Xiaoming Yu

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Champaign, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Sequential test pattern generation using clock-control design for t...
- Patent number 7,017,096
- Issue date Mar 21, 2006
- Agere Systems Inc.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
Sequential test pattern generation using combinational techniques
- Patent number 6,728,917
- Issue date Apr 27, 2004
- Agere Systems Inc.
- Miron Abramovici
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sequential test pattern generation using clock-control design for t...
- Publication number 20030188245
- Publication date Oct 2, 2003
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Application
Sequential test pattern generation using combinational techniques
- Publication number 20020112209
- Publication date Aug 15, 2002
- Miron Abramovici
- G01 - MEASURING TESTING