William J. DeVore

Person

Hayward, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-function module for an electron beam column
- Patent number 7,800,075
- Issue date Sep 21, 2010
- Benyamin Buller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron anti-fogging baffle used as a detector
- Patent number 7,514,682
- Issue date Apr 7, 2009
- Applied Materials, Inc.
- Benyamin Buller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam column for writing shaped electron beams
- Patent number 7,427,765
- Issue date Sep 23, 2008
- Jeol, Ltd.
- Benyamin Buller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam source having an extraction electrode provided with a...
- Patent number 7,372,195
- Issue date May 13, 2008
- Applied Materials, Inc.
- Steven T. Coyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic deflection system with low aberrations and vertical b...
- Patent number 7,315,029
- Issue date Jan 1, 2008
- Applied Materials, Inc.
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic deflection system with impedance matching for high po...
- Patent number 7,227,155
- Issue date Jun 5, 2007
- Applied Materials, Inc.
- Benyamin Buller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of exposing a target to a charged particle beam
- Patent number 6,924,494
- Issue date Aug 2, 2005
- Applied Materials, Inc.
- Lee H. Veneklasen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam patterning with a heated electron source
- Patent number 6,828,996
- Issue date Dec 7, 2004
- Applied Materials, Inc.
- Glen E. Howard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Immersion lens with magnetic shield for charged particle beam system
- Patent number 6,768,117
- Issue date Jul 27, 2004
- Applied Materials, Inc.
- Lee H. Veneklasen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Blanker assembly employing dielectric material
- Patent number 6,521,896
- Issue date Feb 18, 2003
- Applied Materials, Inc.
- William J. DeVore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun having magnetic collimator
- Patent number 6,392,333
- Issue date May 21, 2002
- Applied Materials, Inc.
- Lee H. Veneklasen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Raster scan gaussian beam writing strategy and method for pattern g...
- Patent number 6,274,290
- Issue date Aug 14, 2001
- Etec Systems, Inc.
- Lee H. Veneklasen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic lens and deflector with inner and outer pole pieces with c...
- Patent number 6,002,135
- Issue date Dec 14, 1999
- Etec Systems, Inc.
- Lee H. Veneklasen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Raster shaped beam writing strategy system and method for pattern g...
- Patent number 5,876,902
- Issue date Mar 2, 1999
- Etec Systems, Inc.
- Lee H. Veneklasen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Composite concentric-gap magnetic lens and deflector with conical p...
- Patent number 5,729,022
- Issue date Mar 17, 1998
- Etec Systems, Inc.
- Lee H. Veneklasen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device fabrication entailing submicron imaging
- Patent number 5,376,505
- Issue date Dec 27, 1994
- AT&T Corp.
- Steven D. Berger
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron-detector diode biassing scheme for improved writing by an...
- Patent number 4,987,311
- Issue date Jan 22, 1991
- Etec Systems, Inc.
- William J. Devore
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Composite concentric-gap magnetic lens
- Patent number 4,469,948
- Issue date Sep 4, 1984
- The Perkin-Elmer Corp.
- Lee H. Veneklasen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MULTI-FUNCTION MODULE FOR AN ELECTRON BEAM COLUMN
- Publication number 20080308751
- Publication date Dec 18, 2008
- JEOL, Inc.
- Benyamin Buller
- B82 - NANO-TECHNOLOGY
Information Patent Application
ELECTRON ANTI-FOGGING BAFFLE USED AS A DETECTOR
- Publication number 20070145269
- Publication date Jun 28, 2007
- APPLIED MATERIALS, INC.
- BENYAMIN BULLER
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron beam column for writing shaped electron beams
- Publication number 20070085033
- Publication date Apr 19, 2007
- APPLIED MATERIALS, INC.
- Benyamin Buller
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electrostatic deflection system with low aberrations and vertical b...
- Publication number 20070075262
- Publication date Apr 5, 2007
- APPLIED MATERIALS, INC.
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic deflection system with impedance matching for high po...
- Publication number 20070075256
- Publication date Apr 5, 2007
- Benyamin Buller
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron beam source for use in electron gun
- Publication number 20070057617
- Publication date Mar 15, 2007
- APPLIED MATERIALS, INC.
- Steven T. Coyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of exposing a target to a charged particle beam
- Publication number 20040217304
- Publication date Nov 4, 2004
- Lee H. Veneklasen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam patterning with a heated electron source
- Publication number 20020195570
- Publication date Dec 26, 2002
- APPLIED MATERIALS, INC.
- Glen E. Howard
- H01 - BASIC ELECTRIC ELEMENTS

William J. DeVore

Person

Patents Grantslast 30 patents

Multi-function module for an electron beam column

Electron anti-fogging baffle used as a detector

Electron beam column for writing shaped electron beams

Electron beam source having an extraction electrode provided with a...

Electrostatic deflection system with low aberrations and vertical b...

Electrostatic deflection system with impedance matching for high po...

Method of exposing a target to a charged particle beam

Electron beam patterning with a heated electron source

Immersion lens with magnetic shield for charged particle beam system

Blanker assembly employing dielectric material

Electron gun having magnetic collimator

Raster scan gaussian beam writing strategy and method for pattern g...

Magnetic lens and deflector with inner and outer pole pieces with c...

Raster shaped beam writing strategy system and method for pattern g...

Composite concentric-gap magnetic lens and deflector with conical p...

Device fabrication entailing submicron imaging

Electron-detector diode biassing scheme for improved writing by an...

Composite concentric-gap magnetic lens

Patents Applicationslast 30 patents

MULTI-FUNCTION MODULE FOR AN ELECTRON BEAM COLUMN

ELECTRON ANTI-FOGGING BAFFLE USED AS A DETECTOR

Electron beam column for writing shaped electron beams

Electrostatic deflection system with low aberrations and vertical b...

Electrostatic deflection system with impedance matching for high po...

Electron beam source for use in electron gun

Method of exposing a target to a charged particle beam

Electron beam patterning with a heated electron source