Xianhe FENG

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Chongqing, China, CN

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction device and method for non-destructive testing of intern...
- Patent number 11,846,595
- Issue date Dec 19, 2023
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...
- Publication number 20220412901
- Publication date Dec 29, 2022
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin ZHENG
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTION DEVICE AND METHOD FOR NON-DESTRUCTIVE TESTING OF INTERN...
- Publication number 20220074877
- Publication date Mar 10, 2022
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin ZHENG
- G01 - MEASURING TESTING