William R. Pooley

Person

Aloha, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for probe tip contact
- Patent number 7,161,366
- Issue date Jan 9, 2007
- Tektronix, Inc.
- Geoffrey Herrick
- G01 - MEASURING TESTING
Information Patent Grant
Attachable/detachable probing tip system for a measurement probing...
- Patent number 7,056,134
- Issue date Jun 6, 2006
- Tektronix, Inc.
- Jim L. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Hand-held probing adapter for a measurement probing system
- Patent number 7,017,435
- Issue date Mar 28, 2006
- Tektronix, Inc.
- William R. Pooley
- G01 - MEASURING TESTING
Information Patent Grant
Attachable/detachable variable spacing probing tip system
- Patent number 6,967,473
- Issue date Nov 22, 2005
- Tektronix, Inc.
- Gary W. Reed
- G01 - MEASURING TESTING
Information Patent Grant
BMA interconnect adapter
- Patent number 6,468,100
- Issue date Oct 22, 2002
- Tektronix, Inc.
- Daniel B. Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adapter usable with an electronic interconnect for high speed signa...
- Patent number 6,402,549
- Issue date Jun 11, 2002
- Tektronix, Inc.
- Daniel J. Ayres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic interconnect device for high speed signal and data trans...
- Patent number 6,402,565
- Issue date Jun 11, 2002
- Tektronix, Inc.
- William R. Pooley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Keyed electronic interconnect device for high speed signal and data...
- Patent number 6,383,031
- Issue date May 7, 2002
- Tektronix, Inc.
- William Q. Law
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument with multiple position support handle
- Patent number 6,170,695
- Issue date Jan 9, 2001
- Tektronix, Inc.
- Preston S. Gabel
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Electronic instrument with multiple position spring detented handle
- Patent number 6,140,812
- Issue date Oct 31, 2000
- Tektronix, Inc.
- Brian G. Russell
- G01 - MEASURING TESTING
Information Patent Grant
Electronic test and measurement instrument
- Patent number D413823
- Issue date Sep 14, 1999
- Tektronix, Inc.
- Kenneth P. Dobyns
- D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for probe tip contact
- Publication number 20060103400
- Publication date May 18, 2006
- Geoffrey Herrick
- G01 - MEASURING TESTING
Information Patent Application
Attachable/detachable probing tip system for a measurement probing...
- Publication number 20050266733
- Publication date Dec 1, 2005
- Jim L. Martin
- G01 - MEASURING TESTING
Information Patent Application
Hand-held probing adapter for a measurement probing system
- Publication number 20050262953
- Publication date Dec 1, 2005
- William R. Pooley
- G01 - MEASURING TESTING
Information Patent Application
ATTACHABLE/DETACHABLE VARIABLE SPACING PROBING TIP SYSTEM
- Publication number 20050264276
- Publication date Dec 1, 2005
- Gary W. Reed
- G01 - MEASURING TESTING

William R. Pooley

Person

Patents Grantslast 30 patents

Method and apparatus for probe tip contact

Attachable/detachable probing tip system for a measurement probing...

Hand-held probing adapter for a measurement probing system

Attachable/detachable variable spacing probing tip system

BMA interconnect adapter

Adapter usable with an electronic interconnect for high speed signa...

Electronic interconnect device for high speed signal and data trans...

Keyed electronic interconnect device for high speed signal and data...

Instrument with multiple position support handle

Electronic instrument with multiple position spring detented handle

Electronic test and measurement instrument

Patents Applicationslast 30 patents

Method and apparatus for probe tip contact

Attachable/detachable probing tip system for a measurement probing...

Hand-held probing adapter for a measurement probing system

ATTACHABLE/DETACHABLE VARIABLE SPACING PROBING TIP SYSTEM