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Wolfgang Ruf
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Friedberg, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for testing a memory chip using a common node...
Patent number
7,877,649
Issue date
Jan 25, 2011
Qimonda AG
Joerg Kliewer
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor memory device with temperature control
Patent number
7,760,569
Issue date
Jul 20, 2010
Qimonda AG
Wolfgang Ruf
G11 - INFORMATION STORAGE
Information
Patent Grant
Test method, integrated circuit and test system
Patent number
7,757,145
Issue date
Jul 13, 2010
Qimonda AG
Wolfgang Ruf
G11 - INFORMATION STORAGE
Information
Patent Grant
Integrated device for simplified parallel testing, test board for t...
Patent number
7,752,510
Issue date
Jul 6, 2010
Qimonda AG
Manfred Proell
G01 - MEASURING TESTING
Information
Patent Grant
Testing a data store using an external test unit for generating tes...
Patent number
7,428,662
Issue date
Sep 23, 2008
Infineon Technologies AG
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Grant
Circuit arrangement and method for driving electronic chips
Patent number
7,426,669
Issue date
Sep 16, 2008
Infineon Technologies AG
Björn Flach
G11 - INFORMATION STORAGE
Information
Patent Grant
Insertable calibration device
Patent number
7,414,421
Issue date
Aug 19, 2008
Infineon Technologies AG
Björn Flach
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor component, arrangement and method for characterizing...
Patent number
7,360,139
Issue date
Apr 15, 2008
Infineon Technologies AG
Andreas Logisch
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory system for network broadcasting applications and method for...
Patent number
7,305,525
Issue date
Dec 4, 2007
Infineon Technologies, AG
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Grant
Backwards-compatible memory module
Patent number
7,221,617
Issue date
May 22, 2007
Infineon Technologies AG
Bjorn Flach
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for replacing defective memory cells in data processing appa...
Patent number
7,065,687
Issue date
Jun 20, 2006
Infineon Technologies AG
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for testing a device and a test configuration including a de...
Patent number
6,895,538
Issue date
May 17, 2005
Infineon Technologies AG
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for testing semiconductor circuit devices
Patent number
6,876,217
Issue date
Apr 5, 2005
Infineon Technologies AG
Stefan Dankowski
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for classifying components
Patent number
6,829,554
Issue date
Dec 7, 2004
Infineon Technologies AG
Reinhard Dueregger
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for storing data in a memory device with the possibility of...
Patent number
6,819,606
Issue date
Nov 16, 2004
Infineon Technologies AG
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Grant
Interconnect structure for an integrated circuit and corresponding...
Patent number
6,806,121
Issue date
Oct 19, 2004
Infineon Technologies AG
Alexander Benedix
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and magazine device for testing semiconductor devices
Patent number
6,777,924
Issue date
Aug 17, 2004
Infineon Technologies AG
Björn Flach
G01 - MEASURING TESTING
Information
Patent Grant
Method for integrating imperfect semiconductor memory devices in da...
Patent number
6,762,965
Issue date
Jul 13, 2004
Infineon Technologies AG
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Grant
Dynamic memory device and method for controlling such a device
Patent number
6,738,304
Issue date
May 18, 2004
Infineon Technologies AG
Alexander Benedix
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
Publication number
20090085596
Publication date
Apr 2, 2009
QIMONDA AG
Wolfgang Ruf
G01 - MEASURING TESTING
Information
Patent Application
Test Method and Production Method for a Semiconductor Circuit Compo...
Publication number
20090051383
Publication date
Feb 26, 2009
QIMONDA AG
Wolfgang Ruf
G01 - MEASURING TESTING
Information
Patent Application
Test method, integrated circuit and test system
Publication number
20080288835
Publication date
Nov 20, 2008
Qimonda AG
Wolfgang Ruf
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor Memory Device with Temperature Control
Publication number
20080247252
Publication date
Oct 9, 2008
Qimonda AG
Wolfgang Ruf
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD AND APPARATUS FOR TESTING A MEMORY CHIP
Publication number
20080141075
Publication date
Jun 12, 2008
Joerg Kliewer
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY CIRCUIT AND METHOD FOR REFRESHING DYNAMIC MEMORY CELLS
Publication number
20070258307
Publication date
Nov 8, 2007
Manfred Proell
G11 - INFORMATION STORAGE
Information
Patent Application
INTEGRATED DEVICE FOR SIMPLIFIED PARALLEL TESTING, TEST BOARD FOR T...
Publication number
20070226591
Publication date
Sep 27, 2007
Manfred Proell
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor component, arrangement and method for characterizing...
Publication number
20060156149
Publication date
Jul 13, 2006
Andreas Logisch
G11 - INFORMATION STORAGE
Information
Patent Application
Insertable calibration device
Publication number
20060149491
Publication date
Jul 6, 2006
Infineon Technologies AG
Bjorn Flach
G01 - MEASURING TESTING
Information
Patent Application
Backwards-compatible memory module
Publication number
20050270891
Publication date
Dec 8, 2005
Bjorn Flach
G11 - INFORMATION STORAGE
Information
Patent Application
Memory system for network broadcasting applications and method for...
Publication number
20050248994
Publication date
Nov 10, 2005
Alexander Benedix
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Circuit arrangement and method for driving electronic chips
Publication number
20050138491
Publication date
Jun 23, 2005
Infineon Technologies AG
Bjorn Flach
G01 - MEASURING TESTING
Information
Patent Application
Test arrangement and method for selecting a test mode output channel
Publication number
20050055618
Publication date
Mar 10, 2005
Thomas Finteis
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Test method for testing a data memory
Publication number
20040151037
Publication date
Aug 5, 2004
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Application
Method for testing a device and a test configuration including a de...
Publication number
20040015313
Publication date
Jan 22, 2004
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Application
Method and magazine device for testing semiconductor devices
Publication number
20030173950
Publication date
Sep 18, 2003
Bjorn Flach
G01 - MEASURING TESTING
Information
Patent Application
Method for storing data in a memory device with the possibility of...
Publication number
20030160288
Publication date
Aug 28, 2003
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Application
Interconnect structure for an integrated circuit and corresponding...
Publication number
20030098467
Publication date
May 29, 2003
Alexander Benedix
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Dynamic memory device and method for controlling such a device
Publication number
20030086311
Publication date
May 8, 2003
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Application
Method for testing semiconductor circuit devices
Publication number
20030071649
Publication date
Apr 17, 2003
Stefan Dankowski
G11 - INFORMATION STORAGE
Information
Patent Application
Method for classifying components
Publication number
20030069726
Publication date
Apr 10, 2003
Reinhard Dueregger
G11 - INFORMATION STORAGE
Information
Patent Application
Method for replacing defective memory cells in data processing appa...
Publication number
20030061532
Publication date
Mar 27, 2003
Alexander Benedix
G11 - INFORMATION STORAGE
Information
Patent Application
Method for integrating imperfect semiconductor memory devices in da...
Publication number
20030058711
Publication date
Mar 27, 2003
Alexander Benedix
G11 - INFORMATION STORAGE