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Winfried Denk
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Heidelberg, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for image processing
Patent number
9,799,098
Issue date
Oct 24, 2017
Massachusetts Institute of Technology
H. Sebastian Seung
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for wave-front sensing
Patent number
7,659,993
Issue date
Feb 9, 2010
Max-Planck-Gesellschaft zur Forderung der Wissenschaften E.V.
Marcus Feierabend
G01 - MEASURING TESTING
Information
Patent Grant
System and method for optical scanning
Patent number
6,977,733
Issue date
Dec 20, 2005
Lucent Technologies Inc.
Winfried Denk
G02 - OPTICS
Information
Patent Grant
System and method for optical scanning
Patent number
6,967,725
Issue date
Nov 22, 2005
Lucent Technologies Inc.
Winfried Denk
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR IMAGE PROCESSING
Publication number
20100183217
Publication date
Jul 22, 2010
H. Sebastian Seung
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Optimized Determination of Voltage Changes Using a Voltage-Sensitiv...
Publication number
20080122428
Publication date
May 29, 2008
Max-Planck-Gesellschaft zur Forderungder Wissenschaften e. V.
Bernd Kuhn
G01 - MEASURING TESTING
Information
Patent Application
Method and device for wave-front sensing
Publication number
20060033933
Publication date
Feb 16, 2006
Marcus Feierabend
G01 - MEASURING TESTING
Information
Patent Application
System and method for optical scanning
Publication number
20050122530
Publication date
Jun 9, 2005
Winfried Denk
G02 - OPTICS
Information
Patent Application
Optical microscope comprising a displaceable objective
Publication number
20050007660
Publication date
Jan 13, 2005
Winfried Denk
G02 - OPTICS
Information
Patent Application
System and method for optical scanning
Publication number
20020080359
Publication date
Jun 27, 2002
Winfried Denk
G02 - OPTICS