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Chia-Yi Hsien, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Process for producing thin film transistor having LDD region
Patent number
7,678,627
Issue date
Mar 16, 2010
TPO Display Corp.
An Shih
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Organic light emitting diode display having red, blue, and green co...
Patent number
7,183,700
Issue date
Feb 27, 2007
TPO Displays Corp.
Wen-Yuan Guo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thin film transistor having LDD region and process for producing same
Patent number
7,098,492
Issue date
Aug 29, 2006
Toppoly Optoelectronics Corp.
An Shih
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Non-destructive contact test
Patent number
7,084,652
Issue date
Aug 1, 2006
Toppoly Optoelectronics Corp.
Wen-Yuan Guo
G01 - MEASURING TESTING
Information
Patent Grant
Method of photolithography using super-resolution near-field structure
Patent number
6,506,543
Issue date
Jan 14, 2003
Ritek Corporation
Tzu-Feng Tseng
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Method of increasing recording density and capacity of a compact disc
Patent number
6,404,722
Issue date
Jun 11, 2002
Ritek Corporation
Tzu-Feng Tseng
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of fabricating a polysilicon layer
Patent number
6,391,395
Issue date
May 21, 2002
Ritek Corporation
Tzu-Feng Tseng
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Process for producing thin film transistor having LDD region
Publication number
20060214167
Publication date
Sep 28, 2006
An Shih
G02 - OPTICS
Information
Patent Application
Conducting line terminal structure for display device
Publication number
20060046374
Publication date
Mar 2, 2006
TOPPOLY OPTOELECTRONICS CORP.
Hsin-Ming Chen
G02 - OPTICS
Information
Patent Application
ORGANIC LIGHT EMITTING DIODE DISPLAY
Publication number
20050140273
Publication date
Jun 30, 2005
Wen-Yuan Guo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Non-destructive contact test
Publication number
20050077914
Publication date
Apr 14, 2005
TOPPOLY OPTOELECTRONICS CORP.
Wen-Yuan Guo
G01 - MEASURING TESTING
Information
Patent Application
Thin film transistor having LDD region and process for producing same
Publication number
20040185607
Publication date
Sep 23, 2004
An Shih
G02 - OPTICS
Information
Patent Application
Digital data vending machine
Publication number
20020062171
Publication date
May 23, 2002
Tzu-Feng Tseng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Apparent data erasure method
Publication number
20020062446
Publication date
May 23, 2002
Tzu-Feng Tseng
G06 - COMPUTING CALCULATING COUNTING