William A. Fritzsche

Person

Morgan Hill, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated test platform utilizing segmented data sequencers to prov...
- Patent number 9,459,978
- Issue date Oct 4, 2016
- Xcerra Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable test platform in a PCI express environment with direct mem...
- Patent number 9,430,349
- Issue date Aug 30, 2016
- Xcerra Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable test platform in a PCI express environment with direct mem...
- Patent number 9,430,348
- Issue date Aug 30, 2016
- Xcerra Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable test platform
- Patent number 9,336,108
- Issue date May 10, 2016
- Xcerra Corporation
- William A. Fritzsche
- G07 - CHECKING-DEVICES
Information Patent Grant
Automated test platform utilizing status register polling with temp...
- Patent number 9,213,616
- Issue date Dec 15, 2015
- Xcerra Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic test equipment operating architecture
- Patent number 7,496,467
- Issue date Feb 24, 2009
- Credence Systems Corporation
- William A. Fritzsche
- G01 - MEASURING TESTING
Information Patent Grant
Circuit testing with ring-connected test instrument modules
- Patent number 7,370,255
- Issue date May 6, 2008
- Credence Systems Corporation
- Michael F. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment operating architecture
- Patent number 7,302,358
- Issue date Nov 27, 2007
- Credence Systems Solutions
- William A. Fritzsche
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment operating architecture
- Patent number 7,107,173
- Issue date Sep 12, 2006
- Credence Systems Corporation
- William A. Fritzsche
- G01 - MEASURING TESTING
Information Patent Grant
System and method for linking and loading compiled pattern data
- Patent number 7,099,791
- Issue date Aug 29, 2006
- Credence Systems Corporation
- William A. Fritzsche
- G01 - MEASURING TESTING
Information Patent Grant
Circuit testing with ring-connected test instruments modules
- Patent number 7,043,390
- Issue date May 9, 2006
- Credence Systems Corporation
- Michael F. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Circuit testing with ring-connected test instrument modules
- Patent number 7,035,755
- Issue date Apr 25, 2006
- Credence Systems Corporation
- Michael F. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for socket calibration of integrated circuit t...
- Patent number 6,794,861
- Issue date Sep 21, 2004
- NPTest, LLC
- Howard M. Maassen
- G01 - MEASURING TESTING
Information Patent Grant
Socket calibration method and apparatus
- Patent number 6,492,797
- Issue date Dec 10, 2002
- Schlumberger Technologies, Inc.
- Howard M. Maassen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCALABLE TEST PLATFORM
- Publication number 20140208164
- Publication date Jul 24, 2014
- LTX-Credence Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED TEST PLATFORM
- Publication number 20140208160
- Publication date Jul 24, 2014
- LTX-Credence Corporation
- WILLIAM A. FRITZSCHE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCALABLE TEST PLATFORM
- Publication number 20140208161
- Publication date Jul 24, 2014
- LTX-Credence Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCALABLE TEST PLATFORM
- Publication number 20140207404
- Publication date Jul 24, 2014
- LTX-Credence Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED TEST PLATFORM
- Publication number 20140208082
- Publication date Jul 24, 2014
- LTX-Credence Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT OPERATING ARCHITECTURE
- Publication number 20060218456
- Publication date Sep 28, 2006
- Credence Systems Corporation
- William A. Fritzsche
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT OPERATING ARCHITECTURE
- Publication number 20060212254
- Publication date Sep 21, 2006
- Credence Systems Corporation
- William A. Fritzsche
- G01 - MEASURING TESTING
Information Patent Application
System and method for linking and loading compiled pattern data
- Publication number 20050261858
- Publication date Nov 24, 2005
- William A. Fritzsche
- G01 - MEASURING TESTING
Information Patent Application
System and method for linking and loading compiled pattern data
- Publication number 20050261857
- Publication date Nov 24, 2005
- Clark Jones
- G01 - MEASURING TESTING
Information Patent Application
Automatic test equipment operating architecture
- Publication number 20050171722
- Publication date Aug 4, 2005
- William A. Fritzsche
- G01 - MEASURING TESTING
Information Patent Application
Circuit testing with ring-connected test instrument modules
- Publication number 20050149800
- Publication date Jul 7, 2005
- Michael F. Jones
- G01 - MEASURING TESTING
Information Patent Application
Circuit testing with ring-connected test instrument modules
- Publication number 20050102592
- Publication date May 12, 2005
- CREDENCE SYSTEMS CORPORATION
- Michael F. Jones
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for socket calibration of integrated circuit t...
- Publication number 20020135357
- Publication date Sep 26, 2002
- Howard M. Maassen
- G01 - MEASURING TESTING

William A. Fritzsche

Person

Patents Grantslast 30 patents

Automated test platform utilizing segmented data sequencers to prov...

Scalable test platform in a PCI express environment with direct mem...

Scalable test platform in a PCI express environment with direct mem...

Scalable test platform

Automated test platform utilizing status register polling with temp...

Automatic test equipment operating architecture

Circuit testing with ring-connected test instrument modules

Automatic test equipment operating architecture

Automatic test equipment operating architecture

System and method for linking and loading compiled pattern data

Circuit testing with ring-connected test instruments modules

Circuit testing with ring-connected test instrument modules

Method and apparatus for socket calibration of integrated circuit t...

Socket calibration method and apparatus

Patents Applicationslast 30 patents

SCALABLE TEST PLATFORM

AUTOMATED TEST PLATFORM

SCALABLE TEST PLATFORM

SCALABLE TEST PLATFORM

AUTOMATED TEST PLATFORM

AUTOMATIC TEST EQUIPMENT OPERATING ARCHITECTURE

AUTOMATIC TEST EQUIPMENT OPERATING ARCHITECTURE

System and method for linking and loading compiled pattern data

System and method for linking and loading compiled pattern data

Automatic test equipment operating architecture

Circuit testing with ring-connected test instrument modules

Circuit testing with ring-connected test instrument modules

Method and apparatus for socket calibration of integrated circuit t...