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Patents Grants
last 30 patents
Information
Patent Grant
Ion mobility analysis apparatus
Patent number
12,111,286
Issue date
Oct 8, 2024
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry analysis method and mass spectrometry system
Patent number
12,027,358
Issue date
Jul 2, 2024
Shimadzu Corporation
Wenjian Sun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion guide device and ion guide method
Patent number
11,508,565
Issue date
Nov 22, 2022
Shimadzu Corporation
Keke Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrum data acquisition and analysis method
Patent number
11,378,560
Issue date
Jul 5, 2022
Shimadzu Corporation
Yunqing Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion migration rate analysis device and analysis method applied
Patent number
11,164,735
Issue date
Nov 2, 2021
SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
Kent James Gillig
G01 - MEASURING TESTING
Information
Patent Grant
Ion guiding device and related method
Patent number
11,127,578
Issue date
Sep 21, 2021
Shimadzu Corporation
Yupeng Cheng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion guiding device and guiding method
Patent number
11,031,224
Issue date
Jun 8, 2021
Shimadzu Corporation
Keke Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry data acquisition method
Patent number
11,031,216
Issue date
Jun 8, 2021
Shimadzu Corporation
Yunqing Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Data acquisition method in a mass spectrometer
Patent number
11,031,218
Issue date
Jun 8, 2021
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Signal processing method and system based on time-of-flight mass sp...
Patent number
10,825,670
Issue date
Nov 3, 2020
Shimadzu Corporation
Jiaqi Shen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion optical device with orthogonal ion barriers
Patent number
10,763,098
Issue date
Sep 1, 2020
Shimadzu Corporation
Gongyu Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion mobility analyzer and analysis method
Patent number
10,739,308
Issue date
Aug 11, 2020
SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
Kent James Gillig
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer, ion optical device, and method for ion manipulat...
Patent number
10,741,379
Issue date
Aug 11, 2020
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Proton transfer reaction mass spectrometer
Patent number
10,636,641
Issue date
Apr 28, 2020
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion guiding device
Patent number
10,515,790
Issue date
Dec 24, 2019
Shimadzu Corporation
Yupeng Cheng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion mobility spectrometry apparatus and method
Patent number
10,386,334
Issue date
Aug 20, 2019
Shimadzu Corporation
Xiaoqiang Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer and method applied thereby for reducing ion loss...
Patent number
10,192,728
Issue date
Jan 29, 2019
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and devices for parallel analysis of ion mobility spectrum...
Patent number
10,020,174
Issue date
Jul 10, 2018
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion optical apparatus and mass spectrometer
Patent number
10,014,167
Issue date
Jul 3, 2018
SHIMADZU CORPORATION
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion guiding device and ion guiding method
Patent number
10,014,168
Issue date
Jul 3, 2018
SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion guide device and ion guide method
Patent number
9,620,347
Issue date
Apr 11, 2017
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion generation device and ion generation method
Patent number
9,570,281
Issue date
Feb 14, 2017
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion mobility analyzer, combination device thereof, and ion mobility...
Patent number
9,429,543
Issue date
Aug 30, 2016
Shimadzu Corporation
Gongyu Jiang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ION SOURCE APPARATUS AND MASS SPECTROMETER
Publication number
20240213011
Publication date
Jun 27, 2024
Shimadzu Corporation
Xiaoqiang ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MOBILITY ANALYSIS APPARATUS
Publication number
20230417704
Publication date
Dec 28, 2023
Shimadzu Corporation
Xiaoqiang ZHANG
G01 - MEASURING TESTING
Information
Patent Application
CYCLOIDAL MASS SPECTROMETER AND METHOD FOR ADJUSTING RESOLUTION THE...
Publication number
20230352292
Publication date
Nov 2, 2023
Shimadzu Corporation
Xiaoqiang ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MOBILITY SPECTROMETRY-MASS SPECTROMETRY COMBINED ANALYSIS DEVICE
Publication number
20230046612
Publication date
Feb 16, 2023
Shimadzu Corporation
Wenjian SUN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MOBILITY ANALYSIS APPARATUS
Publication number
20220341874
Publication date
Oct 27, 2022
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION GUIDE DEVICE AND ION GUIDE METHOD
Publication number
20220102128
Publication date
Mar 31, 2022
Shimadzu Corporation
Keke WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETRY ANALYSIS METHOD AND MASS SPECTROMETRY SYSTEM
Publication number
20210313161
Publication date
Oct 7, 2021
Shimadzu Corporation
Wenjian SUN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION GUIDING DEVICE AND RELATED METHOD
Publication number
20210134575
Publication date
May 6, 2021
Shimadzu Corporation
Yupeng CHENG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION GUIDE DEVICE WITH DC FIELD AND ASSOCIATED METHODS
Publication number
20210134583
Publication date
May 6, 2021
Shimadzu Corporation
Yupeng CHENG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTRUM DATA ACQUISITION AND ANALYSIS METHOD
Publication number
20200278330
Publication date
Sep 3, 2020
Shimadzu Corporation
Yunqing HUANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION SOURCE FOR GENERATING IONS AND CALIBRATING METHODS OF MASS SPEC...
Publication number
20200273685
Publication date
Aug 27, 2020
Shimadzu Corporation
Liang WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DATA ACQUISITION METHOD IN A MASS SPECTROMETER
Publication number
20200266041
Publication date
Aug 20, 2020
Shimadzu Corporation
Xiaoqiang ZHANG
G01 - MEASURING TESTING
Information
Patent Application
MASS SPECTROMETRY DATA ACQUISITION METHOD
Publication number
20200135440
Publication date
Apr 30, 2020
Shimadzu Corporation
Yunqing HUANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION GUIDING DEVICE AND GUIDING METHOD
Publication number
20200126777
Publication date
Apr 23, 2020
Shimadzu Corporation
Keke WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SIGNAL PROCESSING METHOD AND SYSTEM BASED ON TIME-OF-FLIGHT MASS SP...
Publication number
20190172694
Publication date
Jun 6, 2019
Jiaqi SHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MIGRATION RATE ANALYSIS DEVICE AND ANALYSIS METHOD APPLIED
Publication number
20190164737
Publication date
May 30, 2019
SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO., LTD.
Kent James GILLIG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MOBILITY ANALYZER AND ANALYSIS METHOD
Publication number
20190162698
Publication date
May 30, 2019
SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO., LTD.
Kent James GILLIG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION OPTICAL DEVICE
Publication number
20190080895
Publication date
Mar 14, 2019
Shimadzu Corporation
Gongyu Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETER, ION OPTICAL DEVICE, AND METHOD FOR ION MANIPULAT...
Publication number
20190080896
Publication date
Mar 14, 2019
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MOBILITY SPECTROMETRY APPARATUS AND METHOD
Publication number
20190056351
Publication date
Feb 21, 2019
SHIMADZU CORPORATION
Xiaoqiang Zhang
G01 - MEASURING TESTING
Information
Patent Application
PROTON TRANSFER REACTION MASS SPECTROMETER
Publication number
20190013191
Publication date
Jan 10, 2019
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION GUIDING DEVICE
Publication number
20180174812
Publication date
Jun 21, 2018
SHIMADZU CORPORATION
Yupeng CHENG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETER AND METHOD APPLIED THEREBY FOR REDUCING ION LOSS...
Publication number
20180174813
Publication date
Jun 21, 2018
SHIMADZU CORPORATION
Xiaoqiang ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND DEVICES FOR PARALLEL ANALYSIS OF ION MOBILITY SPECTRUM...
Publication number
20170294295
Publication date
Oct 12, 2017
Shimadzu Corporation
Xiaoqiang ZHANG
G01 - MEASURING TESTING
Information
Patent Application
ION OPTICAL APPARATUS AND MASS SPECTROMETER
Publication number
20170236698
Publication date
Aug 17, 2017
SHIMADZU CORPORATION
Xiaoqiang ZHANG
G01 - MEASURING TESTING
Information
Patent Application
ION GUIDING DEVICE AND ION GUIDING METHOD
Publication number
20160071714
Publication date
Mar 10, 2016
SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION GENERATION DEVICE AND ION GENERATION METHOD
Publication number
20150364313
Publication date
Dec 17, 2015
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MOBILITY ANALYZER, COMBINATION DEVICE THEREOF, AND ION MOBILITY...
Publication number
20150276676
Publication date
Oct 1, 2015
Shimadzu Corporation
Gongyu Jiang
G01 - MEASURING TESTING
Information
Patent Application
ION GUIDE DEVICE AND ION GUIDE METHOD
Publication number
20150206731
Publication date
Jul 23, 2015
Shimadzu Corporation
Xiaoqiang Zhang
G01 - MEASURING TESTING