Werner Boullart

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Binkom, BE

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Patents Grantslast 30 patents

Information Patent Grant
Use of F-based gate etch to passivate the high-k/metal gate stack f...
- Patent number 8,319,295
- Issue date Nov 27, 2012
- IMEC
- Nadine Collaert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual damascene patterning method
- Patent number 7,611,986
- Issue date Nov 3, 2009
- IMEC
- Jan Van Olmen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for stripping ion implanted photoresist layer
- Patent number 6,352,936
- Issue date Mar 5, 2002
- Imec VZW
- Christian Jehoul
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PATTERNING A MAGNETIC TUNNEL JUNCTION STACK
- Publication number 20150021726
- Publication date Jan 22, 2015
- IMEC vzw
- Tai Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA PROBE AND METHOD FOR PLASMA DIAGNOSTICS
- Publication number 20120283973
- Publication date Nov 8, 2012
- IMEC
- VLADIMIR SAMARA
- G01 - MEASURING TESTING
Information Patent Application
USE OF F-BASED GATE ETCH TO PASSIVATE THE HIGH-K/METAL GATE STACK F...
- Publication number 20080164539
- Publication date Jul 10, 2008
- Interuniversitair Microelektronica Centrum (IMEC)
- Nadine Collaert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma for patterning advanced gate stacks
- Publication number 20070099428
- Publication date May 3, 2007
- Denis Shamiryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual damascene patterning method
- Publication number 20060264033
- Publication date Nov 23, 2006
- Jan Van Olmen
- H01 - BASIC ELECTRIC ELEMENTS