Ximan Jiang

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El Cerrito, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
High brightness—multiple beamlets source for patterned X-ray produc...
- Patent number 7,609,815
- Issue date Oct 27, 2009
- The Regents of the University of California
- Ka-Ngo Leung
- G01 - MEASURING TESTING
Information Patent Grant
Focused electron and ion beam systems
- Patent number 6,768,120
- Issue date Jul 27, 2004
- The Regents of the University of California
- Ka-Ngo Leung
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
High Brightness - Multiple Beamlets Source for Patterned X-ray Prod...
- Publication number 20080049888
- Publication date Feb 28, 2008
- Ka-Ngo Leung
- G01 - MEASURING TESTING
Information Patent Application
Focused electron and ion beam systems
- Publication number 20040036032
- Publication date Feb 26, 2004
- Ka-Ngo Leung
- H01 - BASIC ELECTRIC ELEMENTS