William Ralph Knowles

Person

Newbury, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Particle optical apparatus with a predetermined final vacuum pressure
- Patent number 9,153,414
- Issue date Oct 6, 2015
- FEI Company
- Hendrik Nicolaas Slingerland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High pressure charged particle beam system
- Patent number 8,921,811
- Issue date Dec 30, 2014
- FEI Company
- Milos Toth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope using gas amplification
- Patent number 8,299,432
- Issue date Oct 30, 2012
- FEI Company
- Milos Toth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multistage gas cascade amplifier
- Patent number 7,791,020
- Issue date Sep 7, 2010
- FEI Company
- Marek Uncovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical apparatus for simultaneous observing a sample with...
- Patent number 7,718,979
- Issue date May 18, 2010
- FEI Company
- William Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for charged particle beam instrument
- Patent number 7,541,580
- Issue date Jun 2, 2009
- FEI Company
- William Ralph Knowles
- G01 - MEASURING TESTING
Information Patent Grant
Particle-optical device and detection means
- Patent number 6,972,412
- Issue date Dec 6, 2005
- FEI Company
- Jacob Johannes Scholtz
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH PRESSURE CHARGED PARTICLE BEAM SYSTEM
- Publication number 20110031394
- Publication date Feb 10, 2011
- FEI Company
- William Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION
- Publication number 20100108881
- Publication date May 6, 2010
- FEI Company
- MILOS TOTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTISTAGE GAS CASCADE AMPLIFIER
- Publication number 20090242758
- Publication date Oct 1, 2009
- FEI Company
- MAREK UNCOVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL APPARATUS FOR SIMULTANEOUS OBSERVING A SAMPLE WITH...
- Publication number 20080185509
- Publication date Aug 7, 2008
- FEI Company
- William Ralph Knowles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector for charged particle beam instrument
- Publication number 20080035861
- Publication date Feb 14, 2008
- FEI Company
- William Ralph Knowles
- G01 - MEASURING TESTING
Information Patent Application
Particle optical apparatus with a predetermined final vacuum pressure
- Publication number 20070176102
- Publication date Aug 2, 2007
- FEI Company
- Hendrik Nicolaas Slingerland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-optical device and detection means
- Publication number 20040124356
- Publication date Jul 1, 2004
- Jacob Johannes Scholtz
- H01 - BASIC ELECTRIC ELEMENTS

William Ralph Knowles

Person

Patents Grantslast 30 patents

Particle optical apparatus with a predetermined final vacuum pressure

High pressure charged particle beam system

Scanning transmission electron microscope using gas amplification

Multistage gas cascade amplifier

Particle-optical apparatus for simultaneous observing a sample with...

Detector for charged particle beam instrument

Particle-optical device and detection means

Patents Applicationslast 30 patents

HIGH PRESSURE CHARGED PARTICLE BEAM SYSTEM

SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION

MULTISTAGE GAS CASCADE AMPLIFIER

PARTICLE-OPTICAL APPARATUS FOR SIMULTANEOUS OBSERVING A SAMPLE WITH...

Detector for charged particle beam instrument

Particle optical apparatus with a predetermined final vacuum pressure

Particle-optical device and detection means