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Patents Grants
last 30 patents
Information
Patent Grant
Three-dimensional dynamic adjustment and locking mechanism
Patent number
11,175,472
Issue date
Nov 16, 2021
The Institute of Optics and Electronics, The Chinese Academy of Sciences
Xianchang Zhu
G02 - OPTICS
Information
Patent Grant
Method for detecting focal plane based on grating talbot effect
Patent number
10,025,205
Issue date
Jul 17, 2018
The Institute of Optics and Electronics
Xianchang Zhu
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for detecting focus plane based on Hartmann wavefront detect...
Patent number
9,400,220
Issue date
Jul 26, 2016
The Institute of Optics and Electronics, The Chinese Academy of Sciences
Xianchang Zhu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SINGLE-POINT DRIVEN AXIAL ADJUSTMENT MECHANISM
Publication number
20210011245
Publication date
Jan 14, 2021
The Institute of Optics and Electronics, The Chinese Academy of Sciences
Xianchang ZHU
G02 - OPTICS
Information
Patent Application
Three-Dimensional Dynamic Adjustment And Locking Mechanism
Publication number
20210003804
Publication date
Jan 7, 2021
The Institute of Optics and Electronics, The Chinese Academy of Sciences
Xianchang ZHU
G02 - OPTICS
Information
Patent Application
HORIZONTAL PRECISION ADJUSTMENT AND LOCKING DEVICE
Publication number
20190302390
Publication date
Oct 3, 2019
The Institute of Optics and Electronics, The Chinese Academy of Sciences
Xianchang ZHU
G02 - OPTICS
Information
Patent Application
METHOD FOR DETECTING FOCAL PLANE BASED ON GRATING TALBOT EFFECT
Publication number
20160091372
Publication date
Mar 31, 2016
The Institute of Optics and Electronics, The Chinese Academy of Sciences
Xianchang ZHU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING FOCUS PLANE BASED ON HARTMANN WAVEFRONT DETECT...
Publication number
20160084714
Publication date
Mar 24, 2016
The Institute of Optics and Electronics, The Chinese Academy of Sciences
Xianchang ZHU
G01 - MEASURING TESTING