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William A. Clark
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Lever based differential capacitive strain gauge with acceleration...
Patent number
12,000,739
Issue date
Jun 4, 2024
Analog Devices, Inc.
Erdinc Tatar
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for self-testing MEMS inertial sensors
Patent number
11,112,269
Issue date
Sep 7, 2021
Analog Devices, Inc.
William A. Clark
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for sensing angular motion in the presence of l...
Patent number
11,041,722
Issue date
Jun 22, 2021
Analog Devices, Inc.
Jiefeng Yan
G01 - MEASURING TESTING
Information
Patent Grant
Sense amplifiers for gyroscopes and related systems and methods
Patent number
10,914,583
Issue date
Feb 9, 2021
Analog Devices, Inc.
Jiefeng Yan
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method and apparatus for driving a multi-oscillator system
Patent number
10,451,454
Issue date
Oct 22, 2019
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Grant
Anchor tracking for MEMS accelerometers
Patent number
10,261,105
Issue date
Apr 16, 2019
Analog Devices, Inc.
William A. Clark
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Anchor tracking apparatus for in-plane accelerometers and related m...
Patent number
10,203,352
Issue date
Feb 12, 2019
Analog Devices, Inc.
Xin Zhang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method and apparatus for driving a multi-oscillator system
Patent number
10,168,194
Issue date
Jan 1, 2019
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer with offset compensation
Patent number
9,927,459
Issue date
Mar 27, 2018
Analog Devices, Inc.
William A. Clark
G01 - MEASURING TESTING
Information
Patent Grant
Spread-spectrum MEMS self-test system and method
Patent number
9,238,580
Issue date
Jan 19, 2016
Analog Devices Global
Kamatchi Saravanan Alagarsamy
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Offset detection and compensation for micromachined inertial sensors
Patent number
8,783,103
Issue date
Jul 22, 2014
Analog Devices, Inc.
William A. Clark
G01 - MEASURING TESTING
Information
Patent Grant
Detection and mitigation of aerodynamic error sources for micromach...
Patent number
8,677,801
Issue date
Mar 25, 2014
Analog Devices, Inc.
William A. Clark
G01 - MEASURING TESTING
Information
Patent Grant
Detection and mitigation of particle contaminants in MEMS devices
Patent number
8,598,891
Issue date
Dec 3, 2013
Analog Devices, Inc.
Vineet Kumar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Piezoelectric transducers
Patent number
8,555,718
Issue date
Oct 15, 2013
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensors using piezoelectric transducers
Patent number
8,549,918
Issue date
Oct 8, 2013
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Grant
Detection and mitigation of particle contaminants in MEMS devices
Patent number
8,421,481
Issue date
Apr 16, 2013
Analog Devices, Inc.
Vineet Kumar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Piezoelectric transducers and inertial sensors using piezoelectric...
Patent number
8,408,060
Issue date
Apr 2, 2013
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Grant
Coupling apparatus for inertial sensors
Patent number
7,347,094
Issue date
Mar 25, 2008
Analog Devices, Inc.
John A. Geen
G01 - MEASURING TESTING
Information
Patent Grant
Actuation circuit for MEMS structures
Patent number
7,227,385
Issue date
Jun 5, 2007
Analog Devices, Inc.
Trey Allen W. Roessig, III
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Structure for attenuation or cancellation of quadrature error
Patent number
7,051,590
Issue date
May 30, 2006
Analog Devices IMI, Inc.
Mark A. Lemkin
G01 - MEASURING TESTING
Information
Patent Grant
Method of fabricating a microfabricated high aspect ratio device wi...
Patent number
6,960,488
Issue date
Nov 1, 2005
The Regents of the University of California
Timothy J. Brosnihan
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
PWM-based measurement interface for a micro-machined electrostatic...
Patent number
6,933,873
Issue date
Aug 23, 2005
Analog Devices, Inc.
David Horsley
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Position sensing with improved linearity
Patent number
6,868,726
Issue date
Mar 22, 2005
Analog Devices IMI, Inc.
Mark A. Lemkin
G01 - MEASURING TESTING
Information
Patent Grant
Digital voltage regulator using current control
Patent number
6,853,169
Issue date
Feb 8, 2005
Volterra Semiconductor Corporation
Andrew J. Burstein
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Parallel plate electrostatic actuation of MEMS mirrors
Patent number
6,822,370
Issue date
Nov 23, 2004
Analog Devices, Inc.
William A. Clark
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Low-resistivity microelectromechanical structures with co-fabricate...
Patent number
6,703,679
Issue date
Mar 9, 2004
Analog Devices, IMI, Inc.
Mark A. Lemkin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
PWM-based measurement interface for a micro-machined electrostatic...
Patent number
6,674,383
Issue date
Jan 6, 2004
Onix Microsystems, Inc.
David Horsley
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Digital voltage regulator using current control
Patent number
6,590,369
Issue date
Jul 8, 2003
Volterra Semiconductor Corporation
Andrew J. Burstein
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Current measuring methods
Patent number
6,445,244
Issue date
Sep 3, 2002
Volterra Semiconductor Corporation
Anthony Stratakos
G05 - CONTROLLING REGULATING
Information
Patent Grant
Microfabrication using germanium-based release masks
Patent number
6,440,766
Issue date
Aug 27, 2002
Analog Devices IMI, Inc.
William A. Clark
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
LEVER BASED DIFFERENTIAL CAPACITIVE STRAIN GAUGE WITH ACCELERATION...
Publication number
20220341795
Publication date
Oct 27, 2022
Analog Devices, Inc.
Erdinc Tatar
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR SENSING ANGULAR MOTION IN THE PRESENCE OF L...
Publication number
20200025566
Publication date
Jan 23, 2020
Analog Devices, Inc.
Jiefeng Yan
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR SELF-TESTING MEMS INERTIAL SENSORS
Publication number
20200011702
Publication date
Jan 9, 2020
Analog Devices, Inc.
William A. Clark
G01 - MEASURING TESTING
Information
Patent Application
SENSE AMPLIFIERS FOR GYROSCOPES AND RELATED SYSTEMS AND METHODS
Publication number
20190257654
Publication date
Aug 22, 2019
Analog Devices, Inc.
Jiefeng Yan
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
METHOD AND APPARATUS FOR DRIVING A MULTI-OSCILLATOR SYSTEM
Publication number
20190078912
Publication date
Mar 14, 2019
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Application
ANCHOR TRACKING FOR MEMS ACCELEROMETERS
Publication number
20180231580
Publication date
Aug 16, 2018
Analog Devices, Inc.
William A. Clark
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ANCHOR TRACKING APPARATUS FOR IN-PLANE ACCELEROMETERS AND RELATED M...
Publication number
20180038887
Publication date
Feb 8, 2018
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Driving a Multi-Oscillator System
Publication number
20170184644
Publication date
Jun 29, 2017
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Application
Accelerometer with Offset Compensation
Publication number
20150122024
Publication date
May 7, 2015
Analog Devices, Inc.
William A. Clark
G01 - MEASURING TESTING
Information
Patent Application
XY-Axis Gyroscopes with Electrode Configuration for Detecting Quadr...
Publication number
20140260611
Publication date
Sep 18, 2014
Analog Devices, Inc.
Houri Johari-Galle
G01 - MEASURING TESTING
Information
Patent Application
Spread-Spectrum MEMS Self-Test System and Method
Publication number
20140250969
Publication date
Sep 11, 2014
Analog Devices Technology
Kamatchi Saravanan Alagarsamy
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Detection and Mitigation of Aerodynamic Error Sources for Micromach...
Publication number
20140060186
Publication date
Mar 6, 2014
Analog Devices, Inc.
William A. Clark
G01 - MEASURING TESTING
Information
Patent Application
Inertial Sensors Using Piezoelectric Transducers
Publication number
20130167639
Publication date
Jul 4, 2013
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Application
Piezoelectric Transducers
Publication number
20130167642
Publication date
Jul 4, 2013
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Application
Detection and Mitigation of Particle Contaminants in MEMS Devices
Publication number
20130168675
Publication date
Jul 4, 2013
Analog Devices, Inc.
Vineet Kumar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Piezoelectric Transducers and Inertial Sensors using Piezoelectric...
Publication number
20120210790
Publication date
Aug 23, 2012
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Application
Detection and Mitigation of Particle Contaminants in MEMS Devices
Publication number
20110115498
Publication date
May 19, 2011
Analog Devices, Inc.
Vineet Kumar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Offset Detection and Compensation for Micromachined Inertial Sensors
Publication number
20110041609
Publication date
Feb 24, 2011
Analog Devices, Inc.
William A. Clark
G01 - MEASURING TESTING
Information
Patent Application
Piezoelectric Transducers and Inertial Sensors using Piezoelectric...
Publication number
20100058861
Publication date
Mar 11, 2010
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Application
Coupling apparatus for inertial sensors
Publication number
20050229703
Publication date
Oct 20, 2005
John A. Geen
G01 - MEASURING TESTING
Information
Patent Application
Actuation circuit for MEMS structures
Publication number
20050134320
Publication date
Jun 23, 2005
Trey Allen W. Roessig
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PHOTOELECTRIC CONVERSION DEVICE AND MANUFACTURING MEHTOD THEREFOR
Publication number
20040147055
Publication date
Jul 29, 2004
TIMOTHY J. BROSNIHAN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Digital voltage regulator using current control
Publication number
20040052098
Publication date
Mar 18, 2004
Volterra Semiconductors Corporation, a Delaware corporation
Andrew J. Burstein
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Parallel plate electrostatic actuation MEMS mirrors
Publication number
20030168928
Publication date
Sep 11, 2003
William A. Clark
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Sense interface system with velocity feed-through rejection
Publication number
20030098699
Publication date
May 29, 2003
Mark A. Lemkin
G01 - MEASURING TESTING
Information
Patent Application
PWM-based measurement interface for a micro-machined electrostatic...
Publication number
20020093446
Publication date
Jul 18, 2002
ONIX MICROSYSTEMS, INC.
David Horsley
G01 - MEASURING TESTING
Information
Patent Application
Digital voltage regulator using current control
Publication number
20010038277
Publication date
Nov 8, 2001
Volterra Semiconductor Corporation, a Delaware corporation
Andrew J. Burstein
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Position sensing with improved linearity
Publication number
20010032508
Publication date
Oct 25, 2001
Mark A. Lemkin
G01 - MEASURING TESTING