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Wonder D. Wang
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Hsinchu, TW
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last 30 patents
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Patent Grant
Method for preparing semiconductor chip as SEM specimen
Patent number
5,747,365
Issue date
May 5, 1998
Taiwan Semiconductor Manufacturing Company, Ltd.
Wonder D. Wang
G01 - MEASURING TESTING
Information
Patent Grant
Thin film sampler for film composition quantitative analysis
Patent number
5,325,730
Issue date
Jul 5, 1994
Taiwan Semiconductor Manufacturing Company
Wonder D. Wang
G01 - MEASURING TESTING
Information
Patent Grant
Thin film sampling method for film composition quantitative analysis
Patent number
5,248,614
Issue date
Sep 28, 1993
Taiwan Semiconductor Manufacturing Company
Wonder D. Wang
G01 - MEASURING TESTING