William Q. Law

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for probe equalization
- Patent number 9,772,391
- Issue date Sep 26, 2017
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for probing
- Patent number 8,067,718
- Issue date Nov 29, 2011
- Tektronix, Inc.
- Robert A. Nordstrom
- G01 - MEASURING TESTING
Information Patent Grant
Wide bandwidth attenuator input circuit for a measurement probe
- Patent number 7,550,962
- Issue date Jun 23, 2009
- Tektronix, Inc.
- Ira G. Pollock
- G01 - MEASURING TESTING
Information Patent Grant
Variable attenuation signal acquisition probing and voltage measure...
- Patent number 7,424,177
- Issue date Sep 9, 2008
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Grant
Wide bandwidth attenuator input circuit for a measurement probe
- Patent number 7,402,991
- Issue date Jul 22, 2008
- Tektronix, Inc.
- Ira G. Pollock
- G01 - MEASURING TESTING
Information Patent Grant
Variable attenuation signal acquisition probing and voltage measure...
- Patent number 7,310,455
- Issue date Dec 18, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Grant
Wide bandwidth attenuator input circuit for a measurement probe
- Patent number 7,256,575
- Issue date Aug 14, 2007
- Tektronix, Inc.
- Ira G. Pollock
- G01 - MEASURING TESTING
Information Patent Grant
Micro-cavity laser having increased sensitivity
- Patent number 7,251,265
- Issue date Jul 31, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal acquisition probing and voltage measurement systems using an...
- Patent number 7,221,813
- Issue date May 22, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition probing system using a micro-cavity laser
- Patent number 7,187,187
- Issue date Mar 6, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Grant
Attachable/detachable probing tip system for a measurement probing...
- Patent number 7,056,134
- Issue date Jun 6, 2006
- Tektronix, Inc.
- Jim L. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition probing system using a micro-cavity laser capabl...
- Patent number 7,049,843
- Issue date May 23, 2006
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Grant
Measurement test instrument and associated voltage management syste...
- Patent number 6,829,547
- Issue date Dec 7, 2004
- Tektronix, Inc.
- William Q. Law
- G01 - MEASURING TESTING
Information Patent Grant
Measurement test instrument and associated voltage management syste...
- Patent number 6,629,048
- Issue date Sep 30, 2003
- Tektronix, Inc.
- William Q. Law
- G01 - MEASURING TESTING
Information Patent Grant
Adapter usable with an electronic interconnect for high speed signa...
- Patent number 6,402,549
- Issue date Jun 11, 2002
- Tektronix, Inc.
- Daniel J. Ayres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable spacing probe tip adapter for a measurement probe
- Patent number 6,404,215
- Issue date Jun 11, 2002
- Tektronix, Inc.
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Grant
Electronic interconnect device for high speed signal and data trans...
- Patent number 6,402,565
- Issue date Jun 11, 2002
- Tektronix, Inc.
- William R. Pooley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Keyed electronic interconnect device for high speed signal and data...
- Patent number 6,383,031
- Issue date May 7, 2002
- Tektronix, Inc.
- William Q. Law
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adapter usable with an electronic interconnect for high speed signa...
- Patent number 6,379,183
- Issue date Apr 30, 2002
- Tektronix, Inc.
- Daniel J. Ayres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control circuit for a delayed sweep oscilloscope
- Patent number 4,593,242
- Issue date Jun 3, 1986
- Tektronix, Inc.
- L. Rodney Bristol
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PROBE EQUALIZATION
- Publication number 20150212185
- Publication date Jul 30, 2015
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for probing
- Publication number 20070257025
- Publication date Nov 8, 2007
- Robert A. Nordstrom
- G01 - MEASURING TESTING
Information Patent Application
Wide Bandwidth Attenuator Input Circuit for a Measurement Probe
- Publication number 20070164730
- Publication date Jul 19, 2007
- Ira G. Pollock
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Wide Bandwidth Attenuator Input Circuit for a Measurement Probe
- Publication number 20070164731
- Publication date Jul 19, 2007
- Ira G. Pollock
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Variable Attenuation Signal Acquisition Probing and Voltage Measure...
- Publication number 20070154131
- Publication date Jul 5, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Application
Wide bandwidth attenuator input circuit for a measurement probe
- Publication number 20060284681
- Publication date Dec 21, 2006
- Ira G. Pollock
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Attachable/detachable probing tip system for a measurement probing...
- Publication number 20050266733
- Publication date Dec 1, 2005
- Jim L. Martin
- G01 - MEASURING TESTING
Information Patent Application
Variable attenuation signal acquisition probing and voltage measure...
- Publication number 20050201658
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Application
Conductive electrode structure for an electro-optic material
- Publication number 20050201684
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Application
Micro-cavity laser having increased sensitivity
- Publication number 20050201425
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Signal acquisition probing system using a micro-cavity laser
- Publication number 20050200371
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Application
Signal acquisition probing system using a micro-cavity laser capabl...
- Publication number 20050200373
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Application
Optical cavity having increased sensitivity
- Publication number 20050201685
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Application
Signal acquisition probing and voltage measurement systems using an...
- Publication number 20050200362
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Application
Measurement test instrument and associated voltage management syste...
- Publication number 20030204342
- Publication date Oct 30, 2003
- William Q. Law
- G01 - MEASURING TESTING

William Q. Law

Person

Patents Grantslast 30 patents

Method for probe equalization

Method and apparatus for probing

Wide bandwidth attenuator input circuit for a measurement probe

Variable attenuation signal acquisition probing and voltage measure...

Wide bandwidth attenuator input circuit for a measurement probe

Variable attenuation signal acquisition probing and voltage measure...

Wide bandwidth attenuator input circuit for a measurement probe

Micro-cavity laser having increased sensitivity

Signal acquisition probing and voltage measurement systems using an...

Signal acquisition probing system using a micro-cavity laser

Attachable/detachable probing tip system for a measurement probing...

Signal acquisition probing system using a micro-cavity laser capabl...

Measurement test instrument and associated voltage management syste...

Measurement test instrument and associated voltage management syste...

Adapter usable with an electronic interconnect for high speed signa...

Variable spacing probe tip adapter for a measurement probe

Electronic interconnect device for high speed signal and data trans...

Keyed electronic interconnect device for high speed signal and data...

Adapter usable with an electronic interconnect for high speed signa...

Control circuit for a delayed sweep oscilloscope

Patents Applicationslast 30 patents

METHOD FOR PROBE EQUALIZATION

Method and apparatus for probing

Wide Bandwidth Attenuator Input Circuit for a Measurement Probe

Wide Bandwidth Attenuator Input Circuit for a Measurement Probe

Variable Attenuation Signal Acquisition Probing and Voltage Measure...

Wide bandwidth attenuator input circuit for a measurement probe

Attachable/detachable probing tip system for a measurement probing...

Variable attenuation signal acquisition probing and voltage measure...

Conductive electrode structure for an electro-optic material

Micro-cavity laser having increased sensitivity

Signal acquisition probing system using a micro-cavity laser

Signal acquisition probing system using a micro-cavity laser capabl...

Optical cavity having increased sensitivity

Signal acquisition probing and voltage measurement systems using an...

Measurement test instrument and associated voltage management syste...