Wen LI

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement system and method of setting parameter of charged parti...
- Patent number 12,198,894
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-robot route planning
- Patent number 12,140,967
- Issue date Nov 12, 2024
- Rapyuta Robotics Co., Ltd
- Wen Zheng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply module and charged particle beam device
- Patent number 12,132,411
- Issue date Oct 29, 2024
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for optimizing route plans in an operating envi...
- Patent number 12,124,261
- Issue date Oct 22, 2024
- Rapyuta Robotics Co., Ltd
- Wen Zheng Li
- G05 - CONTROLLING REGULATING
Information Patent Grant
Charged particle beam device
- Patent number 11,967,482
- Issue date Apr 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and operation method therefor
- Patent number 11,961,701
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Tomoharu Nagashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device, computer, and signal processing metho...
- Patent number 11,898,974
- Issue date Feb 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and charged particle beam device calib...
- Patent number 11,848,171
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement device and signal processing method
- Patent number 11,842,881
- Issue date Dec 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and power supply device
- Patent number 11,810,752
- Issue date Nov 7, 2023
- HITACHI HIGH-TECH CORPORATION
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method of measuring electrical noise
- Patent number 11,735,395
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Takayasu Iwatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,694,871
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power converter and control method of power converter that reduce r...
- Patent number 11,671,007
- Issue date Jun 6, 2023
- Hitachi, Ltd.
- Akio Yamamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Geographic routing mesh network
- Patent number 11,582,136
- Issue date Feb 14, 2023
- Rapyuta Robotics Co., Ltd
- Wen Zheng Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charged particle beam control device
- Patent number 11,211,225
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Generating a 2D-navigation map for collision-free navigation by mul...
- Patent number 11,054,273
- Issue date Jul 6, 2021
- Rapyuta Robotics Co., Ltd
- Wen Zheng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam system
- Patent number 11,017,981
- Issue date May 25, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,973,112
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle beam system
- Patent number 10,872,745
- Issue date Dec 22, 2020
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam control device
- Patent number 10,847,344
- Issue date Nov 24, 2020
- HITACHI HIGH-TECH CORPORATION
- Shinichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,818,470
- Issue date Oct 27, 2020
- HITACHI HIGH-TECH CORPORATION
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and charged particle beam device noise...
- Patent number 10,796,880
- Issue date Oct 6, 2020
- HITACHI HICH-TECH CORPORATION
- Takuma Nishimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement and inspection device
- Patent number 10,692,687
- Issue date Jun 23, 2020
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-sensitivity sensor system, detection circuit, and detection me...
- Patent number 10,634,697
- Issue date Apr 28, 2020
- Hitachi, Ltd.
- Wen Li
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device with transient signal correction durin...
- Patent number 10,559,447
- Issue date Feb 11, 2020
- Hitachi High-Technologies Corporation
- Ryo Kadoi
- G01 - MEASURING TESTING
Information Patent Grant
High voltage power supply device and charged particle beam device
- Patent number 10,546,718
- Issue date Jan 28, 2020
- Hitachi High-Technologies Corporation
- Takuma Nishimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,424,459
- Issue date Sep 24, 2019
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and image forming method using same
- Patent number 10,373,797
- Issue date Aug 6, 2019
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clock control circuit, demodulation device and spread spectrum method
- Patent number 10,063,277
- Issue date Aug 28, 2018
- Renesas Electronics Corporation
- Atsushi Nakamura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit design system and circuit design method
- Patent number 10,061,881
- Issue date Aug 28, 2018
- Hitachi, Ltd.
- Wen Li
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH VOLTAGE AMPLIFIER
- Publication number 20240223134
- Publication date Jul 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Ryohei KUDO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20240014002
- Publication date Jan 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Takayasu IWATSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND PROCESSOR SYSTEM
- Publication number 20230335373
- Publication date Oct 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TASK ASSIGNMENT IN AUTONOMOUS MOBILE DEVICES
- Publication number 20230306334
- Publication date Sep 28, 2023
- Rapyuta Robotics Co., Ltd
- Wen Zheng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-ROBOT ROUTE PLANNING
- Publication number 20230063370
- Publication date Mar 2, 2023
- Rapyuta Robotics Co., Ltd
- Wen Zheng LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF SETTING PARAMETER OF CHARGED PARTI...
- Publication number 20230059414
- Publication date Feb 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroshi OINUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SCANNING MODULE, CHARGED PARTICLE BEAM DEVICE...
- Publication number 20230036590
- Publication date Feb 2, 2023
- Hitachi High-Tech Corporation
- Wen LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GEOGRAPHIC ROUTING MESH NETWORK
- Publication number 20230013258
- Publication date Jan 19, 2023
- Rapyuta Robotics Co., Ltd
- Wen Zheng LI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20230010272
- Publication date Jan 12, 2023
- Hitachi High-Tech Corporation
- Shinichi MURAKAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Power Supply Module and Charged Particle Beam Device
- Publication number 20220319795
- Publication date Oct 6, 2022
- Hitachi High-Tech Corporation
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220270847
- Publication date Aug 25, 2022
- Hitachi High-Tech Corporation
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE CALIB...
- Publication number 20220246392
- Publication date Aug 4, 2022
- HITACHI HIGH-TECH CORPORATION
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, COMPUTER, AND SIGNAL PROCESSING METHO...
- Publication number 20220187228
- Publication date Jun 16, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND OPERATION METHOD THEREFOR
- Publication number 20220189729
- Publication date Jun 16, 2022
- HITACHI HIGH-TECH CORPORATION
- Tomoharu NAGASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR OPTIMIZING ROUTE PLANS IN AN OPERATING ENVI...
- Publication number 20220163969
- Publication date May 26, 2022
- Rapyuta Robotics Co., Ltd
- Wen Zheng LI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220102105
- Publication date Mar 31, 2022
- Hitachi High-Tech Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND POWER SUPPLY DEVICE
- Publication number 20220068595
- Publication date Mar 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Wen Li
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MEASUREMENT DEVICE AND SIGNAL PROCESSING METHOD
- Publication number 20220068597
- Publication date Mar 3, 2022
- Hitachi High-Tech Corporation
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220059312
- Publication date Feb 24, 2022
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD OF MEASURING ELECTRICAL NOISE
- Publication number 20220037109
- Publication date Feb 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Takayasu Iwatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER CONVERTER AND CONTROL METHOD OF POWER CONVERTER
- Publication number 20210099095
- Publication date Apr 1, 2021
- Hitachi, Ltd
- Akio YAMAMOTO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CHARGED PARTICLE BEAM CONTROL DEVICE
- Publication number 20210066033
- Publication date Mar 4, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATING A 2D- NAVIGATION MAP FOR COLLISION FREE NAVIGATION BY MU...
- Publication number 20200309561
- Publication date Oct 1, 2020
- Wen Zheng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20200221566
- Publication date Jul 9, 2020
- Hitachi High-Technologies Corporation
- Ryo KADOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20200090900
- Publication date Mar 19, 2020
- Hitachi High-Technologies Corporation
- Ryo KADOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20200043695
- Publication date Feb 6, 2020
- Hitachi High-Technologies Corporation
- Kazuki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE BEAM SYSTEM
- Publication number 20200020504
- Publication date Jan 16, 2020
- Hitachi High-Technologies Corporation
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM CONTROL DEVICE
- Publication number 20190378686
- Publication date Dec 12, 2019
- Hitachi High-Technologies Corporation
- Shinichi MURAKAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE NOISE...
- Publication number 20190341225
- Publication date Nov 7, 2019
- Hitachi High-Technologies Corporation
- Takuma NISHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT AND INSPECTION DEVICE
- Publication number 20190318906
- Publication date Oct 17, 2019
- Hitachi High-Technologies Corporation
- Wen LI
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Measurement system and method of setting parameter of charged parti...

Multi-robot route planning

Power supply module and charged particle beam device

Systems and methods for optimizing route plans in an operating envi...

Charged particle beam device

Charged particle beam device and operation method therefor

Charged particle beam device, computer, and signal processing metho...

Charged particle beam device and charged particle beam device calib...

Measurement device and signal processing method

Charged particle beam device and power supply device

Charged particle beam device and method of measuring electrical noise

Charged particle beam device

Power converter and control method of power converter that reduce r...

Geographic routing mesh network

Charged particle beam control device

Generating a 2D-navigation map for collision-free navigation by mul...

Charged particle beam system

Charged particle beam device

Charged-particle beam system

Charged particle beam control device

Charged particle beam device

Charged particle beam device and charged particle beam device noise...

Measurement and inspection device

High-sensitivity sensor system, detection circuit, and detection me...

Charged particle beam device with transient signal correction durin...

High voltage power supply device and charged particle beam device

Charged particle beam device

Charged particle beam device and image forming method using same

Clock control circuit, demodulation device and spread spectrum method

Circuit design system and circuit design method

Patents Applicationslast 30 patents

HIGH VOLTAGE AMPLIFIER

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS AND PROCESSOR SYSTEM

TASK ASSIGNMENT IN AUTONOMOUS MOBILE DEVICES

MULTI-ROBOT ROUTE PLANNING

MEASUREMENT SYSTEM AND METHOD OF SETTING PARAMETER OF CHARGED PARTI...

CHARGED PARTICLE BEAM SCANNING MODULE, CHARGED PARTICLE BEAM DEVICE...

GEOGRAPHIC ROUTING MESH NETWORK

CHARGED PARTICLE BEAM DEVICE

Power Supply Module and Charged Particle Beam Device

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE CALIB...

CHARGED PARTICLE BEAM DEVICE, COMPUTER, AND SIGNAL PROCESSING METHO...

CHARGED PARTICLE BEAM DEVICE AND OPERATION METHOD THEREFOR

SYSTEMS AND METHODS FOR OPTIMIZING ROUTE PLANS IN AN OPERATING ENVI...

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE AND POWER SUPPLY DEVICE

MEASUREMENT DEVICE AND SIGNAL PROCESSING METHOD

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE AND METHOD OF MEASURING ELECTRICAL NOISE

POWER CONVERTER AND CONTROL METHOD OF POWER CONVERTER

CHARGED PARTICLE BEAM CONTROL DEVICE

GENERATING A 2D- NAVIGATION MAP FOR COLLISION FREE NAVIGATION BY MU...

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM SYSTEM

CHARGED PARTICLE BEAM DEVICE

CHARGED-PARTICLE BEAM SYSTEM

CHARGED PARTICLE BEAM CONTROL DEVICE

CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE NOISE...

MEASUREMENT AND INSPECTION DEVICE