William Knauer

Person

Portage, OH, US

People

Patents Grantslast 30 patents

Information Patent Grant
DC-AC probe card topology
- Patent number 8,717,053
- Issue date May 6, 2014
- Keithley Instruments, Inc.
- Wayne C. Goeke
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-low current printed circuit board
- Patent number 8,507,802
- Issue date Aug 13, 2013
- Keithley Instruments, Inc.
- William Knauer
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Dual shielded relay
- Patent number 7,920,038
- Issue date Apr 5, 2011
- Keithley Instruments, Inc.
- William Knauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
AC low current probe card
- Patent number 7,855,544
- Issue date Dec 21, 2010
- Keithley Instruments, Inc.
- William Knauer
- G01 - MEASURING TESTING
Information Patent Grant
Instrument per pin test head
- Patent number 7,683,647
- Issue date Mar 23, 2010
- Keithley Instruments, Inc.
- Carl Scharrer
- G01 - MEASURING TESTING
Information Patent Grant
Spatial transformer for RF and low current interconnect
- Patent number 7,425,837
- Issue date Sep 16, 2008
- Keithley Instruments, Inc.
- William Knauer
- G01 - MEASURING TESTING
Information Patent Grant
Measurement bias tee
- Patent number 7,342,401
- Issue date Mar 11, 2008
- Keithley Instruments, Inc.
- William Knauer
- G01 - MEASURING TESTING
Information Patent Grant
High frequency RF interconnect for semiconductor automatic test equ...
- Patent number 6,900,649
- Issue date May 31, 2005
- Keithley Instruments, Inc.
- William Knauer
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor probe card for low current measurements
- Patent number 5,808,475
- Issue date Sep 15, 1998
- Keithley Instruments, Inc.
- William Knauer
- G01 - MEASURING TESTING
Information Patent Grant
Relay matrix switching assembly
- Patent number 5,644,115
- Issue date Jul 1, 1997
- Keithley Instruments, Inc.
- William Knauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual shielded relay reed pack
- Patent number 5,559,482
- Issue date Sep 24, 1996
- Keithley Instruments, Inc.
- Robert R. Close
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DC-AC PROBE CARD TOPOLOGY
- Publication number 20130113511
- Publication date May 9, 2013
- KEITHLEY INSTRUMENTS, INC.
- Wayne C. Goeke
- G01 - MEASURING TESTING
Information Patent Application
Spatial transformer for RF and low current interconnect
- Publication number 20070268030
- Publication date Nov 22, 2007
- William Knauer
- G01 - MEASURING TESTING
Information Patent Application
Measurement bias tee
- Publication number 20070007972
- Publication date Jan 11, 2007
- William Knauer
- G01 - MEASURING TESTING

William Knauer

Person

Patents Grantslast 30 patents

DC-AC probe card topology

Ultra-low current printed circuit board

Dual shielded relay

AC low current probe card

Instrument per pin test head

Spatial transformer for RF and low current interconnect

Measurement bias tee

High frequency RF interconnect for semiconductor automatic test equ...

Semiconductor probe card for low current measurements

Relay matrix switching assembly

Dual shielded relay reed pack

Patents Applicationslast 30 patents

DC-AC PROBE CARD TOPOLOGY

Spatial transformer for RF and low current interconnect

Measurement bias tee