diagnosis methods, this method is applicable to various power factors of a photovoltaic grid-connected system and other systems. No additional sensor or sampling circuit is required. A sampling frequency is equal to the switching frequency. Time of group-based and equipment-based OC fault diagnosis is about half of a basic cycle. The diagnosis method is applicable to different power factors (including the unit power factor, the leading power factor, and the lagging power factor). Simple calculation and logical judgment are achieved.

Embodiment 2

To describe this embodiment more clearly, FIG. 2, FIG. 3 and FIG. 4 show experimental results under this embodiment. Main parameters used in the experimental results are shown in Table 3.

Main parameters used in the experimental results
Parameter	Symbol	Value
Grid-side voltage	eX	50 Vrms
Grid-side frequency	fac	50 Hz
Direct current (DC)-side voltage	Udc	200 V
Switching/sampling frequency	fs	10 kHz
Dead time	TD	0.1 µs
Filter inductance	Lf	4 mH
DC-side capacitance	Chigh/low	480 µF
Load power	P	500 W

FIG. 2 shows a result of OC fault diagnosis of S_A4 under a unit power factor. After an OC fault occurs on S_A4, the number of times that zc_n2z + zc_p2z reaches a high level increases. A zero current lasts for a certain time and then becomes a zero domain, and zs_n2z + zs_p2z reaches the high level. It is known, by determining positive and negative half cycles in which the zero domain occurs, that S_A1 or S_A4 may be faulty, namely, F_A1/4 is 1. A switching signal injection module sets switching signals [S_A1, S_A3, S_A2, S_A4] to [1,0,0,0]. If i_A is not zero, it indicates that S_A4 is faulty.

FIG. 3 shows a result of OC fault diagnosis of S_A1 under a leading power factor. FIG. 4 shows a result of OC fault diagnosis of S_A2 under a lagging power factor. When an OC fault occurs on an outer transistor (S_Xi or S_A2), a current of a fault phase is always zero after a specific signal is injected.

This embodiment is described for a specific OC fault, and an analysis result of another OC fault is the same as that in this embodiment.

Embodiment 3

This embodiment provides a system for diagnosing an OC fault of an IGBT under multiple power factors based on instantaneous current distortion, including:

• a parameter obtaining module configured to collect an output current i_X(X = A, B, C), grid-connected current commands i_{d_ref} and i_{q_ref,} and a grid voltage e_x of a T²3L inverter in real time, obtain a system parameter, namely, a switching cycle T_s, and calculate a theoretical zero crossing point to obtain positive and negative half-cycle regions;
• a group-based fault diagnosis module configured to calculate the theoretical zero crossing point to obtain the positive and negative half-cycle regions, determine positive and negative half cycles in which a zero domain occurs, perform group-based OC fault diagnosis, output a group-based fault diagnosis signal F_X1/4or F_X2/3;
• a specific-switching signal injection module configured to inject a specific switching signal based on a group-based fault diagnosis result, where when F_X1/4 is 1, specific switching signals [S_A1, S_A3, S_A2, S_A4] are [1,0,0,0]; and when F_X2/3 is 1, the specific switching signals [S_A1, S_A3, S_A2, S_A4] are [0,0,1,0]; and
• an equipment-based fault diagnosis module configured to start to detect a state of a current of a fault phase when the specific signal is injected, where if the specific switching signals [S_A1, S_A3, S_A2, S_A4] are [1,0,0,0] and the current is always zero, S_A1 is faulty; or if the current is non-zero within specific time, S_A4 is faulty.

It should be pointed out that, based on needs of implementation, each step/component described in the present disclosure can be divided into more steps/components, or two or more steps/components or some operations of the steps/components can be combined into a new step/component to achieve the objective of the present disclosure.

It is easy for those skilled in the art to understand that the above-mentioned contents are merely the preferred embodiments of the present disclosure, and are not intended to limit the present disclosure. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present disclosure should fall within the protection scope of the present disclosure.

Claims

1. A method for diagnosing an open circuit (OC) fault of an insulated gate bipolar transistor (IGBT) of a T-type three-level (T23L) inverter under multiple power factors based on instantaneous current distortion, comprising: collecting target parameters of a T23L inverter in real time, wherein the target parameters comprise an output current ix, a grid-connected current command id_ref of axis d, a grid-connected current command iq_ref of axis q, a grid voltage ex, and a switching cycle Ts, X represents a fault phase, X=A, B, C;calculating a theoretical zero crossing point based on the target parameters to obtain positive and negative half-cycle regions, determining positive and negative half cycles in which a zero domain occurs, performing group-based OC fault diagnosis, and outputting a group-based fault diagnosis signal;injecting a specific switching signal to a space vector pulse width modulation (SVPWM) or sinusoidal pulse width modulation (SPWM) module based on the group-based fault diagnosis signal; anddetermining, based on a current value ix under the specific switching signal, whether a current is in the zero domain, performing equipment-based OC fault diagnosis, and outputting an equipment-based fault diagnosis signal, whereinwhen a power factor pf is greater than or equal to 0, theoretical zero crossing points tp2z and tn2z are obtained according to:tn2z=Ts − tpftp2z=Ts/2 − tpf; and when the power factor pf is less than 0, the theoretical zero crossing points tp2z and tn2z are obtained according to:   tn2z=tpftp2z=Ts2+ tpf, wherein tp2z, represents time when the current changes from a positive current to a zero current, tn2z represents time when the current changes from a negative current to the zero current, Ts represents the switching cycle, and tpf represents leading or lagging time under different power factors;rules for group-based OC fault diagnosis are as follows:Group-based faultRange in which the zero domain occursZSn2z + ZSp2zpfFX1/4(tn2z+ Dth, Ts- Dth) ∪ (Dth, tp2z- Dth)1pf ≥ 0(tn2Z+ Dth, tp2z- Dth)1pf< 0FX2/3(tp2z+ Dth, tn2z- Dth)1pf ≥ 0(tp2z+ Dth, Ts- Dth) ∪ (Dth, tn2z- Dth)1pf< 0wherein, FX1/4 and FX2/3 represent group-based fault diagnosis signals, tn2z and tp2z, represent the theoretical zero crossing points,Dth represents a first preset time threshold, ZSn2z represents a zero-domain mark from the negative current to the zero current, ZSp2z represents a zero-domain mark from the positive current to the zero current, pf represents the power factor, pf>0 indicates that the current leads a voltage, and pf<0 indicates the current lags behind the voltage; when FX1/4 is 1, it indicates that switch transistor X1 or switch transistor X4 is faulty, and when FX2/3 is 1, it indicates that switch transistor X2 or switch transistor X3 is faulty; and in the step of injecting a specific switching signal to an SVPWM or SPWM module based on the group-based fault diagnosis signal:when FX1/4 is 1, specific switching signals [SA1, SA3, SA2, SA4] are [1,0,0,0]; and when FX2/3 is 1, the specific switching signals [SA1, SA3, SA2, SA4] are [0,0,1,0]; andrules for equipment-based OC fault diagnosis are as follows:Equipment-based faultGroup-based fault[Sx1, SX3, SX2, SX4]|ix|NFX1FX1/4[1, 0, 0, 0]≤Ith2≥NthFX4>Ith2<NthFX2FX2/3[0, 0, 1, 0]< Ith2≥NthFX3>Ith2<Nthwherein, Ith2 represents a preset current threshold, N represents duration in which the current is in the zero domain, Nth represents a second preset time threshold, and Fxy(Y = 1, 2, 3, 4) represents the equipment-based fault diagnosis signal, when FX1 is 1, it indicates that switch transistor X1 is faulty; when FX2 is 1, it indicates that switch transistor X2 is faulty; when FX3 is 1, it indicates that switch transistor X3 is faulty; and when Fx4 is 1, it indicates that switch transistor X4 is faulty.

2. The method according to claim 1, wherein the leading or lagging time tpf under different power factors is obtained according to:

3. The method according to claim 2, wherein the power factor angle θ is obtained according to:

4. A system for diagnosing an OC fault of an IGBT of a T23L inverter under multiple power factors based on instantaneous current distortion, comprising: a parameter obtaining module configured to collect target parameters of a T23L inverter in real time, wherein the target parameters comprise an output current ix, a grid-connected current command id_ref of axis d, a grid-connected current command iq ref of axis q, a grid voltage ex, and a switching cycle Ts, and X represents a fault phase, wherein X = A, B, C;a group-based fault diagnosis module configured to calculate a theoretical zero crossing point based on the target parameters to obtain positive and negative half-cycle regions, determine positive and negative half cycles in which a zero domain occurs, perform group-based OC fault diagnosis, and output a group-based fault diagnosis signal;a specific-switching signal injection module configured to inject a specific switching signal to an SVPWM or SPWM module based on the group-based fault diagnosis signal; andan equipment-based fault diagnosis module configured to determine, based on a current value ix under the specific switching signal, whether a current is in the zero domain, perform equipment-based OC fault diagnosis, and output an equipment-based fault diagnosis signal, whereinwhen a power factor pf is greater than or equal to 0, theoretical zero crossing points tp2z and tn2z are obtained according to:tn2z=Ts − tpftp2z=Ts2 − tpf; and when the power factor pf is less than 0, the theoretical zero crossing points tp2z and tn2z are obtained according to:   tn2z=tpftp2z=Ts2+ tpf, wherein tp2z, represents time when the current changes from a positive current to a zero current, tn2z represents time when the current changes from a negative current to the zero current, Ts represents the switching cycle, and tpf represents leading or lagging time under different power factors;rules for group-based OC fault diagnosis are as follows:Group-based faultRange in which the zero domain occursZSn2z + ZSp2zpfFX1/4(tn2z+ Dth, Ts- Dth) ∪ (Dth, tp2z- Dth)1pf ≥ 0(tn2Z+ Dth, tp2z- Dth)1pf< 0FX2/3(tp2z+ Dth, tn2z- Dth)1pf ≥ 0(tp2z+ Dth, Ts- Dth) ∪ (Dth, tn2z- Dth)1pf< 0wherein, FX1/4 and FX2/3 represent group-based fault diagnosis signals, tn2z and tp2z, represent the theoretical zero crossing points, Dth represents a first preset time threshold, ZSn2z represents a zero-domain mark from the negative current to the zero current, ZSp2z represents a zero-domain mark from the positive current to the zero current, pfrepresents the power factor, pf>0 indicates that the current leads a voltage, and pf<0 indicates the current lags behind the voltage; when FX1/4 is 1, it indicates that switch transistor X1 or switch transistor X4 is faulty, and when FX2/3 is 1, it indicates that switch transistor X2 or switch transistor X3 is faulty;in the step of injecting a specific switching signal to an SVPWM or SPWM module based on the group-based fault diagnosis signal:when FX1/4 is 1, specific switching signals [SA1, SA3, SA2, SA4] are [1,0,0,0]; and when FX2/3 is 1, the specific switching signals [SA1, SA3, SA2, SA4] are [0,0,1,0]; and rules for equipment-based OC fault diagnosis are as follows:Equipment-based faultGroup-based fault[SX1, SX3, SX2, SX4]|iX|NFX1FX1/4[1, 0, 0, 0]< Ith2≥NthFX4>Ith2<NthFX2FX2/3[0, 0, 1, 0]< Ith2≥NthFX3>Ith2<Nthwherein, Ith2 represents a preset current threshold, N represents duration in which the current is in the zero domain, Nth represents a second preset time threshold, and FXY(Y = 1, 2, 3, 4) represents the equipment-based fault diagnosis signal, when FX1 is 1, it indicates that switch transistor X1 is faulty; when FX2 is 1, it indicates that switch transistor X2 is faulty; when FX3 is 1, it indicates that switch transistor X3 is faulty; and when Fx4 is 1, it indicates that switch transistor X4 is faulty.

5. A computer-readable storage medium, which stores a computer program, wherein the computer program is executed by a processor to implement the steps of the method according to claim 1.