William Stewart McKnight

Person

Hamilton, OH, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for eddy current inspection of parts with complex...
- Patent number 8,269,489
- Issue date Sep 18, 2012
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a component
- Patent number 8,013,599
- Issue date Sep 6, 2011
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspection of parts with an eddy current probe
- Patent number 7,994,780
- Issue date Aug 9, 2011
- General Electric Company
- Haiyan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Flexible eddy current array probe and methods of assembling the same
- Patent number 7,952,348
- Issue date May 31, 2011
- General Electric Company
- Haiyan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Surface flaw detection system to facilitate nondestructive inspecti...
- Patent number 7,888,932
- Issue date Feb 15, 2011
- General Electric Company
- William Stewart McKnight
- G01 - MEASURING TESTING
Information Patent Grant
Multi-frequency image processing for inspecting parts having comple...
- Patent number 7,817,845
- Issue date Oct 19, 2010
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a component
- Patent number 7,689,030
- Issue date Mar 30, 2010
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a component
- Patent number 7,436,992
- Issue date Oct 14, 2008
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Method for performing model based scanplan generation of a componen...
- Patent number 7,337,651
- Issue date Mar 4, 2008
- General Electric Company
- Suneel Tumkur Shankarappa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and system using multifrequency phase analysis
- Patent number 7,206,706
- Issue date Apr 17, 2007
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current probe and inspection method
- Patent number 7,154,265
- Issue date Dec 26, 2006
- General Electric Company
- Mottito Togo
- G01 - MEASURING TESTING
Information Patent Grant
Omnidirectional eddy current probe and inspection system
- Patent number 7,015,690
- Issue date Mar 21, 2006
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Grant
Molded eddy current array probe
- Patent number 6,812,697
- Issue date Nov 2, 2004
- General Electric Company
- William Stewart McKnight
- G01 - MEASURING TESTING
Information Patent Grant
Method and inspection standard for eddy current inspection
- Patent number 6,696,830
- Issue date Feb 24, 2004
- General Electric Company
- Dominick A. Casarcia
- G01 - MEASURING TESTING
Information Patent Grant
Stylus type touch probe system
- Patent number 4,562,392
- Issue date Dec 31, 1985
- General Electric Company
- Richard K. Davis
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR COMPENSATION OF RESPONSES FROM EDDY CURRENT PROBES
- Publication number 20110004452
- Publication date Jan 6, 2011
- Sanghamithra Korukonda
- G01 - MEASURING TESTING
Information Patent Application
PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTI...
- Publication number 20100312494
- Publication date Dec 9, 2010
- Sanghamithra Korukonda
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION OF PARTS WITH COMPLEX GEOMETRIES
- Publication number 20100127699
- Publication date May 27, 2010
- GENERAL ELECTRIC COMPANY
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE EDDY CURRENT ARRAY PROBE AND METHODS OF ASSEMBLING THE SAME
- Publication number 20090115411
- Publication date May 7, 2009
- Haiyan Sun
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT PROBE AND METHODS OF ASSEMBLING THE SAME
- Publication number 20090115410
- Publication date May 7, 2009
- William Stewart McKnight
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION OF PARTS
- Publication number 20090072822
- Publication date Mar 19, 2009
- GENERAL ELECTRIC COMPANY
- Haiyan Sun
- G01 - MEASURING TESTING
Information Patent Application
MULTI-FREQUENCY IMAGE PROCESSING FOR INSPECTING PARTS HAVING COMPLE...
- Publication number 20080159619
- Publication date Jul 3, 2008
- GENERAL ELECTRIC COMPANY
- Ui Won SUH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS
- Publication number 20070222439
- Publication date Sep 27, 2007
- GENERAL ELECTRIC COMPANY
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20070140546
- Publication date Jun 21, 2007
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Method for performing model based scanplan generation of a componen...
- Publication number 20060224348
- Publication date Oct 5, 2006
- General Electric Company
- Suneel Tumkur Shankarappa
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and system using multifrequency phase analysis
- Publication number 20060217908
- Publication date Sep 28, 2006
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Eddy current array probes with enhanced drive fields
- Publication number 20060132123
- Publication date Jun 22, 2006
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Eddy current probe and inspection method
- Publication number 20060132124
- Publication date Jun 22, 2006
- General Electric Company
- Mottito Togo
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20060109001
- Publication date May 25, 2006
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20060023961
- Publication date Feb 2, 2006
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Omnidirectional eddy current probe and inspection system
- Publication number 20050264284
- Publication date Dec 1, 2005
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Molded eddy current array probe
- Publication number 20040056656
- Publication date Mar 25, 2004
- General Electric Company
- William Stewart McKnight
- G01 - MEASURING TESTING
Information Patent Application
Method and inspection standard for eddy current inspection
- Publication number 20030146745
- Publication date Aug 7, 2003
- Dominick A. Casarcia
- G01 - MEASURING TESTING

William Stewart McKnight

Person

Patents Grantslast 30 patents

System and method for eddy current inspection of parts with complex...

Methods and apparatus for testing a component

System and method for inspection of parts with an eddy current probe

Flexible eddy current array probe and methods of assembling the same

Surface flaw detection system to facilitate nondestructive inspecti...

Multi-frequency image processing for inspecting parts having comple...

Methods and apparatus for testing a component

Methods and apparatus for testing a component

Method for performing model based scanplan generation of a componen...

Inspection method and system using multifrequency phase analysis

Eddy current probe and inspection method

Omnidirectional eddy current probe and inspection system

Molded eddy current array probe

Method and inspection standard for eddy current inspection

Stylus type touch probe system

Patents Applicationslast 30 patents

METHOD FOR COMPENSATION OF RESPONSES FROM EDDY CURRENT PROBES

PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTI...

SYSTEM AND METHOD FOR INSPECTION OF PARTS WITH COMPLEX GEOMETRIES

FLEXIBLE EDDY CURRENT ARRAY PROBE AND METHODS OF ASSEMBLING THE SAME

EDDY CURRENT PROBE AND METHODS OF ASSEMBLING THE SAME

SYSTEM AND METHOD FOR INSPECTION OF PARTS

MULTI-FREQUENCY IMAGE PROCESSING FOR INSPECTING PARTS HAVING COMPLE...

EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS

Methods and apparatus for testing a component

Method for performing model based scanplan generation of a componen...

Inspection method and system using multifrequency phase analysis

Eddy current array probes with enhanced drive fields

Eddy current probe and inspection method

Methods and apparatus for testing a component

Methods and apparatus for testing a component

Omnidirectional eddy current probe and inspection system

Molded eddy current array probe

Method and inspection standard for eddy current inspection