William Jarrett Campbell

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for adjusting rapid thermal processing (RTP) recipe setpoint...
- Patent number 6,856,849
- Issue date Feb 15, 2005
- Advanced Micro Devices, Inc.
- Terrence J. Riley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling wafer thickness uniformity in...
- Patent number 6,850,322
- Issue date Feb 1, 2005
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Run-to-run control method for proportional-integral-derivative (PID...
- Patent number 6,819,963
- Issue date Nov 16, 2004
- Advanced Micro Devices, Inc.
- Terrence J. Riley
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for run-to-run control of deposition process
- Patent number 6,650,957
- Issue date Nov 18, 2003
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for performing run-to-run control in a batch m...
- Patent number 6,607,926
- Issue date Aug 19, 2003
- Advanced Micro Devices, Inc.
- Anthony J. Toprac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling wafer uniformity in a chemical...
- Patent number 6,592,429
- Issue date Jul 15, 2003
- Advanced Micro Devices, Inc.
- William J. Campbell
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for monitoring consumable performance
- Patent number 6,567,718
- Issue date May 20, 2003
- Advanced Micro Devices, Inc.
- William J. Campbell
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for monitoring controller performance using st...
- Patent number 6,560,503
- Issue date May 6, 2003
- Advanced Micro Devices, Inc.
- Anthony J. Toprac
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for interfacing a statistical process control...
- Patent number 6,556,884
- Issue date Apr 29, 2003
- Advanced Micro Devices, Inc.
- Michael L. Miller
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method for adjusting incoming film thickness uniformity such that v...
- Patent number 6,546,306
- Issue date Apr 8, 2003
- Advanced Micro Devices, Inc.
- Scott Bushman
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for automatic routing for reentrant processes
- Patent number 6,529,789
- Issue date Mar 4, 2003
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for running metrology standard wafer routes fo...
- Patent number 6,484,064
- Issue date Nov 19, 2002
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for filling trenches
- Patent number 6,454,899
- Issue date Sep 24, 2002
- Advanced Micro Devices, Inc.
- William J. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for varying nitride strip makeup process based on field oxid...
- Patent number 6,376,261
- Issue date Apr 23, 2002
- Advanced Micro Devices Inc.
- William Jarrett Campbell
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for automatic routing for reentrant process
- Patent number 6,360,133
- Issue date Mar 19, 2002
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of controlling feature dimensions based upon etch chemistry...
- Patent number 6,352,867
- Issue date Mar 5, 2002
- Advanced Micro Devices, Inc.
- Terri A. Couteau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining a polishing recipe based upon the measured p...
- Patent number 6,350,179
- Issue date Feb 26, 2002
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- B24 - GRINDING POLISHING
Information Patent Grant
Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization
- Patent number 6,324,341
- Issue date Nov 27, 2001
- Advanced Micro Devices, Inc.
- Terrence J. Riley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for filling trenches
- Patent number 6,284,622
- Issue date Sep 4, 2001
- Advanced Micro Devices, Inc.
- William J. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling an etching process of multiple layers based upon thickn...
- Patent number 6,265,304
- Issue date Jul 24, 2001
- Advanced Micron Devices, Inc.
- William Jarrett Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for automated rework within run-to-run control...
- Patent number 6,248,602
- Issue date Jun 19, 2001
- AMD, Inc.
- Christopher A. Bode
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for controlling the manufacture of discrete parts...
- Patent number 6,230,069
- Issue date May 8, 2001
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for characterizing polish pad lots to eliminate or reduce to...
- Patent number 6,217,412
- Issue date Apr 17, 2001
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- B24 - GRINDING POLISHING
Information Patent Grant
Method for determining a polishing recipe based upon the measured p...
- Patent number 6,213,848
- Issue date Apr 10, 2001
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- B24 - GRINDING POLISHING
Information Patent Grant
Method for providing cooperative run-to-run control for multi-produ...
- Patent number 6,197,604
- Issue date Mar 6, 2001
- Advanced Micro Devices, Inc.
- Michael Lee Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for controlling a multi-arm polishing tool
- Patent number 6,171,174
- Issue date Jan 9, 2001
- Advanced Micro Devices
- William Jarrett Campbell
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Patents Applicationslast 30 patents

Information Patent Application
Run-to-run control method for proportional-integral-derivative (PID...
- Publication number 20020107604
- Publication date Aug 8, 2002
- Terrence J. Riley
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for adjusting rapid thermal processing (RTP) recipe setpoint...
- Publication number 20020095278
- Publication date Jul 18, 2002
- Terrence J. Riley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for controlling wafer thickness uniformity in...
- Publication number 20020085212
- Publication date Jul 4, 2002
- William Jarrett Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for determining a polishing recipe based upon the measured p...
- Publication number 20010000773
- Publication date May 3, 2001
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- B24 - GRINDING POLISHING

William Jarrett Campbell

Person

Patents Grantslast 30 patents

Method for adjusting rapid thermal processing (RTP) recipe setpoint...

Method and apparatus for controlling wafer thickness uniformity in...

Run-to-run control method for proportional-integral-derivative (PID...

Method and apparatus for run-to-run control of deposition process

Method and apparatus for performing run-to-run control in a batch m...

Method and apparatus for controlling wafer uniformity in a chemical...

Method and apparatus for monitoring consumable performance

Method and apparatus for monitoring controller performance using st...

Method and apparatus for interfacing a statistical process control...

Method for adjusting incoming film thickness uniformity such that v...

Method and apparatus for automatic routing for reentrant processes

Method and apparatus for running metrology standard wafer routes fo...

Apparatus for filling trenches

Method for varying nitride strip makeup process based on field oxid...

Method and apparatus for automatic routing for reentrant process

Method of controlling feature dimensions based upon etch chemistry...

Method for determining a polishing recipe based upon the measured p...

Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization

Method for filling trenches

Controlling an etching process of multiple layers based upon thickn...

Method and apparatus for automated rework within run-to-run control...

System and method for controlling the manufacture of discrete parts...

Method for characterizing polish pad lots to eliminate or reduce to...

Method for determining a polishing recipe based upon the measured p...

Method for providing cooperative run-to-run control for multi-produ...

System and method for controlling a multi-arm polishing tool

Patents Applicationslast 30 patents

Run-to-run control method for proportional-integral-derivative (PID...

Method for adjusting rapid thermal processing (RTP) recipe setpoint...

Method and apparatus for controlling wafer thickness uniformity in...

Method for determining a polishing recipe based upon the measured p...