Wesley Natzle

Person

New Paltz, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
High-k/metal gate transistor with L-shaped gate encapsulation layer
- Patent number 9,263,276
- Issue date Feb 16, 2016
- International Business Machines Corporation
- Renee T. Mo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-k/metal gate transistor with L-shaped gate encapsulation layer
- Patent number 9,252,018
- Issue date Feb 2, 2016
- International Business Machines Corporation
- Renee T. Mo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective deposition of germanium spacers on nitride
- Patent number 8,900,961
- Issue date Dec 2, 2014
- International Business Machines Corporation
- Ashima B. Chakravarti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-k dielectric gate structures resistant to oxide growth at the...
- Patent number 8,575,709
- Issue date Nov 5, 2013
- International Business Machines Corporation
- Huiming Bu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect device with reduced thickness gate
- Patent number 8,492,803
- Issue date Jul 23, 2013
- International Business Machines Corporation
- Ricky S. Amos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-k dielectric gate structures resistant to oxide growth at the...
- Patent number 8,318,565
- Issue date Nov 27, 2012
- International Business Machines Corporation
- Huiming Bu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Addition of ballast hydrocarbon gas to doped polysilicon etch maske...
- Patent number 8,198,103
- Issue date Jun 12, 2012
- International Business Machines Corporation
- Timothy J. Dalton
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Structure and method to control oxidation in high-k gate structures
- Patent number 7,955,926
- Issue date Jun 7, 2011
- International Business Machines Corporation
- Wesley C. Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal oxide field effect transistor with a sharp halo
- Patent number 7,859,013
- Issue date Dec 28, 2010
- International Business Machines Corporation
- Huajie Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Subgroundrule space for improved metal high-k device
- Patent number 7,851,299
- Issue date Dec 14, 2010
- International Business Machines Corporation
- Wesley C. Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective deposition of germanium spacers on nitride
- Patent number 7,705,385
- Issue date Apr 27, 2010
- International Business Machines Corporation
- Ashima Chakravarti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic metrology sampling with wafer uniformity control
- Patent number 7,567,700
- Issue date Jul 28, 2009
- Tokyo Electron Limited
- Merritt Funk
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Dynamic metrology sampling for a dual damascene process
- Patent number 7,502,709
- Issue date Mar 10, 2009
- Tokyo Electron, Ltd.
- Merritt Funk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feature dimension deviation correction system, method and program p...
- Patent number 7,502,660
- Issue date Mar 10, 2009
- International Business Machines Corporation
- David V. Horak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nitrogen based plasma process for metal gate MOS device
- Patent number 7,498,271
- Issue date Mar 3, 2009
- International Business Machines Corporation
- Ricardo A. Donaton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method to fabricate finfet devices
- Patent number 7,470,629
- Issue date Dec 30, 2008
- International Business Machines Corporation
- Wesley Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect device with reduced thickness gate
- Patent number 7,459,382
- Issue date Dec 2, 2008
- International Business Machines Corporation
- Ricky S. Amos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process control using physical modules and virtual modules
- Patent number 7,451,011
- Issue date Nov 11, 2008
- Tokyo Electron Limited
- Merritt Funk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal oxide field effect transistor with a sharp halo and a method...
- Patent number 7,384,835
- Issue date Jun 10, 2008
- International Business Machines Corporation
- Huajie Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clustered surface preparation for silicide and metal contacts
- Patent number 7,344,983
- Issue date Mar 18, 2008
- International Business Machines Corporation
- Sadanand V. Deshpande
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of etching dual pre-doped polysilicon gate stacks using carb...
- Patent number 7,344,965
- Issue date Mar 18, 2008
- International Business Machines Corporation
- Ying Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formula-based run-to-run control
- Patent number 7,292,906
- Issue date Nov 6, 2007
- Tokyo Electron Limited
- Merritt Funk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feature dimension deviation correction system, method and program p...
- Patent number 7,289,864
- Issue date Oct 30, 2007
- International Business Machines Corporation
- David V. Horak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer-to-wafer control using virtual modules
- Patent number 7,212,878
- Issue date May 1, 2007
- Tokyo Electron Limited
- Merritt Funk
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Freestanding multiplayer IC wiring structure
- Patent number 7,211,496
- Issue date May 1, 2007
- International Business Machines Corporation
- Wesley C. Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low resistance T-gate MOSFET device using a damascene gate process...
- Patent number 7,176,534
- Issue date Feb 13, 2007
- International Business Machines Corporation
- Hussein I. Hanafi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch selectivity enhancement for tunable etch resistant anti-reflec...
- Patent number 7,077,903
- Issue date Jul 18, 2006
- International Business Machines Corporation
- Katherina E. Babich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method to fabricate FinFET devices
- Patent number 7,049,662
- Issue date May 23, 2006
- International Business Machines Corporation
- Wesley Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making sub-lithographic features
- Patent number 6,960,510
- Issue date Nov 1, 2005
- International Business Machines Corporation
- Sadanand V. Deshpande
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etching of hard masks
- Patent number 6,926,843
- Issue date Aug 9, 2005
- International Business Machines Corporation
- Marc W. Cantell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH-K/METAL GATE TRANSISTOR WITH L-SHAPED GATE ENCAPSULATION LAYER
- Publication number 20120299122
- Publication date Nov 29, 2012
- International Business Machines Corporation
- RENEE T. MO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-K DIELECTRIC GATE STRUCTURES RESISTANT TO OXIDE GROWTH AT THE...
- Publication number 20120286374
- Publication date Nov 15, 2012
- International Business Machines Corporation
- Huiming Bu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-K DIELECTRIC GATE STRUCTURES RESISTANT TO OXIDE GROWTH AT THE...
- Publication number 20110221012
- Publication date Sep 15, 2011
- International Business Machines Corporation
- Huiming Bu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-K/METAL GATE TRANSISTOR WITH L-SHAPED GATE ENCAPSULATION LAYER
- Publication number 20110115032
- Publication date May 19, 2011
- International Business Machines Corporation
- RENEE T. MO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE DEPOSITION OF GERMANIUM SPACERS ON NITRIDE
- Publication number 20110034000
- Publication date Feb 10, 2011
- International Business Machines Corporation
- Ashima B. Chakravarti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND STRUCTURE FOR THRESHOLD VOLTAGE CONTROL AND DRIVE CURREN...
- Publication number 20100244206
- Publication date Sep 30, 2010
- International Business Machines Corporation
- Huiming Bu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBGROUNDRULE SPACE FOR IMPROVED METAL HIGH-K DEVICE
- Publication number 20090250782
- Publication date Oct 8, 2009
- International Business Machines Corporation
- Wesley C. Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD TO CONTROL OXIDATION IN HIGH-K GATE STRUCTURES
- Publication number 20090243031
- Publication date Oct 1, 2009
- International Business Machines Corporation
- Wesley C. Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EFFECT TRANSISTOR WITH REDUCED OVERLAP CAPACITANCE
- Publication number 20090212332
- Publication date Aug 27, 2009
- International Business Machines Corporation
- Xinlin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EFFECT DEVICE WITH REDUCED THICKNESS GATE
- Publication number 20090159934
- Publication date Jun 25, 2009
- International Business Machines Corporation
- Ricky S. Amos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADDITION OF BALLAST HYDROCARBON GAS TO DOPED POLYSILICON ETCH MASKE...
- Publication number 20080286972
- Publication date Nov 20, 2008
- International Business Machines Corporation
- Timothy J. Dalton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Selective Deposition of Germanium Spacers on Nitride
- Publication number 20080242041
- Publication date Oct 2, 2008
- International Business Machines Corporation
- Ashima B. Chakravarti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLUSTERED SURFACE PREPARATION FOR SILICIDE AND METAL CONTACTS
- Publication number 20080156257
- Publication date Jul 3, 2008
- International Business Machines Corporation
- Sadanand V. Deshpande
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METAL OXIDE FIELD EFFECT TRANSISTOR WITH A SHARP HALO
- Publication number 20080093629
- Publication date Apr 24, 2008
- International Business Machines Corporation
- Huajie Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FEATURE DIMENSION DEVIATION CORRECTION SYSTEM, METHOD AND PROGRAM P...
- Publication number 20080027577
- Publication date Jan 31, 2008
- David V. Horak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL OXIDE FIELD EFFECT TRANSISTOR WITH A SHARP HALO AND A METHOD...
- Publication number 20070275510
- Publication date Nov 29, 2007
- International Business Machines Corporation
- Huajie Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic metrology sampling with wafer uniformity control
- Publication number 20070238201
- Publication date Oct 11, 2007
- Merritt Funk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic metrology sampling with wafer uniformity control
- Publication number 20070237383
- Publication date Oct 11, 2007
- Merritt Funk
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Dynamic metrology sampling for a dual damascene process
- Publication number 20070231930
- Publication date Oct 4, 2007
- Merritt Funk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EFFECT DEVICE WITH REDUCED THICKNESS GATE
- Publication number 20070221964
- Publication date Sep 27, 2007
- International Business Machines Corporation
- Ricky S. Amos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE DEPOSITION OF GERMANIUM SPACERS ON NITRIDE
- Publication number 20070059894
- Publication date Mar 15, 2007
- International Business Machines Corporation
- Ashima B. Chakravarti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLUSTERED SURFACE PREPARATION FOR SILICIDE AND METAL CONTACTS
- Publication number 20060211244
- Publication date Sep 21, 2006
- International Business Machines Corporation
- Sadanand V. Deshpande
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method of etching dual pre-doped polysilicon gate stacks using carb...
- Publication number 20060183308
- Publication date Aug 17, 2006
- Ying Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADDITION OF BALLAST HYDROCARBON GAS TO DOPED POLYSILICON ETCH MASKE...
- Publication number 20060166416
- Publication date Jul 27, 2006
- International Business Machines Corporation
- Timothy J. Dalton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING PROCESS NON-UNIFORMITY
- Publication number 20060096951
- Publication date May 11, 2006
- International Business Machines Corporation
- Wesley C. Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer-to-wafer control using virtual modules
- Publication number 20060047356
- Publication date Mar 2, 2006
- TOKYO ELECTRON LIMITED
- Merritt Funk
- G05 - CONTROLLING REGULATING
Information Patent Application
Structure and method to fabricate finfet devices
- Publication number 20060043502
- Publication date Mar 2, 2006
- International Business Machines Corporation
- Wesley Natzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process control using physical modules and virtual modules
- Publication number 20060042543
- Publication date Mar 2, 2006
- TOKYO ELECTRON LIMITED
- Merritt Funk
- G05 - CONTROLLING REGULATING
Information Patent Application
Formula-based run-to-run control
- Publication number 20060015206
- Publication date Jan 19, 2006
- TOKYO ELECTRON LIMITED
- Merritt Funk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FEATURE DIMENSION DEVIATION CORRECTION SYSTEM, METHOD AND PROGRAM P...
- Publication number 20060007453
- Publication date Jan 12, 2006
- International Business Machines Corporation
- David V. Horak
- H01 - BASIC ELECTRIC ELEMENTS

Wesley Natzle

Person

Patents Grantslast 30 patents

High-k/metal gate transistor with L-shaped gate encapsulation layer

High-k/metal gate transistor with L-shaped gate encapsulation layer

Selective deposition of germanium spacers on nitride

High-k dielectric gate structures resistant to oxide growth at the...

Field effect device with reduced thickness gate

High-k dielectric gate structures resistant to oxide growth at the...

Addition of ballast hydrocarbon gas to doped polysilicon etch maske...

Structure and method to control oxidation in high-k gate structures

Metal oxide field effect transistor with a sharp halo

Subgroundrule space for improved metal high-k device

Selective deposition of germanium spacers on nitride

Dynamic metrology sampling with wafer uniformity control

Dynamic metrology sampling for a dual damascene process

Feature dimension deviation correction system, method and program p...

Nitrogen based plasma process for metal gate MOS device

Structure and method to fabricate finfet devices

Field effect device with reduced thickness gate

Process control using physical modules and virtual modules

Metal oxide field effect transistor with a sharp halo and a method...

Clustered surface preparation for silicide and metal contacts

Method of etching dual pre-doped polysilicon gate stacks using carb...

Formula-based run-to-run control

Feature dimension deviation correction system, method and program p...

Wafer-to-wafer control using virtual modules

Freestanding multiplayer IC wiring structure

Low resistance T-gate MOSFET device using a damascene gate process...

Etch selectivity enhancement for tunable etch resistant anti-reflec...

Structure and method to fabricate FinFET devices

Method of making sub-lithographic features

Etching of hard masks

Patents Applicationslast 30 patents

HIGH-K/METAL GATE TRANSISTOR WITH L-SHAPED GATE ENCAPSULATION LAYER

HIGH-K DIELECTRIC GATE STRUCTURES RESISTANT TO OXIDE GROWTH AT THE...

HIGH-K DIELECTRIC GATE STRUCTURES RESISTANT TO OXIDE GROWTH AT THE...

HIGH-K/METAL GATE TRANSISTOR WITH L-SHAPED GATE ENCAPSULATION LAYER

SELECTIVE DEPOSITION OF GERMANIUM SPACERS ON NITRIDE

METHOD AND STRUCTURE FOR THRESHOLD VOLTAGE CONTROL AND DRIVE CURREN...

SUBGROUNDRULE SPACE FOR IMPROVED METAL HIGH-K DEVICE

STRUCTURE AND METHOD TO CONTROL OXIDATION IN HIGH-K GATE STRUCTURES

FIELD EFFECT TRANSISTOR WITH REDUCED OVERLAP CAPACITANCE

FIELD EFFECT DEVICE WITH REDUCED THICKNESS GATE

ADDITION OF BALLAST HYDROCARBON GAS TO DOPED POLYSILICON ETCH MASKE...

Selective Deposition of Germanium Spacers on Nitride

CLUSTERED SURFACE PREPARATION FOR SILICIDE AND METAL CONTACTS

METAL OXIDE FIELD EFFECT TRANSISTOR WITH A SHARP HALO

FEATURE DIMENSION DEVIATION CORRECTION SYSTEM, METHOD AND PROGRAM P...

METAL OXIDE FIELD EFFECT TRANSISTOR WITH A SHARP HALO AND A METHOD...

Dynamic metrology sampling with wafer uniformity control

Dynamic metrology sampling with wafer uniformity control

Dynamic metrology sampling for a dual damascene process

FIELD EFFECT DEVICE WITH REDUCED THICKNESS GATE

SELECTIVE DEPOSITION OF GERMANIUM SPACERS ON NITRIDE

CLUSTERED SURFACE PREPARATION FOR SILICIDE AND METAL CONTACTS

Method of etching dual pre-doped polysilicon gate stacks using carb...

ADDITION OF BALLAST HYDROCARBON GAS TO DOPED POLYSILICON ETCH MASKE...

APPARATUS AND METHOD FOR CONTROLLING PROCESS NON-UNIFORMITY

Wafer-to-wafer control using virtual modules

Structure and method to fabricate finfet devices

Process control using physical modules and virtual modules

Formula-based run-to-run control

FEATURE DIMENSION DEVIATION CORRECTION SYSTEM, METHOD AND PROGRAM P...